Semiconductor memory device and semiconductor device
    3.
    发明授权
    Semiconductor memory device and semiconductor device 有权
    半导体存储器件和半导体器件

    公开(公告)号:US09042156B2

    公开(公告)日:2015-05-26

    申请号:US13647573

    申请日:2012-10-09

    Abstract: A semiconductor memory device includes a writing circuit and a reading circuit. The writing circuit executes a setting action for converting a resistance of a variable resistance element to a low resistance by applying current from one end side to the other end side of a memory cell via the variable resistance element, and a resetting action for converting the resistance to a high resistance by applying current from the other end side to the one end side via the variable resistance element. The reading circuit executes a first reading action for reading a resistance state of the variable resistance element by applying current from one end side to the other end side of the memory cell via the variable resistance element, and a second reading action for reading the resistance state by applying current from the other end side to the one end side via the variable resistance element.

    Abstract translation: 半导体存储器件包括写入电路和读取电路。 写入电路通过经由可变电阻元件施加从存储单元的一端到另一端侧的电流来执行用于将可变电阻元件的电阻转换为低电阻的设定动作,以及用于转换电阻的复位动作 通过经由可变电阻元件从另一端侧向一端侧施加电流而产生高电阻。 读取电路通过经由可变电阻元件施加电流从存储单元的一端到另一端进行电流来读出可变电阻元件的电阻状态的第一读取动作,以及读取电阻状态的第二读取动作 通过经由可变电阻元件从另一端侧向一端侧施加电流。

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