INDUCTIVE POSITION TRANSDUCER SYSTEM WITH IMPEDANCE CIRCUIT PORTION

    公开(公告)号:US20250076086A1

    公开(公告)日:2025-03-06

    申请号:US18457181

    申请日:2023-08-28

    Abstract: An inductive position transducer system is provided, including an inductive position transducer and one or more sensing circuit portions. Each sensing circuit portion is connected to first and second sensing coil terminals and is configured to receive a signal from a respective sensing coil and comprises an impedance circuit portion and an input circuit portion (e.g., of an ASIC). The impedance circuit portion comprises at least first and second impedance circuit portion components. The first impedance circuit portion component is coupled between first and second impedance circuit portion nodes. The second impedance circuit portion component is at least one of: coupled between the first coil terminal and the first impedance circuit portion node; or coupled between the first impedance circuit portion node and the second impedance circuit portion node (for which a third impedance circuit portion component may also be provided in some implementations).

    AUTOMATIC MEASURING APPARATUS
    2.
    发明申请

    公开(公告)号:US20250076019A1

    公开(公告)日:2025-03-06

    申请号:US18820539

    申请日:2024-08-30

    Abstract: An automatic measuring apparatus includes a measuring device that measures a dimension of a workpiece, the measuring device including a movable element that is displaceable with respect to a fixed element and moves forward and backward to be brought into contact with or away from the workpiece, and a displacement detection part that detects a displacement or position of the movable element, and an automatic operation part that automates the forward/backward movement of the movable element by power. A workpiece holding part that holds the workpiece in such a manner that a position and posture of the workpiece is changed at a pressure lower than a predetermined measurement pressure set in advance in the measuring device when the movable element is brought into contact with the workpiece.

    CALIBRATION JIG
    3.
    发明申请

    公开(公告)号:US20250035431A1

    公开(公告)日:2025-01-30

    申请号:US18758861

    申请日:2024-06-28

    Abstract: A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part about a first axis; a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis; and a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.

    Angle detector and position measuring device

    公开(公告)号:US12188768B2

    公开(公告)日:2025-01-07

    申请号:US17895267

    申请日:2022-08-25

    Abstract: An angle detector includes a rotary scale having a scale pattern in which a plurality of patterns are arrayed along a circumference direction of the rotary scale, and a plurality of detection heads, each of which detects the plurality of patterns from the scale pattern. The plurality of detection heads are shifted from each other in the circumference direction of the rotary scale and are shifted from each other in a radial direction of the rotary scale.

    Adjustable update rate for measuring probe

    公开(公告)号:US12188765B2

    公开(公告)日:2025-01-07

    申请号:US17939710

    申请日:2022-09-07

    Abstract: A measuring system includes a measuring probe with a contact portion that contacts a workpiece to be measured. The measuring probe operates with a first update rate during at least part of a moving mode, wherein the moving mode includes movement of the measuring probe such that the contact portion is moved away from the workpiece and/or is moved at a distance from the workpiece that is equal to or greater than a threshold distance. The measuring probe operates with a second update rate (i.e., which is faster than the first update rate) during at least part of a measuring mode, wherein the measuring mode includes movement of the measuring probe such that the contact portion is moved toward the workpiece for obtaining a measurement. In various implementations, the combined use of the first and second update rates effectively reduces power-on drift of the measuring probe.

    METROLOGY SYSTEM INCLUDING LASER AND RADAR CONFIGURATION

    公开(公告)号:US20250004133A1

    公开(公告)日:2025-01-02

    申请号:US18344731

    申请日:2023-06-29

    Abstract: A metrology system is provided including a laser and radar configuration and a retroreflector portion. A main body portion of the laser and radar configuration includes a laser portion and a radar portion, which transmit laser light and radar signals. A rotator portion rotates the main body portion to change a transmission direction of the laser light and the radar signals (e.g., as partially controlled based on operations of an optical sensor of the laser portion) to be directed toward the retroreflector portion. The radar portion receives the reflected radar signals (e.g., which enable a distance to the retroreflector portion to be determined). 3-dimensional positions of the retroreflector portion (e.g., as disposed at an object to be measured) are determined based at least in part on angular positions determined from operations of the laser portion and distances determined from operations of the radar portion.

    Measuring probe with sensing coils and temperature compensation

    公开(公告)号:US12174013B2

    公开(公告)日:2024-12-24

    申请号:US18147540

    申请日:2022-12-28

    Abstract: A measuring probe for a coordinate measuring machine is provided. The measuring probe includes a stylus position detection portion with a sensing coil configuration, signal processing and control circuitry and a temperature dependent compensation portion. The temperature dependent compensation portion includes a temperature dependent component that is coupled to at least part of the sensing coil configuration such that a change in a characteristic of the temperature dependent component due to an increase in temperature of the temperature dependent component causes a ratio of a first current to a second current to increase in the sensing coil configuration, wherein the first and second currents are in at least one first sensing coil and at least one second sensing coil, respectively, of the sensing coil configuration. Such implementations are configured to increase accuracy of the processed signals by at least partially compensating for certain affects that occur due to temperature changes.

    Measurement system, measurement method and non-transitory storage medium

    公开(公告)号:US12151385B2

    公开(公告)日:2024-11-26

    申请号:US17893791

    申请日:2022-08-23

    Inventor: Naoki Mitsutani

    Abstract: A measurement system includes a multi-axis robot, a measurement unit coupled to the multi-axis robot, and a data processing apparatus, wherein the measurement unit includes one or more imaging devices movable with respect to a reference position of the multi-axis robot, and a position specification device for specifying a position of one or more of the imaging devices with respect to the reference position, wherein the data processing apparatus includes an acquisition part for acquiring a plurality of pieces of captured image data generated by having one or more of the imaging devices capture images at two or more positions, and a measurement part for measuring a distance between the plurality of feature points in a workpiece on the basis of a position of the feature point of the workpiece included in the plurality of pieces of captured image data.

    Precision length measuring device

    公开(公告)号:US12148286B2

    公开(公告)日:2024-11-19

    申请号:US17245596

    申请日:2021-04-30

    Abstract: A measuring device includes a measured value obtainer, a display device configured to display a measured value obtained by the measured value obtainer, an illumination device configured to emit a light to the display device, a measurement state obtainer configured to obtain information regarding a state in which a measured value is obtained by the measured value obtainer, and an illumination color changer configured to change a color of the light in accordance with a measurement state obtained by the measurement state obtainer.

    AUTOMATIC MEASURING SYSTEMS AND CONTROL METHOD FOR AUTOMATIC MEASURING SYSTEMS

    公开(公告)号:US20240346694A1

    公开(公告)日:2024-10-17

    申请号:US18631483

    申请日:2024-04-10

    Abstract: An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured to measure a dimension or a shape of the object to be measured, a moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured, and an observation camera that images the object to be measured. A position and an orientation (posture) of a point to be measured are acquired from image data obtained by imaging the object to be measured by the observation camera, the measuring sensor tool is caused by the moving mechanism to approach the point to be measured, taking into account a position and posture offset between the observation camera and the measuring sensor tool, and a measurement value of the point to be measured is acquired by the measuring sensor tool.

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