Semiconductor memory device controlling refresh cycle, memory system, and method of operating the semiconductor memory device
    2.
    发明授权
    Semiconductor memory device controlling refresh cycle, memory system, and method of operating the semiconductor memory device 有权
    控制刷新周期的半导体存储器件,存储器系统和操作半导体存储器件的方法

    公开(公告)号:US09030905B2

    公开(公告)日:2015-05-12

    申请号:US13896511

    申请日:2013-05-17

    Inventor: In-Chul Jeong

    Abstract: A semiconductor memory device includes a memory cell array, a refresh control circuit, an address counter and an address converter. The memory cell array includes a plurality of memory cells. The refresh control circuit is configured to receive a refresh command and output m refresh control signals during one refresh cycle for refreshing all the memory cells of the semiconductor memory device. The address counter is configured to generate counting signals for refreshing memory cells in response to the m refresh control signals. The address converter is configured to receive the counting signals and output refresh addresses by converting the counting signals in response to a cycle select signal. The address converter is configured to output refresh addresses such that the number of m refresh control signals during one refresh cycle is variable.

    Abstract translation: 半导体存储器件包括存储单元阵列,刷新控制电路,地址计数器和地址转换器。 存储单元阵列包括多个存储单元。 刷新控制电路被配置为在一个刷新周期期间接收刷新命令并输出m个刷新控制信号,以刷新半导体存储器件的所有存储单元。 地址计数器被配置为响应于m个刷新控制信号产生用于刷新存储器单元的计数信号。 地址转换器被配置为通过响应于周期选择信号转换计数信号来接收计数信号并输出​​刷新地址。 地址转换器被配置为输出刷新地址,使得在一个刷新周期期间的m个刷新控制信号的数量是可变的。

    Device and method of controlling refresh operation for dynamic random access memory (DRAM)

    公开(公告)号:US09672894B2

    公开(公告)日:2017-06-06

    申请号:US14197437

    申请日:2014-03-05

    CPC classification number: G11C11/408 G11C7/1063 G11C11/40611

    Abstract: A method of controlling a refresh operation for a memory device is disclosed. The method includes storing a first row address corresponding to a first row of a memory cell array, storing one or more second row addresses corresponding to one or more second rows of the memory cell array, the one or more second row addresses corresponding to the first row address, sequentially generating row addresses as a refresh row address during a first refresh interval, for each generated row address, when a generated row address identical to one of the one or more second row addresses is detected, stopping the generation of row addresses and sequentially outputting the one second row address and the first row address as the refresh row address, restarting the generation of the row addresses as the refresh row address after outputting the one second row address and the first row address.

    Sense amplifier circuit and semiconductor memory device
    5.
    发明授权
    Sense amplifier circuit and semiconductor memory device 有权
    感应放大器电路和半导体存储器件

    公开(公告)号:US09087558B2

    公开(公告)日:2015-07-21

    申请号:US14059619

    申请日:2013-10-22

    Abstract: A semiconductor device may comprise a first bit line, a second bit line, a memory cell connected to the first bit line, a bit line sense amplifier circuit and a control circuit. The bit line sense amplifier circuit may be coupled to the memory cell. The bit line sense amplifier circuit may include a first inverter having an input node coupled to the first bit line and an output node coupled to the second bit line, and a second inverter having an input node coupled to the second bit line and an output node coupled to the first bit line. The control circuit may be configured to activate the first inverter without activating the second inverter during a first time period and to activate the first inverter and the second inverter at the same time during a second time period after the first time period.

    Abstract translation: 半导体器件可以包括第一位线,第二位线,连接到第一位线的存储器单元,位线读出放大器电路和控制电路。 位线读出放大器电路可以耦合到存储单元。 位线读出放大器电路可以包括具有耦合到第一位线的输入节点和耦合到第二位线的输出节点的第一反相器,以及耦合到第二位线的输入节点和输出节点 耦合到第一位线。 控制电路可以被配置为在第一时间段内激活第一逆变器而不启动第二逆变器,并且在第一时间段之后的第二时间段期间同时激活第一逆变器和第二逆变器。

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