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公开(公告)号：US3343049A
公开(公告)日：1967-09-19
申请号：US37606664
申请日：1964-06-18
Applicant: IBM
Inventor： MILLER WILLIAM H , FRED BARSON
IPC: H01L29/73 , H01L21/18 , H01L21/316 , H01L21/331 , H01L21/56 , H01L23/29 , H01L23/31 , H01L29/00 , H01L29/78 , H01L29/94
CPC classification number: H01L23/3157 , H01L21/02129 , H01L21/02164 , H01L21/022 , H01L21/02321 , H01L21/18 , H01L21/31612 , H01L21/56 , H01L23/291 , H01L29/00 , H01L2924/0002 , H01L2924/19041 , Y10S148/043 , Y10S148/053 , Y10S148/062 , Y10S148/118 , H01L2924/00
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2.发明授权Method of influencing minority carrier lifetime in the semiconductor body of a pn junction device 失效影响pn结器件半导体主体中少数载流子寿命的方法
公开(公告)号：US3195218A
公开(公告)日：1965-07-20
申请号：US21988062
申请日：1962-08-28
Applicant: IBM
Inventor： MILLER WILLIAM H , RIDEOUT ARTHUR J , WORTHINGTON THOMAS K
IPC: H01L21/00 , H01L21/322 , H01L23/29 , H01L29/00
CPC classification number: H01L23/291 , H01L21/00 , H01L21/3221 , H01L29/00 , H01L2224/4847 , Y10S438/904 , Y10S438/938
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