Abstract:
A storage device includes a nonvolatile memory and a memory controller. The nonvolatile memory performs read, write, and erase operations. The memory controller operates in an operating mode where the memory controller exchanges a voltage signal, set to a reference voltage level within an allowable range, with the nonvolatile memory or receives the voltage signal from an external device. When operating in the operating mode, the memory controller optimizes an operating frequency of the nonvolatile memory depending on a voltage level of the voltage signal and a temperature.
Abstract:
A storage device includes a memory device configured to store data and a memory controller connected to the memory device through a data strobe line and a plurality of data lines. The storage device adds a predetermined specific pattern in front of data and processes data input following the specific pattern as valid data during a read or write operation. The specific pattern is provided in alignment with a data strobe signal (DQS) latency cycle. The memory controller detects a specific pattern input from the memory device during a read operation and processes data input following the specific pattern as valid data when the detected specific pattern matches an internally stored specific pattern.
Abstract:
A storage device includes a memory device configured to store data and a memory controller connected to the memory device through a data strobe line and a plurality of data lines. The storage device adds a predetermined specific pattern in front of data and processes data input following the specific pattern as valid data during a read or write operation. The specific pattern is provided in alignment with a data strobe signal (DQS) latency cycle. The memory controller detects a specific pattern input from the memory device during a read operation and processes data input following the specific pattern as valid data when the detected specific pattern matches an internally stored specific pattern.