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    X-ray imaging system use and calibration
    1.
    发明授权
    X-ray imaging system use and calibration 有权

    公开(公告)号：US10898159B2

    公开(公告)日：2021-01-26

    申请号：US16245938

    申请日：2019-01-11

    申请人： General Electric Company

    发明人： Peter Michael Edic ,  Biju Jacob

    IPC分类号： A61B6/00 ,  G01N23/046 ,  A61B6/03

    摘要： The present disclosure relates to determining the position of an X-ray focal spot in real time during an imaging process and using the focal spot position to ensure alignment of the focal spot and high-aspect detector elements or to correct for focal spot misalignment, thereby mitigating image artifacts. For example, the focal spot position may be monitored and may be adjusted in real-time using electromagnetic electron beam steering during a scan. Alternatively, previously determined functional relationships between focal spot position and measured data may be applied to address or correct for focal spot misalignment in the acquired data.

    Systems and methods for increased energy separation in multi-energy X-ray imaging
    7.
    发明授权
    Systems and methods for increased energy separation in multi-energy X-ray imaging 有权
    在多能X射线成像中增加能量分离的系统和方法

    公开(公告)号：US09204852B2

    公开(公告)日：2015-12-08

    申请号：US14145445

    申请日：2013-12-31

    申请人： General Electric Company

    发明人： Peter Michael Edic ,  James Walter LeBlanc ,  Vance Scott Robinson

    IPC分类号： A61B6/00 ,  A61B6/03

    CPC分类号： A61B6/482 ,  A61B6/035 ,  A61B6/4021 ,  A61B6/4035 ,  A61B6/4042 ,  A61B6/4291 ,  A61B6/587

    摘要： A filtering device includes an X-ray translucent substrate having a plurality of septa disposed therein at a plurality of fixed positions with respect to the substrate. A controller is programmed to acquire a first set of projection data at a first energy spectrum by controlling the X-ray source to emit the X-rays at the first energy spectrum and controlling the position of the filtering device to focally align the plurality of septa with the X-ray beam emitted from the focal spot, and to acquire a second set of projection data at a second energy spectrum with a mean energy greater than the mean energy of the first energy spectrum by controlling the X-ray source to emit the X-rays at the second energy spectrum and controlling a change in the position of the filtering device to focally misalign the plurality of septa with the X-ray beam emitted from the focal spot.

    摘要翻译： 过滤装置包括X射线透光性基板，其具有相对于基板在多个固定位置配置的多个隔片。 控制器被编程为通过控制X射线源以第一能谱发射X射线来获取第一能谱上的第一组投影数据，并且控制过滤装置的位置以使多个隔片 利用从焦点发射的X射线束，并且通过控制X射线源发射第二能量谱的平均能量大于第一能谱的平均能量，以第二能量谱获取第二组投影数据 在第二能谱处的X射线，并且控制过滤装置的位置的变化，以使从多个隔膜与从焦斑发射的X射线束对准不对准。

    SYSTEMS AND METHODS FOR CORRECTING DETECTOR ERRORS IN COMPUTED TOMOGRAPHY IMAGING
    8.
    发明申请
    SYSTEMS AND METHODS FOR CORRECTING DETECTOR ERRORS IN COMPUTED TOMOGRAPHY IMAGING 有权
    用于校正计算机图像成像中检测器错误的系统和方法

    公开(公告)号：US20150182176A1

    公开(公告)日：2015-07-02

    申请号：US14145018

    申请日：2013-12-31

    申请人： General Electric Company

    发明人： Yannan Jin ,  Peter Michael Edic ,  Vladimir A. Lobastov ,  Hewei Gao ,  Geng Fu

    IPC分类号： A61B6/00 ,  A61B6/03

    CPC分类号： A61B6/4241 ,  A61B6/032 ,  A61B6/482 ,  G01T1/171

    摘要： A system includes an energy-discriminating, photon-counting X-ray detector, comprising a plurality of detector cells providing measurements corresponding to at least two energy bins and being adapted to produce projection data in response to X-ray photons that reach the X-ray detector and to produce an electrical signal having a recorded count for the energy bins and a total energy intensity. The system also includes data processing circuitry adapted to receive the electrical signal from one or more of the plurality of detector cells, to generate a simulated count rate for each of the energy bins by using the total energy intensity in a detector pile-up model, to determine a set of energy intensity dependent material decomposition vectors, and, for the projection data measured by one or more of the plurality of detector cells, to perform material decomposition by modeling the simulated count rate for each of the energy bins and utilizing a material decomposition vector selected from the set of energy intensity dependent material decomposition vectors and corresponding to the measured energy intensity from one or more of the plurality of detector cells.

