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    Gehäuse für eine UV-Lichtquelle
    1.
    发明公开
    Gehäuse für eine UV-Lichtquelle 审中-公开
    一种用于UV光源壳体

    公开(公告)号：EP2808672A1

    公开(公告)日：2014-12-03

    申请号：EP14176570.1

    申请日：2010-02-26

    Applicant: Binder + Co AG

    Inventor： Huber, Reinhold ,  Leitner, Karl

    IPC: G01N21/64 ,  G01N21/59 ,  B07C5/34 ,  B07C5/342

    CPC classification number: G01N21/59 ,  B07C5/3425 ,  B07C2501/0072 ,  G01N21/6456 ,  G01N2201/06153 ,  G01N2201/062 ,  G01N2201/0634 ,  G01N2201/0636

    Abstract: Gezeigt wird ein Gehäuse (1) für eine UV-Lichtquelle zur Verwendung in einem Verfahren zum Detektieren von bleihältigen Glasstücken in einem einschichtigen Materialstrom von Objekten aus vorwiegend Altglas.
    Um unerwünschte Wellenlängen, insbesondere jene des sichtbaren Lichts, aus dem Spektrum der UV-Lichtquelle zu eliminieren, wird vorgesehen, dass die UV-Lichtquelle (3) so in das Gehäuse mit zumindest einem Spiegelfilter (16) eingebaut werden kann, dass das Licht aus der UV-Lichtquelle (3) über zumindest einen Spiegelfilter (16) umgelenkt und gefiltert wird, nämlich durch zwei normal zueinander angeordnete Spiegelfilter (16) um 180° umgelenkt wird.

    Abstract translation: 示出了用于UV光源用于从主要废玻璃检测对象的单层流含铅玻璃件的方法的壳体（1）。 不需要的波长，特别是可见光的，从UV光源的光谱消除被提供，该UV光源（3）可以被这样安装在壳体中与至少一个反射镜滤波器（16），即从光 UV光源（3）通过至少一个反射镜滤波器（16）偏转并过滤，即通过两个反射镜设置相互垂直滤波器（16）180°偏转。

    ILLUMINATING AND OPTICAL APPARATUS FOR INSPECTING SOLDERING OF PRINTED CIRCUIT BOARD
    4.
    发明公开
    ILLUMINATING AND OPTICAL APPARATUS FOR INSPECTING SOLDERING OF PRINTED CIRCUIT BOARD 审中-公开
    光学照明设备，用于检查印刷电路的焊接

    公开(公告)号：EP1116019A1

    公开(公告)日：2001-07-18

    申请号：EP99941822.1

    申请日：1999-08-27

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： KIM, Jae, Seon,Samsung Apt.

    IPC: G01N21/88 ,  G01B11/24

    CPC classification number: G01N21/8806 ,  G01N21/95684 ,  G01N2021/8835 ,  G01N2021/95646 ,  G01N2201/06153 ,  G01N2201/062 ,  H05K13/08

    Abstract: An illuminating and optical apparatus for inspecting soldering of PCB of the present invention comprises: a fixed member which forms a horizontal plane at the top thereof and a tilted plane at the side thereof; first illuminating means disposed at the upper plane of the fixed member for illuminating the inspecting part attached on the PCB; second illuminating means disposed at the tilted plane of the fixed member for illuminating the inspecting part to obtain an image whose shade is inverted to that obtained by the first illuminating means; control means for controlling brightness of the first and second illuminating means and turning on/off of power; and optical means disposed at the upper portion of the fixed member for photographing at large and small views the inspecting part illuminated by the first and second illuminating means under the control of the control means, thereby automatically inspecting the mounted and soldered states of various electronic parts on the surface of a printed circuit board of a surface mounting apparatus by evenly illuminating and photographing with an adequate view in accordance with the size thereof.

