公开(公告)号：US20150212112A1

公开(公告)日：2015-07-30

申请号：US14476729

申请日：2014-09-03

Applicant: Sitronix Technology Corp.

Inventor： Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R1/067 ,  G01R1/30 ,  G01R31/26 ,  G01R1/073

CPC classification number: G01R31/2601 ,  G01R1/073 ,  G01R1/30 ,  G01R31/27

Abstract: An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; and an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input or output signal of the DUT.

Abstract translation: 能够改进（DUT）测试下的设备的测试带宽的有源探测卡包括印刷电路板; 至少一个探针，固定到印刷电路板的第一表面，用于探测DUT; 电连接到所述至少一个探针的至少一个连接构件; 以及放大电路，形成在所述印刷电路板上并且耦合到所述至少一个连接构件，用于放大所述DUT的输入或输出信号。

公开(公告)号：US09506974B2

公开(公告)日：2016-11-29

申请号：US14476729

申请日：2014-09-03

Applicant: Sitronix Technology Corp.

Inventor： Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R31/20 ,  G01R31/26 ,  G01R1/073 ,  G01R1/30 ,  G01R31/27

CPC classification number: G01R31/2601 ,  G01R1/073 ,  G01R1/30 ,  G01R31/27

Abstract: An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; and an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input or output signal of the DUT.

Abstract translation: 能够改进（DUT）测试下的设备的测试带宽的有源探测卡包括印刷电路板; 至少一个探针，固定到印刷电路板的第一表面，用于探测DUT; 电连接到所述至少一个探针的至少一个连接构件; 以及放大电路，形成在所述印刷电路板上并且耦合到所述至少一个连接构件，用于放大所述DUT的输入或输出信号。

公开(公告)号：US09435863B2

公开(公告)日：2016-09-06

申请号：US14492067

申请日：2014-09-21

Applicant: Sitronix Technology Corp.

Inventor： Chun-Chi Chen ,  Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R31/28 ,  G01R31/319

CPC classification number: G01R31/31908 ,  G01R31/31905

Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备（ATE）的集成电路（IC）测试接口包括至少一个引脚，用于至少接收或发送测试信号到测试仪器的自动测试设备，多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元，用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备，其中IC测试接口被放置在测试器和自动测试设备的探测器之间。

公开(公告)号：US20150212155A1

公开(公告)日：2015-07-30

申请号：US14492067

申请日：2014-09-21

Applicant: Sitronix Technology Corp.

Inventor： Chun-Chi Chen ,  Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R31/317 ,  G01R31/3177

CPC classification number: G01R31/31908 ,  G01R31/31905

Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备（ATE）的集成电路（IC）测试接口包括至少一个引脚，用于至少接收或发送测试信号到测试仪器的自动测试设备，多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元，用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备，其中IC测试接口被放置在测试器和自动测试设备的探测器之间。