摘要:
The purpose of the present invention is to provide a microscope equipped with an imaging device used for the positioning of a sample, the microscope capable of removing distortion and blind spots from an image generated by the imaging device and reducing cost by using a commercially available imaging device. A microscope 10 comprises: a sample holder (sample stage 12) for holding a sample S; a measurement light source (infrared light source 11) for irradiating the sample S held by the sample holder with irradiation light; a focusing optical element (Cassegrain mirror 13) for focusing measurement light derived from the irradiation light transmitted through or reflected from the sample S; a detection unit (infrared light detector 15) for detecting the measurement light focused by the focusing optical element; an image capture device for capturing the image of the sample S; and an objective optical system switching unit (revolver 18) arranged to switch either the focusing optical element or the image capture device with the other to a position facing the sample S.
摘要:
A system for operating an electrokinetic device includes a support configured to hold and operatively couple with the electrokinetic device, an integrated electrical signal generation subsystem configured to apply a biasing voltage across a pair of electrodes in the electrokinetic device, and a light modulating subsystem configured to emit structured light onto the electrokinetic device. The system can further include a thermally controlled flow controller, and/or be configured to measure impedance across the electrokinetic device. The system can be a light microscope, including an optical train. The system can further include a light pipe, which can be part of the light modulating system, and which can be configured to supply light of substantially uniform intensity to the light modulating system or directly to the optical train.
摘要:
Variable orientation illumination-pattern rotators (“IPRs”) that can be incorporated into structured illumination microscopy instruments to rapidly rotate an interference pattern are disclosed. An IPR includes a rotation selector and at least one mirror cluster. The rotation selector directs beams of light into each one of the mirror clusters for a brief period of time. Each mirror cluster imparts a particular predetermined angle of rotation on the beams. As a result, the beams output from the IPR are rotated through each of the rotation angles imparted by each of the mirror clusters. The rotation selector enables the IPR to rotate the beams through each predetermined rotation angle on the order of 5 milliseconds or faster.
摘要:
The invention relates to a microscope (10) for detecting images of an object (14) lying in an object plane (12). Said microscope comprises a microscope stand (18), a microscope lens (20), a light source (22) integrated into the microscope stand (18), and a beam splitter (24) integrated into the microscope lens (20) for coupling in coaxial incident light illumination.
摘要:
Eine Beleuchtungsanordnung 4 für ein Diagnose- oder Operationsmikroskop weist eine Lichtquelle 18 auf, wobei die Beleuchtungsanordnung einen Beleuchtungsstrahlengang definiert. Zwischen der Lichtquelle 18 und einem einen Abbildungsstrahlengang definierenden Objektiv 6 des Mikroskops 2 ist eine Beleuchtungsoptik 20 angeordnet, wobei im Strahlengang der Lichtquelle 18 wenigstens ein Umlenkmittel 32 zur Einkopplung des Beleuchtungsstrahlenganges in den Abbildungsstrahlengang angeordnet ist und wobei die Beleuchtungsoptik 20 wenigstens ein pankratisches System 26 aufweist.Die Beleuchtungsanordnung 4 weist nach Art einer Köhler'schen Beleuchtung eine KollektorLinsenanordung 22, die in Strahlrichtung der Lichtquelle 18 hinter der Lichtquelle 18 angeordnet ist, eine der Kollektor-Linsenanordnung nachgeordnete Feldblende 36 und eine der Feldblende 36 nachgeordnete Hilfslinsenanordnung auf, wobei die Hilfslinsenanordnung 25 wenigstens ein pankratisches 26 System aufweist.
摘要:
Disclosed is a surgical microscopy system having an optical coherence tomography (OCT) facility. The system includes microscopy optics and an OCT system providing an OCT beam path. The OCT system includes an OCT-measuring light source, and a beam scanner disposed between the OCT-measuring light source and the objective lens. A beam of OCT measuring light of the OCT system traverses the objective lens and is directed onto the object region. The OCT system further comprises a zoom system disposed in the OCT beam path between the OCT-measuring light source and the beam scanner.
摘要:
A light modulating device 103 includes: a selective diffraction device (10, 10') which generates diffracted light beams of a plurality of orders by diffracting illumination light into one of a plurality of directions, the illumination light being linearly polarized light having a polarization plane oriented in a first polarization direction, and which causes a phase difference between the diffracted light beams of the plurality of orders; and a polarization plane rotating device 14 which rotates the polarization plane of the diffracted light beam of each order so as to be oriented in a direction perpendicular to a direction radiating from an optical axis.