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    AFM-BASED DATA STORAGE AND MICROSCOPY
    2.
    发明公开
    AFM-BASED DATA STORAGE AND MICROSCOPY 有权
    原子力显微镜为基础的数据存储和观测

    公开(公告)号：EP1330823A1

    公开(公告)日：2003-07-30

    申请号：EP01965519.0

    申请日：2001-09-17

    申请人： International Business Machines Corporation

    发明人： BINNIG, Gerd, K. ,  DESPONT, Michel ,  VETTIGER, Peter

    IPC分类号： G11B9/00 ,  G01B7/34

    CPC分类号： G01Q60/38 ,  G01Q20/04 ,  G01Q80/00 ,  G11B9/14 ,  G11B9/1409 ,  G11B2005/0021

    摘要： Read/write components for AFM-based data storage devices are provided. In particular embodiments, a read/write component (30, 45, 50, 65, 80) comprises lever means (31, 51, 66, 82) and a support structure (32, 52, 67, 81), the lever means being connected to the support structure for substantially pivotal movement. The lever means (31, 51, 66, 82) provides first and second current paths between a pair of electrical supply lines (R, C) on the support structure via which the lever means can be connected in use to power supply means operable in a write mode and a read mode. A write-mode heater (36, 47, 56, 73) is provided on the lever means in the first current path, and a read/write tip (37, 57, 74, 84) is provided on the write-mode heater. A read-mode heater (39, 46, 58, 75, 83) is provided on the lever means in the second current path. Decoupling means (38a, 38b, 40a, 40b, 60, 61, 77a, 77b, 78a, 78b) is arranged to inhibit current flow to the write-mode heater via the first current path in use when the power supply means is operated in the read mode. The component, with separate write and read-mode heaters, can thus be addressed in both the write and read modes via a single pair of supply lines. Other embodiments provide read/write components (100) employing a thermal decoupling mechanism, and read/write components (80) where read-sensing is performed by a proximity sensing arrangement between the lever means and the support structure. Sensing apparatus (115) for atomic force microscopes is also provided where tip movement can be detected via similar proximity sensing arrangements.

    HIGH-SPEED SCANNING PROBE MICROSCOPE
    3.
    发明公开
    HIGH-SPEED SCANNING PROBE MICROSCOPE 审中-公开
    SPEED扫描探针显微镜

    公开(公告)号：EP2384442A1

    公开(公告)日：2011-11-09

    申请号：EP10701929.1

    申请日：2010-01-15

    申请人： International Business Machines Corporation

    发明人： BHASKARAN, Harish ,  DESPONT, Michel ,  SEBASTIAN, Abu

    IPC分类号： G01Q60/16

    CPC分类号： G01Q60/16

    摘要： The invention is directed to a probe for scanning probe microscopy. The probe 20 comprises a tunnel-current conducting part 30 and a tunnel-current insulating part 40. The said parts are configured such that the insulating part determines a minimal distance between the conducting part 30 and the sample surface. The invention may further concern a scanning probe microscope having such a probe, and a corresponding scanning probe microscopy method. Since the distance to the sample surface 100 is actually determined by the insulating part 40, controlling the vertical position of the probe 20 relative to the sample surface is easily and rapidly achieved. The configuration of the parts allows for a fast scan of the sample surface, whereby high-speed imaging can be achieved. Further, embodiments allow for topographical variations to be accurately captured through tunneling effect.