摘要:
Both the input/output connections (16) of a circuit board (10) and the boundary scan devices (12.sub.1 -12.sub.n) thereon can be tested simultaneously by boundary scan techniques using a Serial Test Extension Module (STEM) (28) which mates with the circuit board. The STEM (28) contains at least one boundary scan register (36) which makes an electrical connection with a separate circuit board input/output connection (16) when the STEM mates with the board. The boundary scan registers (36) within the STEM (28) are serially connected in a chain, that is, connected in series with a chain of serially connected boundary scan registers (20) within the boundary scan devices (12.sub.1 -12.sub.n). By launching a known bit stream into the chain of boundary scan registers (20) and (36) and thereafter shifting out the bits and comparing them to a reference bit stream, representing a defect-free condition, faults in the input/output connections (16) and/or in the devices (12.sub.1 -12.sub.n) can be detected.
摘要:
A system (10) for testing one or more circuit boards (12.sub.1 -12.sub.n), each containing at least one chain of Boundary-Scan cells (14.sub.1 -14.sub.p), includes a system test and diagnosis host (16) for managing overall testing of the system formed by the circuit boards. A Boundary-Scan Virtual Machine (BVM) (17) is operative to receive an initiate test command from the system test and diagnosis host independent of the number and nature of the boards to be tested. In response to the test command, the BVM (17) causes each circuit board to execute a test program (23) specific thereto to determine the errors, if any, in the board. The errors from each board are passed back to the BVM (17) which, in turn, interprets the errors to yield test information, indicative of the operation of the boards, which is then passed back to the system test and diagnosis host (16).
摘要:
A test system (10) is associated with a chain of circuits (12) on a circuit board (13) for testing the interconnections (11) linking the circuits in the chain as well as for testing the interconnections linking them to those on other boards. The test system includes a controller (22) for generating a test signal and for capturing a response signal generated by the associated chain of circuits in response to the test signal. The controller (22) also generates a flow control signal which controls a network (24) that routes the test signals from the controller, or from a first other test system, to the associated chain of circuits (12). In accordance with the flow control signal, the network (24) also serves to route the response signal from the associated chain of circuits (12) to the controller (22) or to a second other test system. By selectively routing the test and response signals, the network (24) in each test system (10) allows individual testing of each associated chain of circuits or, alternatively, permits the chains of circuits on several boards to be effectively interconnected for testing.
摘要:
A scheme is provided for efficient transfer of N separate L-bit segments of data (where N and L are integers) to or from an L-bit register (14) in a device under test (10) serially coupled with at least one other register in a device (10') in a scan chain. To carry out such data transfer, a stream of N L-bit segments of interest is first concatenated to, and ahead of, a packet of L.sub.1 filler bits, where L.sub.1 is the cumulative number of register cells in the chain of devices (10') upstream of the L-bit register (14) in the device under test (10). The stream of L.sub.1 +NL bits is applied to the chain by shifting the first L.sub.1 bits of the block of NL bits through the chain to flush the previous data stored in the registers upstream of the L-bit register in the device under test (10). The remaining bits in the stream of L.sub.1 +NL bits are then shifted through the chain of devices (10 and 10' ) until the L.sub.1 filler bits have been shifted into the data registers of the devices (10') upstream of the device under test. An alternate data transfer scheme is also provided.
摘要:
A method is disclosed for generating a control signal (TMS) which may be used to control the test activity of boundary scan system (10). The method is initiated by loading a multi-bit control macro (STI, DTI or DSTI) into a register (38) whose output is coupled back to its input. After loading of the macro, its identity is ascertained by a macro controller (42) which serves to decode a multi-bit signal (IT) whose state is indicative of the macro type. The macro controller (42) actuates the register to shift out the bits of the control macro in a sequence dependent on the macro's identity in order to generate the appropriate control signal. As each bit is shifted out, it is shifted back into the register so as to allow the same sequence of bits to be repeatedly shifted out.
摘要:
A set of test vectors for input to a circuit (10) to test the integrity of each of its n interconnections (nets) 16 is generated by first ordering the nets. Thereafter, the vectors are generated by assigning the bits of each vector associated with a given net a one or zero such that the vector has a minimum weight, as compared to the vectors assigned to successive nets. Alternatively, the test vectors can be generated by assigning the bits of selected groups of vectors a one or zero such that the groups of vectors each have minimum potential weight and the vectors in the group are independent of each other. The successive groups of vectors are then concatenated to yield the test vector set.
摘要:
A rechargeable battery system can include features to facilitate determination of the charge state of a battery or a battery power unit. A rechargeable battery system can include a battery case that can hold a plurality of batteries. The batteries held by the battery case can include a tab located on a portion of the battery, such as, the terminal. The tab can include indicia of the charge state of the battery, and can be detached when the battery is at least partially discharged. The tab can facilitate determination of the charge state of the battery by allowing identification of batteries with the tab attached and batteries from which the tab has been detached.
摘要:
Control of the self-testing of a plurality of elements (12.sub.1 -12.sub.m), each having a Built-In, Self-Test (BIST) capability, and arranged in one or more groups (14.sub.1 -14.sub.n), is carried out by a network (16) of one or more standard BIST resource interface controllers (SBRICs 18.sub.1 -18.sub.n). Each SBRIC in the network controls the self-testing of the elements in a separate one of the groups in sequence by broadcasting a test command to the elements in parallel which, in response, generate test signatures stored by the SBRIC. The SBRICs in the network are coupled in series in daisy chain fashion to enable the test signatures stored by the SBRICs to be concatenated for easy retrieval by shifting out the test signatures therefrom, using a technique such as boundary scan.
摘要:
A rechargeable battery system can include features to facilitate determination of the charge state of a battery or a battery power unit. A rechargeable battery system can include a battery case that can hold a plurality of batteries. The batteries held by the battery case can include a tab located on a portion of the battery, such as, the terminal. The tab can include indicia of the charge state of the battery, and can be detached when the battery is at least partially discharged. The tab can facilitate determination of the charge state of the battery by allowing identification of batteries with the tab attached and batteries from which the tab has been detached.