公开(公告)号：US20110158933A1

公开(公告)日：2011-06-30

申请号：US12908185

申请日：2010-10-20

申请人： Shau-Feng Chang ,  Chun-Hsien Ma ,  Kuo-Yi Yang ,  Chien-Tung Lin ,  Shyh-Horng Lin ,  Kai-Wen Huang

发明人： Shau-Feng Chang ,  Chun-Hsien Ma ,  Kuo-Yi Yang ,  Chien-Tung Lin ,  Shyh-Horng Lin ,  Kai-Wen Huang

IPC分类号： A61K31/765 ,  A61K31/70 ,  A61K31/352 ,  A61P1/16

CPC分类号： A61K31/353 ,  A61K31/352 ,  A61K31/70 ,  A61K31/765

摘要： A pharmaceutical preparation containing polymeric compounds as shown in the specification. This preparation can be used to improve liver function and treat liver disease, and promoting liver tissue regeneration.

摘要翻译： 含有本说明书所示聚合物的药物制剂。 该制剂可用于改善肝功能，治疗肝脏疾病，促进肝组织再生。

公开(公告)号：US20090235132A1

公开(公告)日：2009-09-17

申请号：US12468909

申请日：2009-05-20

申请人： Laung-Terng Wang ,  Hsin-Po Wang ,  Xiaoqing Wen ,  Meng-Chyi Lin ,  Shyh-Horng Lin ,  Ta-Chia Yeh ,  Sen-Wei Tsai ,  Khader S. Abdel-Hafez

发明人： Laung-Terng Wang ,  Hsin-Po Wang ,  Xiaoqing Wen ,  Meng-Chyi Lin ,  Shyh-Horng Lin ,  Ta-Chia Yeh ,  Sen-Wei Tsai ,  Khader S. Abdel-Hafez

IPC分类号： G01R31/3177 ,  G06F11/25

CPC分类号： G01R31/318547 ,  G01R31/318591

摘要： A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.

摘要翻译： 用于在基于扫描的集成电路中的ATE（自动测试设备）中降低测试数据量和测试应用时间的广播，系统和方法。 基于扫描的集成电路包含多个扫描链，每个扫描链包括串联耦合的多个扫描单元。 广播公司是组合逻辑网络，耦合到可选的虚拟扫描控制器和可选的扫描连接器。 虚拟扫描控制器控制广播机构的操作。 系统发送存储在ATE中的虚拟扫描模式，并通过广播机构生成广播扫描模式，以测试基于扫描的集成电路中的制造故障。 ATE可以支持的扫描链数显着增加。 进一步提出了方法来重新排列所选扫描链中的扫描单元，以产生广播扫描图案和虚拟扫描图案，并且在基于扫描的集成电路中合成广播器和压缩器。

公开(公告)号：US20060059395A1

公开(公告)日：2006-03-16

申请号：US11211092

申请日：2005-08-25

申请人： Chauchin Su ,  Shyh-Horng Lin ,  Laung-Terng Wang

发明人： Chauchin Su ,  Shyh-Horng Lin ,  Laung-Terng Wang

IPC分类号： G01R31/28

CPC分类号： G01R31/2884 ,  G01R31/3167

摘要： An analog built-in self-test (BIST) methodology based on the IEEE 1149.4 mixed signal test bus standard. The on-chip generated triangular stimuli are transmitted to the analog circuit under test (CUT) through the analog test buses, and their test responses are quantized by the dual comparators. The quantized results are then fed into a pair of counters to record the sampled counts for comparison in the decision circuit. A pass/fail indication is then generated in the decision circuit to indicate success or failure of the CUT after the BIST operation is complete.

