公开(公告)号：EP1329958A4

公开(公告)日：2005-12-28

申请号：EP01961237

申请日：2001-08-30

申请人： JAPAN SCIENCE & TECH CORP ,  RIKEN

发明人： AONO MASAKAZU ,  TERABE KAZUYA ,  HASEGAWA TSUYOSI ,  NAKAYAMA TOMONOBU

IPC分类号： H01L29/06 ,  G11C13/02 ,  H01L29/80 ,  H01L45/00 ,  H01L49/00 ,  H01L29/66

CPC分类号： H01L45/1266 ,  G11C13/02 ,  H01L45/085 ,  H01L45/1226 ,  H01L49/006

摘要： An electronic device comprising a first electrode made of a mixture conductor material having ion conductivity and electron conductivity and a second electrode made of a conductive material, in which a voltage is so applied between the first and second electrodes that the first electrode is negative with respect to the second electrode and thereby mobile ions are moved from the first electrode to the second one to form a bridge between the electrodes. Preferably the mixture conductor material is Ag2S, Ag2Se, Cu2S, or Cu2Se. An interelectrode conductance control method is also disclosed which comprises at least one step of the steps of applying a voltage in such a way that the potential of the second electrode is negative with respect to that of the first electrode so as to move mobile ions from the first electrode to the second electrode and thereby to form a bridge between the electrodes and thinning or cutting the bridge by inverting the polarity of the voltage between the electrodes.

公开(公告)号：EP1243915A4

公开(公告)日：2003-07-16

申请号：EP00980062

申请日：2000-12-12

申请人： JAPAN SCIENCE & TECH CORP ,  RIKEN

发明人： HASEGAWA TSUYOSHI ,  AONO MASAKAZU ,  NAKAYAMA TOMONOBU ,  OKUDA TAICHI ,  TERABE KAZUYA ,  TANAKA HIROFUMI

IPC分类号： G01B21/30 ,  B81B3/00 ,  G01N27/00 ,  G01N27/04 ,  G01N27/07 ,  G01N27/20 ,  G01Q30/02 ,  G01Q60/38 ,  G01Q60/40 ,  G01Q70/00 ,  G01R1/06 ,  G01R1/067 ,  G01R27/02 ,  G01R31/28 ,  H01L21/66 ,  G01N13/16 ,  G01R31/00

CPC分类号： G01Q60/40 ,  G01Q60/04 ,  G01R1/06727 ,  G01R1/06738 ,  Y10S977/874

摘要： An apparatus is provided for evaluating electrical characteristics by bringing a plurality of metal probes in contact with a minute area with low contact resistance. Metal probes (8) are formed on the free end of a cantilever (6) on which are formed a resistor (5), two electrodes (1, 2) for resistance detection, and an electrode (7) for measuring electrical characteristics. The tips of the metal probes (8) can project beyond the free end of the cantilever (6) to reach an area of about 10 nm size. The probe position is controlled by an atomic force microscope technique to achieve low contact resistance.

公开(公告)号：EP1482297A4

公开(公告)日：2008-04-30

申请号：EP03703178

申请日：2003-02-05

申请人： RIKEN

发明人： HASEGAWA TSUYOSHI ,  AONO MASAKAZU ,  NAKAYAMA TOMONOBU ,  HOSAKA SUMIO

IPC分类号： G01B21/30 ,  G01Q10/04 ,  G01Q10/06 ,  G01Q20/02 ,  G01Q60/24 ,  G01Q60/32 ,  G01Q60/38 ,  G01Q70/12 ,  G01N13/10 ,  G01N13/16

CPC分类号： G01Q60/34 ,  G01Q10/06 ,  G01Q30/04 ,  G01Q70/12

摘要： An AFM (atomic force microscope) of a digital probing type for measuring a high aspect structure with high precision. A probe (21), while being vibrated, is made to approach the surface of a specimen. The position of the probe of when a predetermined atomic force is detected in the attractive force region is measured (1). The probe is moved away from the specimen surface (2). The servo system for maintaining the spacing between the probe and the specimen surface at a constant distance is stopped, and the probe, while being separate from the specimen surface, is moved to a measurement point along the specimen surface (3). The frequency of the vibration is, for example, slightly out of the resonance point of the cantilever. From the variation of the vibration amplitude of the cantilever, the atomic force is determined.

