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    PROBE SYSTEMS
    1.
    发明公开
    PROBE SYSTEMS 审中-公开

    公开(公告)号：EP4191259A1

    公开(公告)日：2023-06-07

    申请号：EP23151663.4

    申请日：2017-09-20

    申请人： FormFactor, Inc.

    发明人： Fisher, Gavin, Neil ,  Thaerigen, Thomas Reiner ,  Mccann, Peter ,  Jones, Rodney ,  Duckworth, Koby, L

    IPC分类号： G01R31/28 ,  G01R35/00 ,  G01R1/073

    摘要： Probe systems and methods are disclosed herein. The methods include directly measuring a distance between a first manipulated assembly and a second manipulated assembly, contacting first and second probes with first and second contact locations, providing a test signal to an electrical structure, and receiving a resultant signal from the electrical structure. The methods further include characterizing at least one of a probe system and the electrical structure based upon the distance. In one embodiment, the probe systems include a measurement device configured to directly measure a distance between a first manipulated assembly and a second manipulated assembly. In another embodiment, the probe systems include a probe head assembly including a platen, a manipulator operatively attached to the platen, a vector network analyzer (VNA) extender operatively attached to the manipulator, and a probe operatively attached to the VNA extender.

    METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED RESOURCES
    8.
    发明公开
    METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED RESOURCES 审中-公开
    方法和设备的测试装置采用串行控制的资源

    公开(公告)号：EP2195673A1

    公开(公告)日：2010-06-16

    申请号：EP08833524.5

    申请日：2008-09-24

    申请人： FormFactor, Inc.

    发明人： BERRY, Tommie Edward

    IPC分类号： G01R31/3183 ,  G01R31/26

    CPC分类号： G01R31/2889 ,  G01R31/31907

    摘要： Methods and apparatus for testing devices using serially controlled resources have been described. Examples of the invention can relate to an apparatus for testing a device under test (DUT). In some examples, an apparatus can include an integrated circuit (IC) having a serialized input coupled to test circuits, the test circuits selectively communicating test signals with the DUT responsive to a test control signal on the serialized input.

    ROTATING CONTACT ELEMENT AND METHODS OF FABRICATION
    10.
    发明公开
    ROTATING CONTACT ELEMENT AND METHODS OF FABRICATION 审中-公开
    ROTATING接触元件和方法

    公开(公告)号：EP2097951A2

    公开(公告)日：2009-09-09

    申请号：EP07854998.7

    申请日：2007-12-06

    申请人： FormFactor, Inc.

    发明人： HOBBS, Eric, D.

    IPC分类号： H01R13/02

    CPC分类号： G01R1/06716 ,  G01R1/06733 ,  Y10T29/49128

    摘要： Rotating contact elements and methods of fabrication are provided herein. In one embodiment, a rotating contact element includes a tip having a first side configured to contact a device to be tested and an opposing second side; and a plurality of deformed members extending from the second side of the tip and arranged about a central axis thereof, wherein the tip rotates substantially about the central axis upon compression of the plurality of deformed members.