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公开(公告)号：US09326369B2
公开(公告)日：2016-04-26
申请号：US13921550
申请日：2013-06-19
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann , Gregory Sobolewski , Martin J. Rice , Wayne Goeke
CPC classification number: H05K1/0213 , H05K1/0225 , H05K1/0256 , H05K1/142 , H05K1/145 , H05K3/306 , H05K3/4038 , H05K3/4697 , H05K2201/0792 , H05K2201/09063 , H05K2201/093 , H05K2201/09618 , H05K2201/0969 , H05K2201/09981 , Y10T29/49139
Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.
Abstract translation: 具有低介电吸收率的器件包括印刷电路板（PCB），包括层叠在部件连接区域的顶表面上的第一导体的部件连接区域和层叠在部件连接区域的底表面上的第二导体， 围绕部件连接区域，将部件连接区域连接到穿过孔的PCB的低泄漏部件以及由至少基本上围绕PCB顶表面上的孔的第三导体组成的防护件和至少 基本上围绕PCB的底表面上的孔。
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Patent Agency Ranking
公开(公告)号：US20140111186A1
公开(公告)日：2014-04-24
申请号：US13658055
申请日：2012-10-23
Applicant: KEITHLEY INSTRUMENTS, INC.
Inventor： James A. Niemann
IPC: G01R17/02
CPC classification number: G01R31/2839 , G01R1/203 , G01R15/12
Abstract: An impedance sourcing circuit for a measurement device configured to measure a device under test (DUT) and method are disclosed. The impedance sourcing circuit includes a voltage/current source. An electrically controlled variable resistance having a control input is configured to adjust the variable resistance is coupled to the DUT. A loop gain controller is coupled to the control input of the electrically controlled variable resistance. The loop gain controller is configured to drive the control input of the electrically controlled variable resistance to adjust the variable resistance to generally match the impedance of the DUT. The impedance sourcing circuit may also include a voltage detector configured to detect a voltage across the DUT and a voltage reference. The loop gain controller may be configured to drive the control input of the electrically controlled variable resistance based on the voltage detected across the DUT and the voltage reference.
Abstract translation: 公开了一种用于测量被测设备（DUT）和方法的测量装置的阻抗源电路。 阻抗源电路包括电压/电流源。 具有控制输入的电控可变电阻被配置为调节可变电阻耦合到DUT。 环路增益控制器耦合到电控可变电阻的控制输入端。 环路增益控制器被配置为驱动电控可变电阻的控制输入以调整可变电阻以大致匹配DUT的阻抗。 阻抗源电路还可以包括被配置为检测DUT两端的电压和电压基准的电压检测器。 环路增益控制器可以被配置为基于在DUT和电压基准上检测的电压来驱动电控可变电阻的控制输入。
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公开(公告)号：US09645193B2
公开(公告)日：2017-05-09
申请号：US13658055
申请日：2012-10-23
Applicant: KEITHLEY INSTRUMENTS, INC.
Inventor： James A. Niemann
CPC classification number: G01R31/2839 , G01R1/203 , G01R15/12
Abstract: An impedance sourcing circuit for a measurement device configured to measure a device under test (DUT) and method are disclosed. The impedance sourcing circuit includes a voltage/current source. An electrically controlled variable resistance having a control input is configured to adjust the variable resistance is coupled to the DUT. A loop gain controller is coupled to the control input of the electrically controlled variable resistance. The loop gain controller is configured to drive the control input of the electrically controlled variable resistance to adjust the variable resistance to generally match the impedance of the DUT. The impedance sourcing circuit may also include a voltage detector configured to detect a voltage across the DUT and a voltage reference. The loop gain controller may be configured to drive the control input of the electrically controlled variable resistance based on the voltage detected across the DUT and the voltage reference.
