MITIGATING DATA ERRORS IN A STORAGE DEVICE

    公开(公告)号:US20210011631A1

    公开(公告)日:2021-01-14

    申请号:US16505909

    申请日:2019-07-09

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    Mitigating data errors in a storage device

    公开(公告)号:US11500547B2

    公开(公告)日:2022-11-15

    申请号:US17168786

    申请日:2021-02-05

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    MITIGATING DATA ERRORS IN A STORAGE DEVICE

    公开(公告)号:US20210181954A1

    公开(公告)日:2021-06-17

    申请号:US17168786

    申请日:2021-02-05

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    STORAGE AREA RETIREMENT IN A STORAGE DEVICE
    4.
    发明申请

    公开(公告)号:US20200286577A1

    公开(公告)日:2020-09-10

    申请号:US16883081

    申请日:2020-05-26

    Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

    Internal copy-back with read-verify

    公开(公告)号:US10353622B2

    公开(公告)日:2019-07-16

    申请号:US15448103

    申请日:2017-03-02

    Abstract: Systems and methods for internal copy-back with read-verify are described. In one embodiment, a storage device includes a controller to select a first single level cell (SLC) page of a plurality of SLC pages on the storage device to transfer to a triple level cell (TLC) page. The controller, in conjunction with an error correcting code (ECC) decoder, read-verifies the first SLC page. Read-verifying the first SLC page includes reading the first SLC page to an internal page buffer, decoding the first SLC page read into the internal page buffer, determining a number of errors contained in the first SLC page based at least in part on the decoding, and verifying whether the number of errors contained in the first SLC page satisfies an error threshold. The controller transfers the first SLC page to the TLC page according to a result of read-verifying the first SLC page.

    Storage area retirement in a storage device

    公开(公告)号:US11443826B2

    公开(公告)日:2022-09-13

    申请号:US16883081

    申请日:2020-05-26

    Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

    Mitigating data errors in a storage device

    公开(公告)号:US10942655B2

    公开(公告)日:2021-03-09

    申请号:US16505909

    申请日:2019-07-09

    Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

    Storage area retirement in a storage device

    公开(公告)号:US10699797B2

    公开(公告)日:2020-06-30

    申请号:US15964691

    申请日:2018-04-27

    Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

    STORAGE AREA RETIREMENT IN A STORAGE DEVICE
    10.
    发明申请

    公开(公告)号:US20190333599A1

    公开(公告)日:2019-10-31

    申请号:US15964691

    申请日:2018-04-27

    Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

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