摘要翻译： 基于IEEE 1149.4混合信号测试总线标准的模拟内置自检（BIST）方法。 片上产生的三角刺激通过模拟测试总线传输到被测模拟电路（CUT），它们的测试响应由双比较器进行量化。 然后将量化的结果馈送到一对计数器中以记录在判定电路中进行比较的采样计数。 然后在判定电路中产生通过/失败指示，以指示BIST操作完成后CUT的成功或失败。

公开(公告)号：US20080276141A1

公开(公告)日：2008-11-06

申请号：US12216639

申请日：2008-07-09

申请人： Laung-Terng(L.-T.) Wang ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Khader S. Abdel-Hafez

发明人： Laung-Terng(L.-T.) Wang ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Khader S. Abdel-Hafez

IPC分类号： G01R31/3177 ,  G06F11/25

CPC分类号： G01R31/3177 ,  G01R31/318533 ,  G01R31/31926

摘要： A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor.

摘要翻译： 用于在基于扫描的集成电路中的ATE（自动测试设备）中降低测试数据量和测试应用时间的广播，系统和方法。 基于扫描的集成电路包含多个扫描链，每个扫描链包括串联耦合的多个扫描单元。 广播公司是组合逻辑网络，耦合到可选的虚拟扫描控制器和可选的扫描连接器。 虚拟扫描控制器控制广播机构的操作。 系统发送存储在ATE中的虚拟扫描模式，并通过广播机构生成广播扫描模式，以测试基于扫描的集成电路中的制造故障。 ATE可以支持的扫描链数显着增加。 进一步提出方法来重新排列所选扫描链中的扫描单元，以产生广播扫描图案和虚拟扫描图案，并且合成广播器和压缩器。

公开(公告)号：US20050055617A1

公开(公告)日：2005-03-10

申请号：US10901298

申请日：2004-07-29

申请人： Laung-Terng Wang ,  Khader Abdel-Hafez ,  Xiaoqing Wen ,  Boryau Sheu ,  Fei-Sheng Hsu ,  Augusli Kifli ,  Shyh-Horng Lin ,  Shianling Wu ,  Shun-Miin Wang ,  Ming-Tung Chang

发明人： Laung-Terng Wang ,  Khader Abdel-Hafez ,  Xiaoqing Wen ,  Boryau Sheu ,  Fei-Sheng Hsu ,  Augusli Kifli ,  Shyh-Horng Lin ,  Shianling Wu ,  Shun-Miin Wang ,  Ming-Tung Chang

IPC分类号： G01R31/28 ,  G06F20060101 ,  H04J3/00

CPC分类号： G01R31/318594 ,  G01R31/318335 ,  G01R31/318547 ,  G01R31/318572 ,  G01R31/31905

摘要： A method and apparatus for time-division demultiplexing and decompressing a compressed input stimulus 421, provided at a selected data-rate R1 421, into a decompressed stimulus 424, 426, 433, 435, driven at a selected data-rate R2 442, for driving selected scan chains in a scan-based integrated circuit 401. The scan-based integrated circuit 401 contains a high-speed clock CK1 443, a low-speed clock CK2 442, and a plurality of scan chains 411, . . . , 418, each scan chain comprising multiple scan cells coupled in series. The method and apparatus comprises using a plurality of time-division demultiplexors (TDDMs) 402, 403 and time-division multiplexors (TDMs) 408, 409 for shifting stimuli 421 and test responses 444 in and out of high-speed I/O pads. When applied to the scan-based integrated circuit 401 embedded with one or more pairs of decompressors 404, 405 and compressors 406, 407, it can further reduce the circuit's test time, test cost, and scan pin count. A synthesis method is also proposed for synthesizing the time-division demultiplexors (TDDMs) 402, 403, decompressors 404, 405, compressors 406, 407, and time-division multiplexors (TDMs) 408, 409.

