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公开(公告)号：US07260671B2
公开(公告)日：2007-08-21
申请号：US10278232
申请日：2002-10-23
申请人： Eric Cordes , Christian Stocken , Nazif Taskin , Norbert Wirth
发明人： Eric Cordes , Christian Stocken , Nazif Taskin , Norbert Wirth
IPC分类号： G06K19/10
CPC分类号： G11C7/1045 , G11C5/04 , G11C7/20 , G11C16/20
摘要： A memory module includes at least one memory chip arranged on the memory module. Information about the memory module and/or the at least one memory chip arranged on the memory module can be stored directly on the memory chip, making use of a suited element, fuses or flip-flops, for example. A memory chip contains such an element for containing information relating to the memory chip and/or a memory module with which the memory chip is compatible, wherein the information containing element can be read out by means of an external processor.
摘要翻译： 存储器模块包括布置在存储器模块上的至少一个存储器芯片。 关于存储器模块和/或布置在存储器模块上的至少一个存储器芯片的信息可以直接存储在存储器芯片上，例如使用适合的元件，保险丝或触发器。 存储器芯片包含用于存储与存储器芯片相关的信息的存储器芯片和/或与存储器芯片兼容的存储器模块的元件，其中信息包含元件可以通过外部处理器读出。
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公开(公告)号：US20050057988A1
公开(公告)日：2005-03-17
申请号：US10487255
申请日：2002-08-21
申请人： Eric Cordes , Christian Stocken , Georg Eggers , Jens Luepke
发明人： Eric Cordes , Christian Stocken , Georg Eggers , Jens Luepke
CPC分类号： G11C29/50012 , G11C7/1051 , G11C7/1087 , G11C11/401 , G11C29/50
摘要： A test method for a semiconductor memory device having a bidirectional data strobe terminal for a data strobe signal, and having at least one data terminal for a data signal at a test apparatus, which can at least generate data strobe and data signals and also transfer and evaluate data signals. The memory device is connected to a test apparatus, which generates data strobe and data signals, and transfers and evaluates data signals. In the course of the test using the data strobe and data signals, data are transferred from the first semiconductor memory device to a second semiconductor memory device of identical type and are evaluated after a read-out from the second semiconductor memory device by the test apparatus.
摘要翻译： 一种用于半导体存储器件的测试方法，具有用于数据选通信号的双向数据选通端子，并且在测试装置处具有用于数据信号的至少一个数据端，其至少可以产生数据选通和数据信号， 评估数据信号。 存储器件连接到产生数据选通和数据信号的测试装置，并传送和评估数据信号。 在使用数据选通和数据信号的测试过程中，数据从第一半导体存储器件传送到相同类型的第二半导体存储器件，并且在通过测试装置从第二半导体存储器件读出之后被评估 。
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公开(公告)号：US07277338B2
公开(公告)日：2007-10-02
申请号：US10487255
申请日：2002-08-21
IPC分类号： G11C7/00
CPC分类号： G11C29/50012 , G11C7/1051 , G11C7/1087 , G11C11/401 , G11C29/50
摘要： A test method for a semiconductor memory device having a bidirectional data strobe terminal for a data strobe signal, and having at least one data terminal for a data signal at a test apparatus, which can at least generate data strobe and data signals and also transfer and evaluate data signals. The memory device is connected to a test apparatus, which generates data strobe and data signals, and transfers and evaluates data signals. In the course of the test using the data strobe and data signals, data are transferred from the first semiconductor memory device to a second semiconductor memory device of identical type and are evaluated after a read-out from the second semiconductor memory device by the test apparatus.
摘要翻译： 一种用于半导体存储器件的测试方法，具有用于数据选通信号的双向数据选通端子，并且在测试装置处具有用于数据信号的至少一个数据端，其至少可以产生数据选通和数据信号，并且还传输和 评估数据信号。 存储器件连接到产生数据选通和数据信号的测试装置，并传送和评估数据信号。 在使用数据选通和数据信号的测试过程中，数据从第一半导体存储器件传送到相同类型的第二半导体存储器件，并且在通过测试装置从第二半导体存储器件读出之后被评估 。
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公开(公告)号：US07099585B2
公开(公告)日：2006-08-29
申请号：US10210741
申请日：2002-07-31
IPC分类号： H04B10/20
CPC分类号： G11C7/1054 , G11C5/04 , G11C7/1051 , G11C7/1078 , G11C7/1081
摘要： A memory circuit includes a plurality of memory cells, an input/output area for addressing or writing onto the plurality of memory cells by means of electrical signals, and an optical-electrical converter for converting optical signals into the electrical signals, the plurality of memory cells and the input/output area being integrated on a chip, and the optical-electrical converter being mechanically connected to the chip or being integrated into the chip.
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公开(公告)号：US06426640B1
公开(公告)日：2002-07-30
申请号：US09440803
申请日：1999-11-15
申请人： Norbert Wirth , Eric Cordes , Zoltan Manyoki , Dominique Savignac
发明人： Norbert Wirth , Eric Cordes , Zoltan Manyoki , Dominique Savignac
IPC分类号： G01R3102
CPC分类号： G01R31/2856 , G01R31/2884
摘要： The invention relates to a semiconductor module for a burn-in test configuration. The semiconductor module has a regulator which, when it is turned on, always supplies a constant low voltage to an internal circuit of the semiconductor module. The semiconductor module also contains a component which, when the burn-in voltage has been applied for a defined time period, supplies a different characteristic than when the internal voltage is applied.
摘要翻译： 本发明涉及一种用于老化测试配置的半导体模块。 半导体模块具有调节器，当其导通时，总是向半导体模块的内部电路提供恒定的低电压。 半导体模块还包含当在已经施加了预定时间段的老化电压时提供与施加内部电压不同的特性的组件。
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6.发明授权Method for determining neutron spectra and device for carrying out the method 失效用于确定中子谱的方法和实施该方法的装置公开(公告)号：US06423972B1
公开(公告)日：2002-07-23
申请号：US09435841
申请日：1999-11-08
申请人： Georg Fehrenbacher , Eric Cordes , Markus Sprunck , Wolfgang Wahl
发明人： Georg Fehrenbacher , Eric Cordes , Markus Sprunck , Wolfgang Wahl
IPC分类号： G01T308
CPC分类号： G01T3/08
摘要： In a method and apparatus for determining neutron spectra using at least two neutron detectors which provide integral counting rates from which the spectrum of a neutron radiation can be approximated, and which consist each of a semiconductor diode, a converter layer, an inactive layer and an active layer. The various layers of each detector are different from those of the other neutron detector and so selected that the sensitivity functions of the two neutron detectors are different. An artificial neutral network is provided which is especially trained and to which the counting rates of the detectors are supplied to be processed for obtaining the neutron spectrum.
摘要翻译： 在使用至少两个中子探测器确定中子谱的方法和装置中，该中子检测器提供了可以近似中子辐射光谱的积分计数速率，并且其包括半导体二极管，转换器层，非活性层和 活动层 每个检测器的各个层不同于另一个中子探测器的层，因此选择两个中子探测器的灵敏度函数是不同的。 提供了经过特别训练的人造中性网络，并且为了获得中子谱，提供了检测器的计数速率以进行处理。
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