MEASURING SURFACE LAYER THICKNESS
    1.
    发明申请

    公开(公告)号:US20170176173A1

    公开(公告)日:2017-06-22

    申请号:US14973131

    申请日:2015-12-17

    CPC classification number: G01B11/065

    Abstract: Described herein are devices and techniques for measuring a thickness of a surface layer. A device can include a detector, a processor, and a memory. The detector can be arranged to receive reflected light from a surface of a sample. The processor can be in electrical communication with the detector. The memory can store instructions that, when executed by the processor, can cause the processor to perform operations. The operations can include receiving optical data from the detector, determining a polarization change of the reflected light, the polarization change being a function of the optical data, and determining a thickness of the surface layer using the polarization change and the wavelength of the incident light. The optical data can include information regarding the phase difference of the reflected light and the incident light. Also described are other embodiments.

    Thermocompression bonding using plasma gas

    公开(公告)号:US10297567B2

    公开(公告)日:2019-05-21

    申请号:US14974823

    申请日:2015-12-18

    Abstract: Described herein are devices and techniques for thermocompression bonding. A device can include a housing, a platform, and a plasma jet. The housing can define a chamber. The platform can be located within the chamber and can be proximate a thermocompression chip bonder. The plasma jet can be located proximate the platform. The plasma jet can be movable about the platform. The plasma jet can include a nozzle arranged to direct a plasma gas onto the platform. Also described are other embodiments for thermocompression bonding.

Patent Agency Ranking