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公开(公告)号：US09335364B2
公开(公告)日：2016-05-10
申请号：US13901430
申请日：2013-05-23
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann
IPC: G01R31/26
CPC classification number: G01R31/2601 , G01R31/2607 , G01R31/2612
Abstract: An RF testing method and system by which a DC measurement pathway can also act like a properly terminated RF pathway. Achieving this requires that the output HI, LO, and Sense HI conductors are terminated in a frequency selective manner such that the terminations do not affect the SMU DC measurements. Once all SMU input/output impedances are controlled, as well as properly terminated to eliminate reflections, the high-speed devices will no longer oscillate during device testing, so long as the instruments maintain a high isolation from instrument-to-instrument (separate instruments are used on the gate and drain, or on the input and output of the device). The output of HI, LO and Sense HI conductors are coupled to various nodes of the DUT via three triaxial cables, the outer shieldings of which are coupled to each other and to an SMU ground.
Abstract translation: RF测试方法和系统，通过该测试方法和系统，DC测量路径也可以像正确终止的RF路径那样起作用。 实现这一点要求输出HI，LO和Sense HI导体以频率选择性方式终止，使得终端不影响SMU DC测量。 一旦所有的SMU输入/输出阻抗被控制，并且正确终止以消除反射，高速器件将不再在器件测试期间振荡，只要仪器保持与仪器到仪器的高度隔离（分离的仪器 用于栅极和漏极，或器件的输入和输出）。 HI，LO和感测HI导体的输出通过三根三轴电缆耦合到DUT的各个节点，其外屏蔽彼此耦合并连接到SMU接地。
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公开(公告)号：US20140376201A1
公开(公告)日：2014-12-25
申请号：US13921550
申请日：2013-06-19
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann , Gregory Sobolewski , Martin J. Rice , Wayne Goeke
CPC classification number: H05K1/0213 , H05K1/0225 , H05K1/0256 , H05K1/142 , H05K1/145 , H05K3/306 , H05K3/4038 , H05K3/4697 , H05K2201/0792 , H05K2201/09063 , H05K2201/093 , H05K2201/09618 , H05K2201/0969 , H05K2201/09981 , Y10T29/49139
Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.
Abstract translation: 具有低介电吸收率的器件包括印刷电路板（PCB），包括层叠在部件连接区域的顶表面上的第一导体的部件连接区域和层叠在部件连接区域的底表面上的第二导体， 围绕部件连接区域，将部件连接区域连接到穿过孔的PCB的低泄漏部件以及由至少基本上围绕PCB顶表面上的孔的第三导体组成的防护件和至少 基本上围绕PCB的底表面上的孔。
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公开(公告)号：US20140218064A1
公开(公告)日：2014-08-07
申请号：US13901430
申请日：2013-05-23
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann
IPC: G01R31/26
CPC classification number: G01R31/2601 , G01R31/2607 , G01R31/2612
Abstract: An RF testing method and system by which a DC measurement pathway can also act like a properly terminated RF pathway. Achieving this requires that the output HI, LO, and Sense HI conductors are terminated in a frequency selective manner such that the terminations do not affect the SMU DC measurements. Once all SMU input/output impedances are controlled, as well as properly terminated to eliminate reflections, the high-speed devices will no longer oscillate during device testing, so long as the instruments maintain a high isolation from instrument-to-instrument (separate instruments are used on the gate and drain, or on the input and output of the device). The output of HI, LO and Sense HI conductors are coupled to various nodes of the DUT via three triaxial cables, the outer shieldings of which are coupled to each other and to an SMU ground.
Abstract translation: RF测试方法和系统，通过该测试方法和系统，DC测量路径也可以像正确终止的RF路径那样起作用。 实现这一点要求输出HI，LO和Sense HI导体以频率选择性方式终止，使得终端不影响SMU DC测量。 一旦所有的SMU输入/输出阻抗被控制，并且正确终止以消除反射，高速器件将不再在器件测试期间振荡，只要仪器保持与仪器到仪器的高度隔离（分离的仪器 用于栅极和漏极，或器件的输入和输出）。 HI，LO和感测HI导体的输出通过三根三轴电缆耦合到DUT的各个节点，其外屏蔽彼此耦合并连接到SMU接地。
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