公开(公告)号：EP1501124A4

公开(公告)日：2009-07-22

申请号：EP03719228

申请日：2003-04-25

申请人： JAPAN SCIENCE & TECH AGENCY ,  RIKEN

发明人： SAKAMOTO TOSHITSUGU ,  AONO MASAKAZU ,  HASEGAWA TSUYOSHI ,  NAKAYAMA TOMONOBU ,  SUNAMURA HIROSHI ,  KAWAURA HISAO ,  SUGIBAYASHI NAOHIKO

IPC分类号： G11C13/02 ,  H01L27/10 ,  H01L45/00 ,  H01L21/82 ,  G11C17/00 ,  H01L27/04 ,  H03K19/173

CPC分类号： G11C13/0011 ,  G11C2213/15 ,  G11C2213/56 ,  G11C2213/79 ,  H01L27/101 ,  H01L45/085 ,  H01L45/1233 ,  H01L45/1266 ,  H01L45/142 ,  H01L45/144 ,  H01L45/1633 ,  H01L2924/0002 ,  H01L2924/00

公开(公告)号：EP1331671A4

公开(公告)日：2005-05-04

申请号：EP01980925

申请日：2001-10-29

申请人： JAPAN SCIENCE & TECH AGENCY ,  RIKEN

发明人： AONO MASAKAZU ,  HASEGAWA TSUYOSHI ,  TERABE KAZUYA ,  NAKAYAMA TOMONOBU

IPC分类号： G11C11/56 ,  G11C13/02 ,  G11C16/02 ,  H01L27/24 ,  H01L27/28 ,  H01L29/24 ,  H01L29/26 ,  H01L29/45 ,  H01L51/00 ,  H01L51/30 ,  H03K19/02 ,  H01L29/06 ,  H01L29/66

CPC分类号： G11C13/025 ,  B82Y10/00 ,  G11C11/5614 ,  G11C13/0004 ,  G11C13/0009 ,  G11C13/0011 ,  G11C2213/77 ,  G11C2213/81 ,  H01L27/2463 ,  H01L29/242 ,  H01L29/26 ,  H01L29/45 ,  H01L45/085 ,  H01L45/1266 ,  H01L45/142 ,  H01L45/143 ,  H01L45/146 ,  H01L45/1633 ,  H03K17/545 ,  H03K19/02

摘要： A point contact array applicable to an arithmetic circuit, a logic circuit, and memory device, in which the conductances between electrodes are electrically and reversibly controlled and point contacts are arranged. A circuit comprising point contacts each composed of a first electrode made of a mixture of conductive materials having ion-conductivity and electron-conductivity and a second electrode made of a conductive material is fabricated while controlling the conductances of the point contacts. The conductive material mixture is preferably Ag2S, Ag2Se, Cu2S, or Cu2Se. A semiconductor and an insulating material when they are interposed between electrodes are preferably crystals or amorphous bodies of GeSx, GeSex, GeTex, or WOx (0

公开(公告)号：EP1881317A4

公开(公告)日：2012-01-25

申请号：EP06729200

申请日：2006-03-16

申请人： RIKEN

发明人： SAITO AKIRA ,  AONO MASAKAZU ,  KUWAHARA YUJI ,  MARUYAMA JYUNPEI ,  MANABE KEN

IPC分类号： G01B21/30 ,  G01N23/223 ,  G01Q10/02 ,  G01Q30/02 ,  G01Q60/10 ,  G01Q70/12

CPC分类号： G01N23/225 ,  G01Q30/02 ,  G01Q60/12