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公开(公告)号：EP2976292B1
公开(公告)日：2020-05-06
申请号：EP14725821.4
申请日：2014-03-17
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公开(公告)号：EP2976292A1
公开(公告)日：2016-01-27
申请号：EP14725821.4
申请日：2014-03-17
IPC分类号： B81B5/00 , G02B6/35 , G02B6/24 , G02B26/02 , G02B6/293 , G02B26/00 , G02B6/36 , G01J1/04 , G02B1/00 , G01B9/02 , G02B6/26
摘要： An integrated apertured micromirror is provided in which the micromirror is monolithically integrated with a micro-optical bench fabricated on a substrate using a lithographic and deep etching technique. The micromirror has an aperture therein and is oriented such that the micromirror is optically coupled to receive an incident beam having an optical axis in a plane of the substrate and to at least partially transmit the incident beam therethrough via the aperture.
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3.发明公开ASPHERICAL OPTICAL SURFACES AND OPTICAL SCANNERS 审中-公开平板电脑OPTISCHEOBERFLÄCHENUND OPTISCHEMESSFÜHLER
公开(公告)号：EP2875390A2
公开(公告)日：2015-05-27
申请号：EP13747718.8
申请日：2013-07-18
申请人： SI-Ware Systems , Sabry, Yasser, M. , Khalil, Diaa Abdel Maged , Saadany, Bassam, A. , Bourouina, Tarik, E.
CPC分类号： G02B26/10 , G02B5/10 , G02B26/101
摘要： Optical systems with aspherical optical elements are described. The aspherical optical elements have surfaces in which the in-plane radius of curvature spatially varies and the in-plane cross section surface profile is characterized in that the multiplication of the cosine of the incidence angle raised to a non-zero exponent by the in-plane radius of curvature varies less than twenty percent between any two points on the in-plane cross section surface profile.
摘要翻译： 描述了具有非球面光学元件的光学系统。 非球面光学元件具有面内的曲面半径在空间上变化的面，并且面内截面表面轮廓的特征在于，入射角的余弦乘以非零指数， 平面曲面半径在平面内截面表面轮廓上的任意两个点之间变化小于百分之二十。
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4.发明公开INTEGRATED MONOLITHIC OPTICAL BENCH CONTAINING 3-D CURVED OPTICAL ELEMENTS AND METHODS OF ITS FABRICATION 有权根据上述制造三维曲面光学元件和方法集成的单片光具座
公开(公告)号：EP2769257A1
公开(公告)日：2014-08-27
申请号：EP12784177.3
申请日：2012-10-19
申请人： SI-Ware Systems , Sabry, Yasser, M. , Bourouina, Tarik, E. , Saadany, Bassam, A. , Khalil, Diaa, A.m.
CPC分类号： G02B26/0841 , G02B6/262 , G02B6/32 , G02B6/3516
摘要： An optical system, such as an integrated monolithic optical bench, includes a three-dimensional curved optical element etched in a substrate such that the optical axis of the optical system lies within the substrate and is parallel to the plane of the substrate.
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5.发明公开FOURIER TRANSFORM MICRO SPECTROMETER BASED ON SPATIALLY-SHIFTED INTERFEROGRAM BURSTS 审中-公开基于地理Fourier变换微型光谱仪悬浮干涉爆发放电
公开(公告)号：EP2904359A1
公开(公告)日：2015-08-12
申请号：EP13783730.8
申请日：2013-10-08
CPC分类号： G01J3/45 , G01J3/0218 , G01J3/0256 , G01J3/26 , G01J3/4535 , G01J2003/4538
摘要： A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.
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公开(公告)号：EP4288760A1
公开(公告)日：2023-12-13
申请号：EP22708255.9
申请日：2022-02-02
申请人： SI-Ware Systems
发明人： SABRY, Yasser, M. , MORTADA, Bassem, A. , HASSAN, Khaled , SALEM, Abdelrahman Ahmed, Maher Mohamed Eisayed , KHALIL, Diaa , AL HARON, Mohamed, H. , ELSHEIKH, Mohammed, Ahmed , SHEBL, Ahmed , SAADANY, Bassam , MEDHAT, Mostafa , SHENOUDA, Botros George, Iskander
IPC分类号： G01N21/25 , G01N21/3563 , G01N21/35
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公开(公告)号：EP2769257B1
公开(公告)日：2018-12-12
申请号：EP12784177.3
申请日：2012-10-19
申请人： SI-Ware Systems
CPC分类号： G02B26/0841 , G02B6/262 , G02B6/32 , G02B6/3516
摘要： An optical system, such as an integrated monolithic optical bench, includes a three-dimensional curved optical element etched in a substrate such that the optical axis of the optical system lies within the substrate and is parallel to the plane of the substrate.
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公开(公告)号：EP3274674A2
公开(公告)日：2018-01-31
申请号：EP16704535.0
申请日：2016-01-29
申请人： SI-Ware Systems
发明人： KHALIL, Diaa , SAADANY, Bassam, A. , SABRY, Yasser, M. , FATHY REZK THABET MOHAMED, Alaa Eldeen
CPC分类号： G01J3/45 , G01J3/0256 , G01J3/108 , G01J3/26 , G01J3/453 , G01J3/4531 , G01J3/4532 , G01J3/4535
摘要： A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
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公开(公告)号：EP3320313A2
公开(公告)日：2018-05-16
申请号：EP16751047.8
申请日：2016-07-07
申请人： SI-Ware Systems
CPC分类号： H01L49/00 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0237 , G01J3/0245 , G01J3/108 , G01J3/26 , G01J3/42 , H01K1/04 , H01K1/14
摘要： An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
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10.发明公开MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTICAL SURFACES 审中-公开具有高度/选择性控制的光学表面的微型光学平台装置
公开(公告)号：EP3259228A1
公开(公告)日：2017-12-27
申请号：EP16711920.5
申请日：2016-02-19
申请人： SI-Ware Systems
发明人： SAADANY, Bassam, A. , SABRY, Yasser, M. , MEDHAT, Mostafa , MORTADA, Bassem , NAGI, Muhammed , SADEK, Mohamed , NADA, Yasseen , HASSAN, Khaled
CPC分类号： G02B6/136 , B81B2201/047 , B81C1/00833 , G01B9/02051 , G01J3/0259 , G01J3/453 , G02B6/3692
摘要： A micro-optical bench device is fabricated by a process that provides control over one or more properties of the micro-optical bench device and/or one or more properties of optical surfaces in the micro-optical bench device. The process includes etching a substrate to form a permanent structure including optical elements and a temporary structure. The shape of the temporary structure and gaps between the temporary structure and permanent structure facilitate control of a property of the micro-optical bench and/or optical surfaces therein. The process further includes removing the temporary structure from an optical path of the micro-optical bench device.
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