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    Current-based temperature measurement devices and methods
    1.
    发明授权
    Current-based temperature measurement devices and methods 有权

    公开(公告)号：US11187593B2

    公开(公告)日：2021-11-30

    申请号：US16176118

    申请日：2018-10-31

    Applicant: Microchip Technology Incorporated

    Inventor： James E. Bartling

    IPC: G01K7/00 ,  G01K7/34 ,  G01K1/02 ,  G05F3/10

    Abstract: A Proportional-To-Absolute-Temperature (PTAT) current source is used for high-resolution temperature measurement. The PTAT current source is coupled to a capacitor for a fixed amount of time so as to charge the capacitor to a voltage which is proportional to the current applied to the capacitor, and thus proportional to the temperature. The voltage on the capacitor is measured, and a temperature is calculated or determined from the measured voltage.

    ANALOG-TO-DIGITAL CONVERSION WITH MICRO-CODED SEQUENCER
    4.
    发明申请
    ANALOG-TO-DIGITAL CONVERSION WITH MICRO-CODED SEQUENCER 有权
    微型编码器的模拟数字转换

    公开(公告)号：US20160112060A1

    公开(公告)日：2016-04-21

    申请号：US14883842

    申请日：2015-10-15

    Applicant: Microchip Technology Incorporated

    Inventor： James E. Bartling ,  Igor Wojewoda ,  Kevin Kilzer

    IPC: H03M1/12 ,  G06F1/32

    CPC classification number: H03M1/12 ,  G06F1/32 ,  H03K17/9622 ,  H03K2217/960725 ,  H03M1/00 ,  H03M1/1225 ,  H03M1/1245 ,  H03M1/50

    Abstract: A micro-coded sequencer controls complex conversion sequences independent of a central processing unit (CPU). Micro-coding provides for easily adding new process steps and/or updating existing process steps. Such a programmable sequencer in combination with an analog-to-digital conversion module such as an analog-to-digital converter (ADC) or a charge time measurement unit (CTMU), and digital processing circuits may be configured to work independently of the CPU in combination with the micro-coded sequencer. Thereby providing self-sufficient operation in low power modes when the CPU and other high power modules are in a low power sleep mode. Such a peripheral can execute data collection and processing thereof, then wake the CPU only when needed, thereby saving power. Furthermore, this peripheral does not require CPU processing so that time critical applications that do require control by the CPU can operate more efficiently and with less operating overhead burden.

    Abstract translation: 微编码序列器控制独立于中央处理单元（CPU）的复杂转换序列。 微编码提供了轻松添加新的流程步骤和/或更新现有的流程步骤。 与诸如模数转换器（ADC）或充电时间测量单元（CTMU）之类的模数转换模块和数字处理电路组合的这种可编程序排序器可被配置为独立于CPU 与微编码序列器结合使用。 因此，当CPU和其他高功率模块处于低功耗睡眠模式时，能够以低功耗模式提供自给自足的操作。 这样的外设可以执行数据收集和处理，然后在需要时唤醒CPU，从而节省电力。 此外，该外设不需要CPU处理，因此要求CPU进行控制的时间关键应用程序可以更有效地运行，同时减少运营负担。

    SELECTABLE PROGRAMMABLE GAIN OR OPERATIONAL AMPLIFIER
    5.
    发明申请
    SELECTABLE PROGRAMMABLE GAIN OR OPERATIONAL AMPLIFIER 有权
    可选可编程增益或运算放大器

    公开(公告)号：US20160094193A1

    公开(公告)日：2016-03-31

    申请号：US14863779

    申请日：2015-09-24

    Applicant: Microchip Technology Incorporated

    Inventor： Bryan Kris ,  James E. Bartling

    IPC: H03G1/00 ,  H03F3/45 ,  H03G3/00

    CPC classification number: H03G1/0088 ,  H03F3/45475 ,  H03F2200/321 ,  H03F2203/45048 ,  H03F2203/45528 ,  H03F2203/45534 ,  H03F2203/45616 ,  H03F2203/45728 ,  H03G3/001

    Abstract: An integrated circuit amplifier configurable to be either a programmable gain amplifier or an operational amplifier comprises two output blocks, one output block is optimized for programmable gain amplifier operation, and the other output block is optimized for operational amplifier applications. A common single input stage, input offset calibration and bias generation circuits are used with either amplifier configuration. Thus duplication of the input stage, offset calibration and bias generation circuits are eliminated while still selectably providing for either a programmable gain amplifier or operational amplifier configuration.

