摘要:
A programmable molecular device (10) is provided that includes a random nano-network that includes a plurality of molecular circuit components. Preferred molecular circuit components include molecular diodes that exhibit negative differential resistance. A method of programming the molecular device may include configuring the molecular components. Configuring a molecular component may include applying a voltage across input and output leads connected to the nano-networks. The voltage may be determined according to a self-adapting algorithm that programs the device to function, for example, as a logic unit or a memory unit. A molecular computer may include a plurality of programmable molecular devices (10) that are interconnected by metallic wires (14).
摘要:
In a memory cell reading method, a memory cell (12) is addressed, an input signal is applied to the addressed memory cell over a range of values, and the state of the memory cell is read based upon a discontinuity in a sensed electrical response to the applied input signal values. The state of the cell (12) is preferably read based upon a discontinuity in the sensed electrical response over a range of applied input signal values encompassing a rail voltage value, for example within one or more diode drops of the rail voltage value.
摘要:
A display comprising: an array of pixel units, each comprising a light emitting diode (LED) programmable between a first state in which it emits light when forward biased above its turn-on voltage and a second state in which it does not emit light when forward biased above its turn-on voltage; an addressing unit by which the pixel units are addressed; and a controller operable to control the addressing unit to apply, in a first phase, drive voltages across the LEDs which program their state, and in a second phase, drive voltages across the LEDs above their turn-on voltages.
摘要:
In a memory cell reading method, a memory cell (12) is addressed, an input signal is applied to the addressed memory cell over a range of values, and the state of the memory cell is read based upon a discontinuity in a sensed electrical response to the applied input signal values. The state of the cell (12) is preferably read based upon a discontinuity in the sensed electrical response over a range of applied input signal values encompassing a rail voltage value, for example within one or more diode drops of the rail voltage value.
摘要:
Logic circuitry includes a resonant-tunneling transistor (11) including a superlattice containing at least one quantum well layer, and a constant current source (V CC1 ,12) operatively connected between a base and an emitter of the transistor (11) and supplying a constant current to said base. The transistor (11) has a differential negative-resistance characteristic with at least one resonant point (RP) in a relationship between a current (I B ) flowing in the base and a voltage (V B ) between the base and emitter, and having at least two stable base current values (A,B) at both sides of the resonant point (RP) on the characteristic, defined by the changeable base emitter voltage (V BE ). By supplying the base·emitter voltage (V BE ) having an amplitude of at least two amplitudes corresponding to the stable base current values (A,B), the transistor (11) holds data corresponding to the base·emitter voltage (V BE ). The above circuitry may be applied to a memory cell (1) and a frequency divider. The resonant-tunneling transistor (11) may be a resonant-tunneling hot electron transistor (RHET) or a resonant-tunneling bipolar transistor (RBT).
摘要:
A memory system is organized as a matrix including a memory cell at each intersection of a bit line with write and read word lines Each memory cell comprises a first FET 20 having its gate coupled to a write word line and its drain coupled to a bit line, a second FET 22 having its source coupled to the bit line and its drain coupled to a read word line, and first and second negative resistance devices 24,26 coupled in series between a supply voltage and a substrate voltage, the common point SN of the series-connected negative resistance devices being coupled to the source of the first FET and to the gate of the second FET. Preferably, the first FET 20 is a p-channel device, the second FET 22 is an n-channel device, and the first and second negative resistance devices 24,26 are RTDs. In a second embodiment, a memory system has a memory cell at each intersection of a bit line with a word line. The memory cell comprises an FET having its gate coupled to a word line and one of its drain and source electrodes coupled to a bit line, first and second negative resistance devices 44,46 coupled in series between a supply voltage and a substrate voltage, the common point SN of the series-connected negative resistance devices being coupled to the other of the drain and source electrodes, and a capacitance 48 coupled between the common point of the series-connected negative resistance devices.