摘要:
A preferred state power-up latch circuit includes first and second cross-coupled P-channel transistors coupled to a first source of supply voltage, first and second cross-coupled N-channel transistors coupled to a second source of supply voltage, the transistors being coupled together to form a latch having an output node, in which at least one of the gate lengths is unequal to the other gates lengths in order to establish a preferred state upon power-up, and the gate width of all the transistors is equal.
摘要:
A ferroelectric memory array includes a word line coupled to a row of ferroelectric memory cells and a word line driver circuit for establishing a full power supply voltage on the word line. A bootstrapping circuit is coupled between the word line and a boost line for receiving a boost signal. The bootstrapping circuit includes a ferroelectric capacitor and coupling circuitry for coupling the ferroelectric capacitor between the boost line and the word line in a first operational mode such that the peak voltage on the word line is greater than the power supply voltage, and for isolating the ferroelectric capacitor from the boost line in a second operational mode. In operation, a selected word line is precharged to a full VDD power supply voltage, the ferroelectric capacitor associated with the selected word line is coupled to the boost line, the ferroelectric capacitors associated with non-selected word lines are electrically isolated from the boost line, and the boost line transitions from zero volts to VDD such that the voltage on the selected word line is boosted to a voltage greater than the VDD power supply voltage.
摘要:
A reference cell layout for use in a 1T/1C ferroelectric memory array includes a transistor of a first polarity type having a gate coupled to a reference word line and a current path coupled between a bit line and an internal cell node, a transistor of a second polarity type having a gate coupled to a pre-charge line and a current path coupled between a source of power supply voltage and the internal cell node, a shunt reference word line extending across the reference cell that is electrically isolated from the reference word line, the pre-charge line and the transistors within the physical boundary of the memory cell, and a ferroelectric capacitor coupled between the internal cell node and a reference plate line.
摘要:
A method of operating a 1T/1C ferroelectric memory having a memory cell coupled to a word line, a bit line, and a plate line, includes the steps of turning on the word line, energizing the plate line to establish a charge on the bit line, turning off the word line, and sensing the charge on the bit line while the word line is off.
摘要:
A memory cell layout for use in a 1T/1C ferroelectric memory array includes an access transistor having a gate coupled to a word line and a current path coupled between a bit line and an internal cell node, a shunt word line extending across the memory cell that is electrically isolated from the word line and the access transistor within the physical boundary of the memory cell, and a ferroelectric capacitor coupled between the internal cell node and a plate line.
摘要:
A reference cell for a 1T/1C ferroelectric memory includes a transistor of a first polarity type having a gate coupled to a reference cell word line, and a current path coupled between a bit line and an internal reference cell node, a transistor of a second polarity type having a gate coupled to a pre-charge line, and a current path coupled between a source of supply voltage and the internal reference cell node, and a ferroelectric capacitor coupled between the internal reference cell node and ground.
摘要:
A ferroelectric nonvolatile random access memory array includes multiple ferroelectric memory cells arranged in rows and columns, a word line coupled to a word line input of each of the ferroelectric memory cells in a row, and a bit line coupled to a bit line input of each of the ferroelectric memory cells in a column. The array also includes multiple plate lines, each plate line being arranged into a plurality of plate line segments each coupled to a plate line input of a predetermined number of the ferroelectric memory cells in a row, and multiple NMOS plate line segment drivers coupled to each of the plate line segments for selectively driving the corresponding plate line segment to a full rail voltage. The rows of ferroelectric memory cells and the NMOS plate line segment drivers have substantially the same layout pitch. The plate line segment drivers are each coupled to a center portion of the corresponding plate line segment. Each NMOS plate line segment drivers includes a first NMOS transistor having a first current node coupled to the word line associated with the ferroelectric memory cells coupled to the plate line segment, a gate coupled to a source of supply voltage, and a second current node, and a second NMOS transistor having a first current node coupled to the plate line segment, a second current node coupled to a plate clock line, and a gate coupled to the second current node of the first NMOS transistor.
摘要:
A cross-coupled sense amplifier includes a voltage-compensating balancing resistor serially connected between the drain of one of the P-channel transistors in the sense amplifier and the corresponding sensing/bit line node. The value of the balancing resistor is optimized so that the voltage imbalance between the P-channel transistor is minimized and sense amplifier sensitivity is maximized. A balancing resistor can also be placed in the N-channel transistors in the sense amplifier if desired. The balancing resistor in a typical application is about 100 to 200 ohms and fabricated from polysilicon.
摘要:
A test mode circuit for an integrated circuit includes a high voltage detector having an input for receiving a high voltage signal, a Schmitt trigger having an input coupled to the output of the high voltage detector, a latch having an input coupled to the output of the Schmitt trigger and an output for providing a test mode signal in a test operational mode, and additional control circuitry for disabling the high voltage detector and Schmitt trigger so that substantially all of the active current flow in the high voltage detector and Schmitt trigger is eliminated in a normal operational mode. The test mode circuit further includes circuitry for preventing a reset condition in the latch during the test mode until a power-down condition occurs. A glitch filter is also included, which is interposed between the output of the Schmitt trigger and the input to the latch. An integrated circuit pin is coupled to both the test mode circuit and to other circuitry on the integrated circuit not forming part of the test mode circuit.
摘要:
A non-volatile ferroelectric latch includes a sense amplifier having at least one input/output coupled to a bit-line node, a ferroelectric storage capacitor coupled between a plate-line node and the bit-line node, and a load element coupled to the bit-line node. The sense amplifier further includes a second input/output coupled to a second bit-line node and the latch further includes a second ferroelectric storage capacitor coupled between a second plate-line node and the second bit-sine node, and a second load element coupled to the second bit-line node. The load element includes a dynamic, switched ferroelectric capacitor a static, nonswitched ferroelectric capacitor, a linear capacitor, or even a resistive load.