    Abstract translation: 可配置为可编程增益放大器或运算放大器的集成电路放大器包括两个输出块，一个输出块针对可编程增益放大器操作进行了优化，另一个输出块针对运算放大器应用进行了优化。 使用常见的单输入级，输入偏移校准和偏置生成电路与放大器配置。 因此，消除了输入级，偏移校准和偏置产生电路的复制，同时仍然可选地提供可编程增益放大器或运算放大器配置。

    Fast Frequency Calculator
    6.
    发明申请
    Fast Frequency Calculator 审中-公开

    公开(公告)号：US20190146017A1

    公开(公告)日：2019-05-16

    申请号：US16185037

    申请日：2018-11-09

    Applicant: Microchip Technology Incorporated

    Inventor： Ajay Kumar ,  James E. Bartling

    IPC: G01R23/02 ,  H02J7/00

    Abstract: An apparatus includes a capacitor, a reference voltage, an input signal to be measured, and a frequency calculation circuit. The frequency calculation circuit is configured to select a capacitance value for the capacitor, charge the capacitor with the reference voltage, discharge the capacitor to a threshold voltage, and, based on a comparison of time to discharge the capacitor to the threshold voltage with a clock cycle of the input signal, determine a frequency of the input signal.

    CURRENT-BASED TEMPERATURE MEASUREMENT DEVICES AND METHODS
    7.
    发明申请
    CURRENT-BASED TEMPERATURE MEASUREMENT DEVICES AND METHODS 审中-公开

    公开(公告)号：US20190128748A1

    公开(公告)日：2019-05-02

    申请号：US16176118

    申请日：2018-10-31

    Applicant: Microchip Technology Incorporated

    Inventor： James E. Bartling

    IPC: G01K7/34 ,  G01K1/02

    Abstract: A Proportional-To-Absolute-Temperature (PTAT) current source is used for high-resolution temperature measurement. The PTAT current source is coupled to a capacitor for a fixed amount of time so as to charge the capacitor to a voltage which is proportional to the current applied to the capacitor, and thus proportional to the temperature. The voltage on the capacitor is measured, and a temperature is calculated or determined from the measured voltage.

    High resolution temperature measurement
    9.
    发明授权
    High resolution temperature measurement 有权
    高分辨率温度测量

    公开(公告)号：US08985849B2

    公开(公告)日：2015-03-24

    申请号：US13658026

    申请日：2012-10-23

    Applicant: Microchip Technology Incorporated

    Inventor： Darren Edward Noel Wenn ,  James E. Bartling

    IPC: G01K7/16 ,  G01K3/10 ,  G01K7/34 ,  G01K7/22

    CPC classification number: G01K7/22 ,  G01K7/16 ,  G01K7/34

    Abstract: Temperature is determined by measuring the time it takes to charge a capacitor with a resistive temperature sensor. A clock, time counter, a voltage comparator and voltage reference are used in determining a coarse time measurement. The time measurement resolution is enhanced with the addition of a constant current source charging another timing capacitor within a single clock pulse time to provide a fine time measurement.

    Abstract translation: 通过测量用电阻式温度传感器对电容器充电所花费的时间来确定温度。 时钟，时间计数器，电压比较器和参考电压用于确定粗略的时间测量。 增加时间测量分辨率，通过添加恒定电流源，在单个时钟脉冲时间内对另一个定时电容器充电，以提供精细的时间测量。

    ADC SELF-TEST USING TIME BASE AND CURRENT SOURCE
    10.
    发明申请
    ADC SELF-TEST USING TIME BASE AND CURRENT SOURCE 审中-公开

    公开(公告)号：US20190131993A1

    公开(公告)日：2019-05-02

    申请号：US16176170

    申请日：2018-10-31

    Applicant: Microchip Technology Incorporated

    Inventor： James E. Bartling ,  Stephen Bowling

    IPC: H03M1/10

    Abstract: A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time to produce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.

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