AUTONOMOUSLY MANAGING CORE CLUSTER FREQUENCIES USING PERFORMANCE STATISTICS IN PROCESSOR DEVICES

    公开(公告)号:US20250093931A1

    公开(公告)日:2025-03-20

    申请号:US18468242

    申请日:2023-09-15

    Abstract: Autonomously managing core cluster frequencies using performance statistics in processor devices is disclosed herein. In some aspects, a cluster power management circuit of a processor device collects Activity Management Unit (AMU) statistics for multiple processor cores for each of one or more frequency operating points over a time interval. Based on the AMU statistics, the cluster power management circuit generates a performance model representing processor performance as a function of frequency, and uses the performance model and a power consumption measurement to generate an energy-per-instruction (EI) model representing energy per instruction as a function of frequency. The cluster power management circuit then generates an advantage model based on a first rate of change of the performance model as a function of frequency and a second rate of change of the EI model as a function of frequency, and identifies a target frequency operating point based on the advantage model.

    PERFORMING DYNAMIC MICROARCHITECTURAL THROTTLING OF PROCESSOR CORES BASED ON QUALITY-OF-SERVICE (QoS) LEVELS IN PROCESSOR DEVICES

    公开(公告)号:US20250094182A1

    公开(公告)日:2025-03-20

    申请号:US18469630

    申请日:2023-09-19

    Abstract: Performing dynamic microarchitectural throttling of processor cores based on Quality-of-Service (QOS) levels in processor devices is disclosed herein. In some aspects, a processor device comprises a synchronous core cluster including a plurality of processor cores, a throttling selection circuit, and a throttling circuit. The throttling selection circuit receives a QoS level associated with a workload scheduled for execution by a processor core. The throttling selection circuit determines a performance state of the processor core, and determines a throttling level for the processor core, based on the QoS level and the performance state. The throttling selection circuit provides the throttling level to the throttling circuit, which performs microarchitectural throttling of the processor core based on the throttling level.

    PROCESSORS INCLUDING POWER CONTROL CIRCUITS TO REDUCE A NO-LOAD VOLTAGE TO SAVE POWER AND INCREASE LONGEVITY AND RELATED METHODS

    公开(公告)号:US20250093942A1

    公开(公告)日:2025-03-20

    申请号:US18469890

    申请日:2023-09-19

    Abstract: Power sources provide power in a range with a maximum supply voltage provided under zero-load current conditions. Power circuits in an IC receive and aggregate indications of load current from processor circuits in processor circuit clusters and, reduce power consumption in the IC during zero or low load current conditions by generating a voltage control signal to reduce the supply voltage. Reducing the no-load voltage also reduces stress on gate oxides of transistors in the IC to increase oxide longevity. Based on the aggregated load current indications, which is periodically updated, the no-load supply voltage may be incrementally reduced down to a voltage threshold over the course of multiple periods. In some examples, the power circuits receive throttle signals when the processor circuits are throttled due to a voltage droop, and such signals may cause the power circuits to generate a control signal to increase the no-load voltage.

    System and method for providing an accurate and cost-effective current sensor calibration
    6.
    发明授权
    System and method for providing an accurate and cost-effective current sensor calibration 有权
    用于提供精确和成本效益的电流传感器校准的系统和方法

    公开(公告)号:US09519041B2

    公开(公告)日:2016-12-13

    申请号:US14465767

    申请日:2014-08-21

    CPC classification number: G01R35/005 G01K13/00 G06F1/08 G06F1/26

    Abstract: Systems and methods for calibrating on-die analog current sensors are disclosed. The methods can be routinely applied to perform a calibration such as during a system initialization or boot procedure or during other times when the system is in a sleep or power saving mode of operation. The systems determine a leakage current in the device under present environmental conditions. A baseline load current determined under the present temperature and input voltage is retrieved and used to determine a total leakage current. A reproducible and stable dynamic load is controllably applied to provide a known current to the on-die analog current sensor. A third mechanism permits repeatable adjustments to the known current that span the operational range of the on-die integrated current sensor. The responsiveness of the disclosed mechanisms ensures that temperature induced leakage does not increase significantly during a current sensor calibration.

    Abstract translation: 公开了用于校准模内模拟电流传感器的系统和方法。 可以常规地应用这些方法来执行校准,例如在系统初始化或引导过程期间或在系统处于睡眠或省电操作模式的其他时间期间。 系统确定了目前环境条件下器件中的漏电流。 检索在当前温度和输入电压下确定的基准负载电流,并用于确定总泄漏电流。 可控制地施加可再现和稳定的动态负载以向芯片上模拟电流传感器提供已知电流。 第三种机构允许可重复地调整跨越集成式电流传感器的工作范围的已知电流。 所公开的机构的响应性确保了在当前传感器校准期间温度感应泄漏不会显着增加。

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