摘要:
Signal transit times on printed circuit boards which are equipped with all the passive components but without any active components can be determined using automatic standard test equipment composed of a standard test unit and a performance board with fittings attached thereto. In that first, using a standard routine of the test unit, a transit time is measured on the performance board from the CIF connector as far as the fitting, then a printed circuit board is plugged into the fitting location determined for it and then the sum transit time of the CIF connector is measured as far as the landing pad on the printed circuit board. By forming differences between the two measured values, the transit times on a printed circuit board can be measured with a high degree of precision with the automatic standard test equipment used in standard module testing technology.
摘要:
Two methods check functional capability of electrical connections between address lines of a printed circuit board of a memory module and address line contacts of an integrated semiconductor memory chip mounted on the printed circuit board. Ruptured solder contacts are conventionally examined optically or investigated by electrical resistance measurements; however, the latter do not work in the case of memory modules with a number of semiconductor chips, the pin contacts of which are connected in parallel by the address lines. The methods make it possible to locate interrupted contacts on individual address lines by the indirect use of a write-read access to the semiconductor memory chip, specifically utilizing the misrouting of writing and reading commands produced by defective contact connections.
摘要:
A control unit is provided and a method for assembling such a control unit for a personal protection device for a vehicle. A circuit board is installed between a plastic cover and a plastic floor. An interface is positioned on the circuit board, for an electrical connection to at least one additional vehicle component. At least one opening is provided in the plastic cover for the electrical connection.
摘要:
An electronic memory device for storing data comprises a memory cell array arranged in at least one memory bank and comprising memory cells in which information is stored. The electronic memory device further comprises word lines and bit lines for addressing and reading the memory cells of the memory cell array. The word lines are configured to refresh in a refresh mode the information stored in the memory cells of the memory cell area by applying a predetermined activation potential at a predetermined refresh rate to the word lines. All word lines of the memory bank which do not have a common bit line are activated simultaneously in the refresh mode.
摘要:
An installation for positioning and welding body parts of different types of motor vehicles. The installation includes a mounting frame (5) which is guided on a conveyor line and which has receiving elements for at least some vehicle body parts. Positioning devices (8) are provided for the vehicle body parts (6) and at least one robot is provided for carrying out welding work. The invention is very flexible in terms of product modifications. The mounting frame (5) has positioning devices for at least some vehicle body parts (6) and clamping devices for the vehicle body parts. An additional (lower) conveyor line (10) is located under the first conveyor (2). One of several auxiliary mounting frames (12) is guided on the additional conveyor line. Parking positions (13) for the auxiliary mounting frames (12) are provided next to the lower conveyor line (10). The auxiliary mounting frames (12) each have receiving elements for other vehicle body parts of different types of vehicles and devices for positioning and clamping with the mounting frame (5). A lifting device (17) is also provided for the auxiliary mounting frame (12).
摘要:
A device for measuring a force, a pressure or a torque transmitted in a force path between first and second apparatus components, includes at least three mutually spaced piezo-resistive resistor elements disposed in the force path between the first and second apparatus components such that the apparatus components orthogonally stress the resistor elements.
摘要:
An electronic memory device for storing data comprises a memory cell array arranged in at least one memory bank and comprising memory cells in which information is stored. The electronic memory device further comprises word lines and bit lines for addressing and reading the memory cells of the memory cell array. The word lines are configured to refresh in a refresh mode the information stored in the memory cells of the memory cell area by applying a predetermined activation potential at a predetermined refresh rate to the word lines. All word lines of the memory bank which do not have a common bit line are activated simultaneously in the refresh mode.
摘要:
A method for predicting a development over time of a system quantity (WP, 41, 42, 43, 44, 6) of a system (2), to which a number of system quantities (WP, 41, 42, 43, 44, 6) are assigned, a sequence of one of the system quantities (WP, 41, 42, 43, 44, 6) in each case being characterized by at least one event, wherein a delay of the at least one event is detected. On this basis, at least one actual value (I) over time for at least one event of at least one system quantity (WP, 41, 42, 43, 44, 6) is calculated within one measurement period to be predicted. The present invention makes it possible to provide a prediction of the system (2) or of one or a plurality of system quantities (WP, 41, 42, 43, 44, 6) based on flexible measurement periods. A future development of the system (2) or of the at least one system quantity (WP, 41, 42, 43, 44, 6) may not only be estimated roughly but instead may be calculated reliably under consideration of measurable data. The method makes reliable planning for future sequences of the at least one system quantity (WP, 41, 42, 43, 44, 6) and even of the entire system (2) possible.
摘要:
A method and an apparatus for testing an SDRAM are described. The SDRAM is used as a main memory in the PC, and an additional circuit configuration is accommodated on a plug-in board and has an additional memory in the form of an SRAM and logic circuits. The method according to the invention allows the SDRAM to be tested in a module bank in the running PC to be set deliberately to a test mode. In this case the code for test mode activation is modified by a high-level language program (PASCAL) in accordance with the user requirements, is copied to the additional memory on the plug-in board, and is then called by the high-level language program using MS DOS. After activation of the selected test mode by a code programmed in Assembler, a defined jump is made back to the calling program once again. This allows the use of the test mode provided in the SDRAM in standard PCs and using standard operating systems. This greatly increases the test options for SDRAMs on standard PCs.
摘要:
In a method for producing a multilayer circuit, it is possible to produce capacitor structures including electrodes and a dielectric arranged in between. By pressing the capacitor structures into a ceramic layer, it is possible to produce a high-quality capacitor inside the multilayer circuit.