摘要:
Systems, methods and computer program products for programming data into a multi-plane memory device employ a multi-plane data order. To allow multiple data pages to be programmed without a need to increase the size of page buffers, in some implementations, a data transfer scheme at which the data pages are programmed can be manipulated. Specifically, data across all channels can first be programmed into a first plane of the multi-plane flash memory device in parallel. While the data transfer program operation is in progress, data to be programmed into a succeeding plane (e.g., plane “1”) can be read into and cached in one or more page buffers. After the data transfer program for the first plane is complete, data cached in the page buffers can be immediately latched and programmed into the multi-plane flash memory device.
摘要:
Methods, systems and computer program products for implementing a polling process among one or more flash memory devices are described. In some implementations, the polling process may include sending a read status command to a flash memory device to detect the ready or busy state of the flash memory device. A status register may be included in the flash memory device for storing a status signal indicating an execution state of a write (or erase) operation. A solid state drive system may perform the polling process by reading the status register of the flash memory device.
摘要:
Systems, methods and computer program products for programming data into a multi-plane memory device employ a multi-plane data order. To allow multiple data pages to be programmed without a need to increase the size of page buffers, in some implementations, a data transfer scheme at which the data pages are programmed can be manipulated. Specifically, data across all channels can first be programmed into a first plane of the multi-plane flash memory device in parallel. While the data transfer program operation is in progress, data to be programmed into a succeeding plane (e.g., plane “1”) can be read into and cached in one or more page buffers. After the data transfer program for the first plane is complete, data cached in the page buffers can be immediately latched and programmed into the multi-plane flash memory device.
摘要:
Methods, systems and computer program products for implementing a polling process among one or more flash memory devices are described. In some implementations, the polling process may include sending a read status command to a flash memory device to detect the ready or busy state of the flash memory device. A status register may be included in the flash memory device for storing a status signal indicating an execution state of a write (or erase) operation. A solid state drive system may perform the polling process by reading the status register of the flash memory device.
摘要:
A semiconductor device that includes a module under test that is integrated with the semiconductor device, that receives an input signal from a test module, and that provides an output signal to at least one output terminal based on the input signal. An error detecting module is integrated with the semiconductor device, samples values of the output signal, and outputs the sampled values to the test module.
摘要:
A semiconductor device that includes a module under test that is integrated with the semiconductor device, that receives an input signal from a test module, and that provides an output signal to at least one output terminal based on the input signal. An error detecting module is integrated with the semiconductor device, samples values of the output signal, and outputs the sampled values to the test module.
摘要:
A semiconductor device including an electronic circuit, a memory, and an error detecting module. The electronic circuit is configured to receive an input signal having been generated by a test module, and generate an output signal based on the input signal. The memory is configured to store a predetermined output value that is expected to be output from the electronic circuit based on the electronic receiving the input signal, wherein the predetermined output value is stored in the memory prior to the input signal being generated by the test module. The error detecting module is configured to (i) generate a sample value of the output signal, (ii) compare the sample value of the output signal to the predetermined output value stored in the memory, and (iii) generate a result signal that indicates whether the sample value of the output signal matches the predetermined output value.
摘要:
A semiconductor device that includes a module under test that is integrated with the semiconductor device, that receives an input signal from a test module, and that provides an output signal to at least one output terminal based on the input signal. An error detecting module is integrated with the semiconductor device, samples values of the output signal, and outputs the sampled values to the test module.
摘要:
A device is fabricated on a flash process semiconductor die. The device includes main memory to store processor information. A cache memory caches a portion of the processor information. A cache controller controls the cache memory. A device interface communicates the processor information to another semiconductor die. Control logic controls the device interface.
摘要:
A device is fabricated on a flash process semiconductor die. The device includes main memory to store processor information. A cache memory caches a portion of the processor information. A cache controller controls the cache memory. A device interface communicates the processor information to another semiconductor die. Control logic controls the device interface.