-
公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译： 一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。 非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。 对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。 然后将测试插座定位在子板上。
-
公开(公告)号：US6084421A
公开(公告)日：2000-07-04
申请号：US44874
申请日：1998-03-20
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/02 , H01L21/66 , H01L21/822 , H01L23/32 , H01L27/04 , H01R12/16 , H01R33/76
CPC分类号： G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger. Electrically conductive cylindrical eyelets or plated through holes are positioned within the holes in the load board to guide the travel of the socket plungers and to transfer the test signals from the socket plungers to the load board.
摘要翻译： 一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。 一个球定位在弹簧与柱塞的斜边之间，有助于偏压柱塞。 导电圆柱形孔眼或电镀通孔位于负载板的孔内，以引导插座柱塞的行进，并将测试信号从插座柱塞传输到负载板。
-
公开(公告)号：US06271672B1
公开(公告)日：2001-08-07
申请号：US09140220
申请日：1998-08-26
IPC分类号： G01R3106
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.
摘要翻译： 一种弹簧探针，用于在具有定位在镜筒内的柱塞的电气装置上进行测试，并且包括位于所述镜筒内的与所述柱塞相邻的弹簧以对所述柱塞施加弹簧力。 柱塞包括具有成角度的表面的接触端，用于接触电气装置以将侧向负载施加到筒体;以及接触端中的槽，用于在与电气装置接触时分开弹簧力。
-
公开(公告)号：USD400811S
公开(公告)日：1998-11-10
申请号：US79957
申请日：1997-11-21
-
公开(公告)号：US5781023A
公开(公告)日：1998-07-14
申请号：US792658
申请日：1997-01-31
CPC分类号： G01R1/06722
摘要： A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.
摘要翻译： 一种用于在包括用于接收中空柱塞的探针插座的电气装置上进行测试的中空柱塞弹簧探针组件。 柱塞包括在柱塞的一端处的用于接触电气装置的尖端和位于柱塞内的开口之间的弹簧，该弹簧位于尖端和插座柱之间，其具有通过第二端延伸到柱塞中的头部。 该柱刚性地附接到容器。 柱塞包括用于将柱塞可释放地附接到柱的头部的附接机构。
-
公开(公告)号：US08105119B2
公开(公告)日：2012-01-31
申请号：US12683346
申请日：2010-01-06
IPC分类号： H01R11/22
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.
摘要翻译： 使用扁平柱塞的弹簧探针和具有位于筒内的压缩弹簧的圆筒和用于柱塞与筒体内部之间内部接触的擦拭器。
-
公开(公告)号：US20100197176A1
公开(公告)日：2010-08-05
申请号：US12683346
申请日：2010-01-06
IPC分类号： H01R4/48
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.
摘要翻译： 使用扁平柱塞的弹簧探针和具有位于筒内的压缩弹簧的圆筒和用于柱塞与筒体内部之间内部接触的擦拭器。
-
8.发明申请公开(公告)号：US20100267291A1
公开(公告)日：2010-10-21
申请号：US12707596
申请日：2010-02-17
CPC分类号： H01R13/2421 , H01R2201/20 , Y10T29/49204
摘要： A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a swagable surface and a second plunger having a tail portion with a flat contact surface and a swagable surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the swagable surfaces are swaged by the coils of the spring during the initial compression of the spring.
摘要翻译： 一种具有第一柱塞的弹簧接触组件，该第一柱塞的尾部具有平坦的接触表面和可变形表面;以及第二柱塞，其具有带有平坦接触表面和可摆动表面的尾部，其中平坦的接触表面重叠并被 外部压缩弹簧，使得在弹簧的初始压缩期间，可变形表面由弹簧的线圈挤压。
-
公开(公告)号：US5801544A
公开(公告)日：1998-09-01
申请号：US783467
申请日：1997-01-16
申请人： Mark A. Swart , Gordon A. Vinther
发明人： Mark A. Swart , Gordon A. Vinther
CPC分类号： G01R1/06722
摘要： A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.
摘要翻译： 用于对电气设备进行测试的弹簧式接触探头。 探针包括细长的柱塞，其具有保持在筒内的凸形表面的端部。 用于施加轴向载荷的弹簧定位在筒内，并且将尺寸设定为将一部分轴向力转化为侧面加载力的球定位在弹簧和柱塞的凸形表面之间。 该弹簧具有紧紧缠绕的线圈，用于将球保持在枪管上。
-
公开(公告)号：US08324919B2
公开(公告)日：2012-12-04
申请号：US12629790
申请日：2009-12-02
IPC分类号： G01R31/00
CPC分类号： G01R1/06722 , G01R1/06733 , G01R3/00 , H01R12/714 , H01R13/2421 , H01R13/2428 , H01R2201/20
摘要： The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
摘要翻译： 接触组件具有接触构件，其接触尖端位于测试插座或探针板中的孔内，其中接触尖端或探针板或测试插座中的孔具有凸轮表面，以提供接触尖端跨越表面的横向运动 在接触构件的压缩期间测试位置以在测试位置的表面上诱导洗涤。
-
-
-
-
-
-
-
-
-
搜索结果
61 条记录 (耗时 0.025 秒)