PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD

    公开(公告)号:EP4373038A1

    公开(公告)日:2024-05-22

    申请号:EP23207659.6

    申请日:2023-11-03

    Abstract: A processing system (10a) is described. The processing system (10a) comprises a processing circuit (64), a volatile memory (60a) and a CAN communication controller circuit (50). The CAN communication controller circuit (50) comprises configuration and status registers (520). A transmission handler circuit (502) and a reception handler circuit (504) are configured to transmit and receive data via the CAN core circuit (500) by exchanging data with the volatile memory (60a) based on the configuration data stored to the configuration and status registers (520), and standard and/or extended filter elements stored to the volatile memory (60a).
    Specifically, the processing system (10a) further comprises a hardware host circuit (62a) comprising a non-volatile memory (642) configured to store first configuration data (CD1) and second configuration data (CD2), wherein the first configuration data (CD1) comprise configuration data to be transferred to the configuration and status registers (520) of the CAN communication controller circuit (50) and the second configuration data (CD2) comprise at least one standard and/or extended filter element to be transferred to the volatile memory (60a). A control circuit (620, 628, 632) is configured to manage an initialization mode, a reception mode and a transmission mode. Specifically, during the initialization mode (648), the hardware host circuit (62a) stores the first configuration data (CD1) to the configuration and status registers (520) and the second configuration data (CD2) to the volatile memory (60a).

    CURRENT ABSORPTION MANAGEMENT CIRCUIT, CORRESPONDING SYSTEM AND METHOD

    公开(公告)号:EP4012866A1

    公开(公告)日:2022-06-15

    申请号:EP21210682.7

    申请日:2021-11-26

    Abstract: A current absorption management circuit (10) for use in an electronic fuse, for instance, comprises a first node (VBAT+) and a second node (OUT) coupled to an electrical supply source (for instance a battery SS in a motor vehicle V) and an electrical load (L) supplied by the electrical supply source (SS) via an electronic switch (such as a power MOSFET transistor 12) having a control node). A third node (GD) of the circuit is coupled to the electronic switch (12) to switch the electronic switch (12) between a conductive state (1000), wherein the electrical load (L) is coupled to the supply source (SS) via the electronic switch (12), and a non-conductive state (1000A).
    A secondary electronic switch (12A) is arranged intermediate the first node (VBAT+) and the second node (OFF) and control logic circuitry (20) is provided configured to operate alternately:
    in a first (full ON) mode of operation (1000), wherein the electronic switch (12) is in a conductive state and the electrical load (L) is coupled to the supply source (SS) via the electronic switch (12), and the secondary electronic switch (12A) is in a non-conductive state, and
    in a second (ON active-standby) mode of operation (1002), wherein the electronic switch (12) is in a non-conductive state and the secondary electronic switch (12A) is in a conductive state and the electrical load (L) is coupled to the supply source (SS) via the secondary electronic switch (12A).

    ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD

    公开(公告)号:EP3961229A1

    公开(公告)日:2022-03-02

    申请号:EP21190380.2

    申请日:2021-08-09

    Abstract: An electronic device (10) such as an e-fuse comprises analog circuitry configured to be set to one or more self-test configurations. To that effect the device comprises self-test controller circuitry (12) in turn comprising:
    an analog configuration and sensing circuit (16, 162) configured to set the analog circuitry to one or more self-test configurations and to sense test signals occurring in the analog circuitry set to such self-test configurations,
    a data acquisition circuit (18, 182) configured to acquire and convert to digital the test signals sensed at the analog sensing circuit, and
    a fault event detection circuit (22, 222) configured to check the test signals converted to digital against reference parameters.
    The device (10) comprises integrated therein a self-test controller (12) configured to control parts or stages of the device to configure circuits, acquire data and control test execution under the coordination of a test sequencer (120).

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