摘要翻译： 时分解复用和解压缩以选定数据速率R1 421提供的压缩输入激励421的方法和装置，以选定的数据速率R2 442驱动的解压缩的刺激424,426,433,435中，用于 在基于扫描的集成电路401中驱动所选择的扫描链。基于扫描的集成电路401包含高速时钟CK1 443，低速时钟CK2 442和多个扫描链411。 。 。 418，每个扫描链包括串联耦合的多个扫描单元。 该方法和装置包括使用多个时分解复用器（TDDM）402,403和用于将刺激421和测试响应444移入和移出高速I / O焊盘的时分复用器（TDM）408,409。 当应用于嵌入有一对或多对解压缩器404,405和压缩器406,407的基于扫描的集成电路401时，它可以进一步减少电路的测试时间，测试成本和扫描引脚数。 还提出了一种用于合成时分解复用器（TDDM）402,403，解压缩器404,405，压缩器406,407以及时分多路复用器（TDM）408,409的合成方法。

公开(公告)号：US07412672B1

公开(公告)日：2008-08-12

申请号：US11104651

申请日：2005-04-13

申请人： Laung-Terng Wang ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Khader S. Abdel-Hafez

发明人： Laung-Terng Wang ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Khader S. Abdel-Hafez

IPC分类号： G06F17/50

CPC分类号： G01R31/3177 ,  G01R31/318533 ,  G01R31/31926

摘要： A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor.

公开(公告)号：US06957403B2

公开(公告)日：2005-10-18

申请号：US10108238

申请日：2002-03-28

申请人： Laung-Terng Wang ,  Augusli Kifli ,  Fei-Sheng Hsu ,  Shih-Chia Kao ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Hsin-P Wang

发明人： Laung-Terng Wang ,  Augusli Kifli ,  Fei-Sheng Hsu ,  Shih-Chia Kao ,  Xiaoqing Wen ,  Shyh-Horng Lin ,  Hsin-P Wang

IPC分类号： G01R31/317 ,  G01R31/3183 ,  G01R31/3185 ,  G06F17/50 ,  G06F19/00

CPC分类号： G06F17/505 ,  G01R31/31704 ,  G01R31/318314 ,  G01R31/318364 ,  G01R31/318583 ,  G01R31/318594 ,  G06F17/5022 ,  G06F17/5027 ,  G06F17/5045 ,  G06F2217/14

摘要： A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).

摘要翻译： 一种在寄存器传输级（RTL）下自动扫描合成的方法和系统。 该方法和系统将产生在RTL建模的扫描HDL代码，用于在RTL建模的集成电路。 该方法和系统包括执行RTL可测试性分析，时钟域最小化，扫描选择，测试点选择，扫描修复和测试点插入，扫描替换和扫描拼接，扫描提取，交互式扫描调试，交互式扫描修复的计算机实现步骤 和冲洗/随机测试台生成。 此外，本发明还包括通过逐个模块执行扫描合成然后将这些扫描的模块拼接在一起的层次扫描合成的方法和系统。 本发明还包括将扫描HDL码与其他测试（DFT）HDL码进行集成和验证，包括边界扫描和逻辑BIST（内置自检）。

公开(公告)号：US07721173B2

公开(公告)日：2010-05-18

申请号：US12468909

申请日：2009-05-20

申请人： Laung-Terng Wang ,  Hsin-Po Wang ,  Xiaoqing Wen ,  Meng-Chyi Lin ,  Shyh-Horng Lin ,  Ta-Chia Yeh ,  Sen-Wei Tsai ,  Khader S. Abdel-Hafez

发明人： Laung-Terng Wang ,  Hsin-Po Wang ,  Xiaoqing Wen ,  Meng-Chyi Lin ,  Shyh-Horng Lin ,  Ta-Chia Yeh ,  Sen-Wei Tsai ,  Khader S. Abdel-Hafez

IPC分类号： G01R31/28

CPC分类号： G01R31/318547 ,  G01R31/318591

摘要： A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.