    Reading devices for testships
    5.
    发明公开
    Reading devices for testships 失效
    Vorrichtung zum Ablesen von Teststreifen。

    公开(公告)号：EP0653625A1

    公开(公告)日：1995-05-17

    申请号：EP94308174.5

    申请日：1994-11-07

    Applicant: UNIPATH LIMITED

    Inventor： Catt, Michael ,  Mundill, Paul Henry Charles ,  Prior, Michael Evans

    IPC: G01N21/86 ,  G01N33/558 ,  G01N33/543

    CPC classification number: B01L3/5023 ,  B01L2200/12 ,  B01L2300/0825 ,  B01L2400/0406 ,  G01N21/8483 ,  G01N2021/8618 ,  G01N2021/8654 ,  G01N2201/06153 ,  G01N2201/0696

    Abstract: A method of "reading" the result of an assay effected by concentrating a detectable material in a comparatively small zone of a carrier in the form of a strip, sheet or layer through the thickness of which electromagnetic radiation such as visible light is transmissible, wherein at least a portion of one face or the carrier is exposed to incident electromagnetic radiation which is substantially uniform across the entire portion, the portion including the small zone, and electromagnetic radiation emerging from the opposite face of the carrier is measured to determine the assay result. Preferably the radiation is diffuse light.

    Abstract translation: 通过将可检测材料集中在带状，片状或层状形式的载体的相对小的区域中，通过电磁辐射如可见光可透射的厚度来浓缩可检测材料，“读”测定结果的方法，其中 一个面或载体的至少一部分暴露于在整个部分上基本均匀的入射电磁辐射，测量包含小区的部分和从载体的相对面出射的电磁辐射以确定测定结果 。 优选地，辐射是漫射光。

    IMPURITY MEASURING METHOD AND DEVICE
    8.
    发明公开
    IMPURITY MEASURING METHOD AND DEVICE 审中-公开
    方法和设备，用于测量污染

    公开(公告)号：EP1637868A4

    公开(公告)日：2008-02-13

    申请号：EP04745872

    申请日：2004-06-14

    Applicant: NIPPON LIGHT METAL CO ,  TOYOTA MOTOR CO LTD

    Inventor： KURAMASU YUKIO ,  NUKAMI TETSUYA

    IPC: G01N21/88 ,  G01N33/20

    CPC classification number: G01N33/206 ,  G01N21/8806 ,  G01N2021/8816 ,  G01N2021/8896 ,  G01N2201/06153 ,  G01N2201/0636

    Abstract: An impurity measuring device comprises a table (T) on which a sample (S) is placed with its fracture surface (h) upward, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an imaging means (10) for imaging the fracture surface (h) illuminated by the light (L), a dark and light coloring means for subjecting the imaged image to dark and light coloring, and a binarizing means for binarizing the image through comparison between the result of the dark and light coloring and a threshold value. Irradiating the fracture surface (h) with the light (L) from a plurality of directions ensures that the image obtained by imaging the fracture surface (h) is free from shading or optical irregularities due to minute irregularities in the fracture surface (h). Therefore, impurities in the sample (S) from the fracture surface (h) can be accurately detected by subjecting the image to dark and light coloring and binarization.

    IMPURITY MEASURING METHOD AND DEVICE
    9.
    发明公开
    IMPURITY MEASURING METHOD AND DEVICE 审中-公开
    VERFAHREN UND VORRICHTUNG ZUR MESSUNG VON VERUNREINIGUNGEN

    公开(公告)号：EP1637868A1

    公开(公告)日：2006-03-22

    申请号：EP04745872.4

    申请日：2004-06-14

    Applicant: Nippon Light Metal Company Ltd. ,  Toyota Jidosha Kabushiki Kaisha

    Inventor： KURAMASU, Yukio, Light Metal Company, Ltd. ,  NUKAMI, Tetsuya

    IPC: G01N21/17 ,  G01N33/20

    CPC classification number: G01N33/206 ,  G01N21/8806 ,  G01N2021/8816 ,  G01N2021/8896 ,  G01N2201/06153 ,  G01N2201/0636

    Abstract: An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.

    Abstract translation: 一种杂质测量装置，包括：台面（T），将其断面（h）面向上放置样品（S）;用于用光（L）照射断裂面（h）的照明装置（7） 从多个方向观察用于感测用光（L）照射的断裂面（h）的图像的图像感测装置，用于将感测图像处理成连续色彩图像的连续色调图像处理装置，以及二值化 用于通过连续色彩彩色图像处理的结果与阈值之间的比较二值化连续色调彩色图像的装置。 由于从多个方向对光（L）照射断裂面（h），通过感测断裂面（h）的图像而获得的图像没有由断裂面上的微细凹凸引起的遮光或光学不规则 （H）。 因此，通过对图像进行连续色调图像处理和二值化处理，可以从断裂面（h）精确地检测样品（S）中的杂质。

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