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1.发明公开
公开(公告)号：EP1754074A4
公开(公告)日：2011-10-19
申请号：EP05712707
申请日：2005-02-02
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A
IPC: G01R31/302 , G01R1/04 , G01R1/07 , G01R1/073 , G01R31/311
CPC classification number: G01R1/0491 , G01R1/07 , G01R1/07378 , G01R31/3025
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公开(公告)号：EP1934620A4
公开(公告)日：2012-06-06
申请号：EP06803803
申请日：2006-09-18
Applicant: FORMFACTOR INC
Inventor： DOZIER II THOMAS H , ELDRIDGE BENJAMIN N , HSU DAVID S , KHANDROS IGOR Y , MILLER CHARLES A
IPC: G01R31/319 , G01R31/28
CPC classification number: G01R31/2889 , G01R31/2893 , G01R31/31905
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公开(公告)号：EP1851558A4
公开(公告)日：2012-05-30
申请号：EP06719969
申请日：2006-01-30
Applicant: FORMFACTOR INC
Inventor： GRANICHER DANE C , HENSON ROY J , MILLER CHARLES A
IPC: G01R31/319 , G01R1/073
CPC classification number: G01R31/31926 , G01R1/07385 , G01R31/2889
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4.发明公开A METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS 审中-公开方法和设备校准和/或歪斜消除KOMMUNIKAITONSKANÄLEN的
公开(公告)号：EP1787234A4
公开(公告)日：2010-09-22
申请号：EP05764595
申请日：2005-07-11
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A
IPC: G01R31/319
CPC classification number: G01R35/005 , G01R31/3016 , G01R31/31723 , G01R31/318511 , G01R31/3191 , G01R31/31937
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公开(公告)号：EP1743182A4
公开(公告)日：2010-03-10
申请号：EP05749910
申请日：2005-04-21
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
CPC classification number: G01R31/31905 , G01R1/07385 , G01R1/36 , G01R31/2889 , G01R35/00
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Patent Agency Ranking
公开(公告)号：EP1695099A4
公开(公告)日：2009-12-02
申请号：EP04796238
申请日：2004-10-22
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A
IPC: G01R31/319 , G01R20060101 , G01R1/00 , G01R31/02 , G01R31/26 , H03H11/12 , H03H11/26 , H03K3/00
CPC classification number: H03H11/265 , G01R31/2889 , G01R31/31917 , H03H11/126
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7.发明公开A METHOD AND APPARATUS FOR INCREASING THE OPERATING FREQUENCY OF A SYSTEM FOR TESTING ELECTRONIC DEVICES 审中-公开方法和设备增加系统的工作频率用于测试电子器件
公开(公告)号：EP1839062A4
公开(公告)日：2010-09-29
申请号：EP05854329
申请日：2005-12-15
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A
IPC: G01R31/319 , G01R31/28
CPC classification number: G01R31/2889 , G01R31/31905
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公开(公告)号：EP1836502A4
公开(公告)日：2010-07-21
申请号：EP05854352
申请日：2005-12-15
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A
IPC: G01R31/317
CPC classification number: G01R31/2889 , G01R31/31713
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公开(公告)号：EP1807868A4
公开(公告)日：2008-07-16
申请号：EP05800083
申请日：2005-09-26
Applicant: FORMFACTOR INC
Inventor： KHANDROS IGOR Y , MILLER CHARLES A , BARBARA BRUCE J , VASQUEZ BARBARA
CPC classification number: H01L24/48 , H01L23/13 , H01L24/49 , H01L24/73 , H01L25/0657 , H01L2224/05554 , H01L2224/05599 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/48091 , H01L2224/48145 , H01L2224/48147 , H01L2224/48227 , H01L2224/48465 , H01L2224/4911 , H01L2224/73215 , H01L2224/73265 , H01L2224/85186 , H01L2225/06506 , H01L2225/0651 , H01L2225/06527 , H01L2225/06555 , H01L2225/06562 , H01L2924/00014 , H01L2924/01005 , H01L2924/01014 , H01L2924/01031 , H01L2924/01033 , H01L2924/01082 , H01L2924/15787 , H01L2924/19041 , H01L2924/19043 , H01L2224/45099 , H01L2924/00012 , H01L2924/00
Abstract: Semiconductor dies (101/104/106) are stacked offset from one another so that terminals (122/124/126) located along two edges of each die are exposed. The two edges of the dies having terminals may be oriented in the same direction. Electrical connections (130/132/134) may connect terminals on one die with terminals on another die and the stack may be disposed on a wiring substrate (112) to which the terminals of the dies may be electrically connected.
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10.发明公开METHOD OF DESIGNING AN APPLICATION SPECIFIC PROBE CARD TEST SYSTEM 审中-公开VERFAHRENFÜRDEN ENTWURF EINES ANWENDUNGSSPEZIFISCHEN NADELKARTENTESTSYSTEMS
公开(公告)号：EP2032998A4
公开(公告)日：2013-09-11
申请号：EP07797802
申请日：2007-05-25
Applicant: FORMFACTOR INC
Inventor： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
CPC classification number: G01R31/31905 , G01R31/2889 , G01R31/31926 , G01R35/00
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