摘要翻译： 用于在基于扫描的集成电路中的ATE（自动测试设备）中降低测试数据量和测试应用时间的广播，系统和方法。 基于扫描的集成电路包含多个扫描链，每个扫描链包括串联耦合的多个扫描单元。 广播公司是组合逻辑网络，耦合到可选的虚拟扫描控制器和可选的扫描连接器。 虚拟扫描控制器控制广播机构的操作。 系统发送存储在ATE中的虚拟扫描模式，并通过广播机构生成广播扫描模式，以测试基于扫描的集成电路中的制造故障。 ATE可以支持的扫描链数显着增加。 进一步提出了方法来重新排列所选择的扫描链中的扫描单元，以产生广播扫描图案和虚拟扫描图案，并且在基于扫描的集成电路中合成广播器和压缩器。

公开(公告)号：US07444567B2

公开(公告)日：2008-10-28

申请号：US10406592

申请日：2003-04-04

申请人： Laung-Terng (L.-T.) Wang ,  Xiaoqing Wen ,  Khader S. Abdel-Hafez ,  Shyh-Horng Lin ,  Hsin-Po Wang ,  Ming-Tung Chang ,  Po-Ching Hsu ,  Shih-Chia Kao ,  Meng-Chyi Lin ,  Chi-Chan Hsu

发明人： Laung-Terng (L.-T.) Wang ,  Xiaoqing Wen ,  Khader S. Abdel-Hafez ,  Shyh-Horng Lin ,  Hsin-Po Wang ,  Ming-Tung Chang ,  Po-Ching Hsu ,  Shih-Chia Kao ,  Meng-Chyi Lin ,  Chi-Chan Hsu

IPC分类号： G01R31/28

CPC分类号： G06F11/27 ,  G01R31/318586 ,  G01R31/318594

摘要： A method and apparatus for testing or diagnosing faults in a scan-based integrated circuit using a unified self-test and scan-test technique. The method and apparatus comprises using a unified test controller to ease prototype debug and production test. The unified test controller further comprises using a capture clock generator and a plurality of domain clock generators each embedded in a clock domain to perform self-test or scan-test. The capture clocks generated by the capture clock generator are used to guide at-speed or reduced-speed self-test (or scan-test) within each clock domain. The frequency of these capture clocks can be totally unrelated to those of system clocks controlling the clock domains. This unified approach allows designers to test or diagnose stuck-type and non-stuck-type faults with a low-cost DFT (design-for-test) tester or a low-cost DFT debugger. A computer-aided design (CAD) method is further developed to realize the method and synthesize the apparatus.

摘要翻译： 一种用于使用统一的自检和扫描测试技术来测试或诊断基于扫描的集成电路中的故障的方法和装置。 该方法和装置包括使用统一的测试控制器来简化原型调试和生产测试。 统一的测试控制器还包括使用捕获时钟发生器和每个嵌入在时钟域中的多个域时钟发生器来执行自检或扫描测试。 由捕获时钟发生器产生的捕获时钟用于引导每个时钟域内的速度或速度自检（或扫描测试）。 这些捕获时钟的频率与控制时钟域的系统时钟的频率完全无关。 这种统一的方法允许设计人员使用低成本DFT（设计测试）测试仪或低成本DFT调试器来测试或诊断卡住型和非卡住型故障。 进一步开发了计算机辅助设计（CAD）方法，实现了该方法并综合了该装置。

公开(公告)号：US07331032B2

公开(公告)日：2008-02-12

申请号：US11111908

申请日：2005-04-22

申请人： Laung-Terng (L. -T.) Wang ,  Augusli Kifli ,  Fei-Sheng Hsu ,  Xiaoqing Wen ,  Shih-Chia Kao ,  Shyh-Horng Lin ,  Hsin-Po Wang

发明人： Laung-Terng (L. -T.) Wang ,  Augusli Kifli ,  Fei-Sheng Hsu ,  Xiaoqing Wen ,  Shih-Chia Kao ,  Shyh-Horng Lin ,  Hsin-Po Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/505 ,  G01R31/31704 ,  G01R31/318314 ,  G01R31/318364 ,  G01R31/318583 ,  G01R31/318594 ,  G06F17/5022 ,  G06F17/5027 ,  G06F17/5045 ,  G06F2217/14

摘要： A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).