摘要:
Provided is a magnetic resistance device in which a pinning layer, a pinned layer, an anti-ferromagnetic layer, and a free layer are sequentially formed, and the free layer is formed of an intermetallic compound. The magnetic resistance device provides a high MR ratio, thereby increasing a sensitivity margin.
摘要:
Magnetoresistive structures, magnetic random-access memory devices including the same, and methods of manufacturing the magnetoresistive structure, include a first magnetic layer (13) having a magnetization direction that is fixed, a second magnetic layer (17) orresponding to the first magnetic layer (13), wherein a magnetization direction of the second magnetic layer (17) is changeable, and a magnetoresistance (MR) enhancing layer (15) and an intermediate layer (16) both between the first magnetic layer (13) and the second magnetic layer(17).
摘要:
Magnetoresistive elements, and memory devices including the same, include a pinned layer having a fixed magnetization direction, a free layer corresponding to the pinned layer, and a protruding element protruding from the free layer and having a changeable magnetization direction. The free layer has a changeable magnetization direction. The protruding element is shaped in the form of a tube. The protruding element includes a first protruding portion and a second protruding portion protruding from ends of the free layer facing in different directions.
摘要:
Provided are a magnetic memory device and a method of writing data into the magnetic memory device. The magnetic memory device comprises a plurality of word lines and a plurality of bit lines defining a plurality of unit cell regions, a transistor disposed in each of the unit cell regions, and a magnetic tunneling junction (MTJ) element series connected to the transistor and having an MTJ cell sandwiched between first and second pad layers forming a magnetic field at both sides of the MTJ cell upon current flow through said first and second pad layers, the second pad layer being connected to a bit line; wherein a drain of each transistor is connected to the first pad layer in a corresponding cell region and a source thereof is connected to the second pad layer in an adjacent unit cell region, and the gates of the transistors of adjacent cells are connected to a same word line.
摘要:
Magnetoresistive structures, magnetic random-access memory devices including the same, and methods of manufacturing the magnetoresistive structure, include a first magnetic layer (13) having a magnetization direction that is fixed, a second magnetic layer (17) orresponding to the first magnetic layer (13), wherein a magnetization direction of the second magnetic layer (17) is changeable, and a magnetoresistance (MR) enhancing layer (15) and an intermediate layer (16) both between the first magnetic layer (13) and the second magnetic layer(17).
摘要:
Magnetoresistive structures, magnetic random-access memory devices including the same, and methods of manufacturing the magnetoresistive structure, include a first magnetic layer (13) having a magnetization direction that is fixed, a second magnetic layer (17) orresponding to the first magnetic layer (13), wherein a magnetization direction of the second magnetic layer (17) is changeable, and a magnetoresistance (MR) enhancing layer (15) and an intermediate layer (16) both between the first magnetic layer (13) and the second magnetic layer(17).
摘要:
Provided is a magnetic resistance device in which a pinning layer, a pinned layer, an anti-ferromagnetic layer, and a free layer are sequentially formed, and the free layer is formed of an intermetallic compound. The magnetic resistance device provides a high MR ratio, thereby increasing a sensitivity margin.