    摘要翻译： 一种系统包括能量鉴别光子计数X射线检测器，其包括多个检测器单元，其提供对应于至少两个能量箱的测量值，并且适于响应于到达X射线的X射线光子产生投影数据， 并且产生具有用于能量箱的记录计数和总能量强度的电信号。 该系统还包括适于从多个检测器单元中的一个或多个接收电信号的数据处理电路，通过使用检测器堆积模型中的总能量强度来产生每个能量箱的模拟计数率， 以确定一组依赖于能量强度的材料分解向量，并且对于由多个检测器单元中的一个或多个检测器单元测量的投影数据，通过对每个能量箱的模拟计数率进行建模并利用材料来执行材料分解 所述分解矢量选自所述一组能量强度依赖材料分解向量，并对应于来自所述多个检测器单元中的一个或多个的所测量的能量强度。

    SYSTEMS AND METHODS FOR X-RAY IMAGING
    9.
    发明申请
    SYSTEMS AND METHODS FOR X-RAY IMAGING 有权
    用于X射线成像的系统和方法

    公开(公告)号：US20140185901A1

    公开(公告)日：2014-07-03

    申请号：US13730349

    申请日：2012-12-28

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Peter Michael Edic ,  Colin Richard Wilson ,  Jeffery Wayne Eberhard ,  Dan Xu

    IPC分类号： G06F17/50 ,  G06T11/00

    CPC分类号： G06T11/003 ,  G06T11/005 ,  G06T2211/408

    摘要： An energy-sensitive system includes one or more processors configured to determine spectral attenuation curves for a first basis material and a second basis material, respectively. The one or more processors are configured to substitute a k-edge feature in the determined spectral attenuation curves with an approximation of the determined spectral attenuation curves lacking the k-edge feature. The one or more processors are also configured to construct a material decomposition model based on one of the determined or approximated first and second spectral attenuation curves. The one or more processors are additionally configured to decompose X-ray projection data into basis material projection data comprising first and second line integrals based, at least in part, on the model.

    摘要翻译： 能量敏感系统包括一个或多个处理器，其被配置为分别确定第一基础材料和第二基础材料的光谱衰减曲线。 一个或多个处理器被配置为用确定的光谱衰减曲线中的k边缘特征代替所确定的缺少k边缘特征的光谱衰减曲线。 一个或多个处理器还被配置为基于确定的或近似的第一和第二光谱衰减曲线之一来构建材料分解模型。 一个或多个处理器还被配置为至少部分地基于模型将X射线投影数据分解成包括第一和第二线积分的基础材料投影数据。

    X-RAY PHASE CONSTRAST DETECTOR
    10.
    发明申请
    X-RAY PHASE CONSTRAST DETECTOR 有权

    公开(公告)号：US20210244373A1

    公开(公告)日：2021-08-12

    申请号：US16789100

    申请日：2020-02-12

    申请人： General Electric Company

    发明人： Uwe Wiedmann ,  Biju Jacob ,  Peter Michael Edic ,  Brian David Yanoff

    IPC分类号： A61B6/00 ,  G01N23/041

    摘要： The present disclosure relates to fabrication and use of a phase-contrast imaging detector that includes sub-pixel resolution electrodes or photodiodes spaced to correspond to a phase-contrast interference pattern. A system using such a detector may employ fewer gratings than are typically used in a phase-contrast imaging system, with certain functionality typically provided by a detector-side analyzer grating being performed by sub-pixel resolution structures (e.g., electrodes or photodiodes) of the detector. Measurements acquired using the detector may be used to determine offset, amplitude, and phase of a phase-contrast interference pattern without multiple acquisitions at different phase steps.