公开(公告)号：US10509056B2

公开(公告)日：2019-12-17

申请号：US15257443

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Raffaele Vallauri ,  Giuseppe Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.

公开(公告)号：US20170307657A1

公开(公告)日：2017-10-26

申请号：US15640097

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Giuseppe Crippa

IPC: G01R1/067 ,  H01R13/03 ,  H01R13/24

CPC classification number: G01R1/06761 ,  G01R1/06716 ,  G01R1/06738 ,  G01R3/00 ,  H01R13/03 ,  H01R13/2464

Abstract: It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended along a longitudinal direction between a contact tip and a contact head, that contact probe comprising at least one multilayer structure, in turn including a superposition of at least one inner layer or core and a first inner coating layer, and an outer coating layer that completely covers the multilayer structure and made of a material having a higher hardness than a material realizing the core.

公开(公告)号：US20170299634A1

公开(公告)日：2017-10-19

申请号：US15640130

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Giuseppe Crippa ,  Roberto Crippa

IPC: G01R3/00 ,  G01R1/073 ,  G01R1/067

CPC classification number: G01R3/00 ,  G01R1/06761 ,  G01R1/07307 ,  G01R1/07314

Abstract: A manufacturing method of a semi-finished product that includes a plurality of contact for a testing head of electronic devices comprises the steps of: providing a substrate made of a conductive material; and defining each contact probe by removing material from the substrate, each contact probes being anchored to the substrate by at least one bridge of material. The step of defining the contact probes includes a step of laser cutting, in correspondence with a contour of the contact probes and of that at least one bridge of material.

公开(公告)号：US11131690B2

公开(公告)日：2021-09-28

申请号：US15640097

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Giuseppe Crippa

IPC: G01R1/067 ,  G01R3/00 ,  H01R13/03 ,  H01R13/24

Abstract: It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended along a longitudinal direction between a contact tip and a contact head, that contact probe comprising at least one multilayer structure, in turn including a superposition of at least one inner layer or core and a first inner coating layer, and an outer coating layer that completely covers the multilayer structure and made of a material having a higher hardness than a material realizing the core.

公开(公告)号：US10365299B2

公开(公告)日：2019-07-30

申请号：US15640130

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Giuseppe Crippa ,  Roberto Crippa

IPC: G01R1/067 ,  G01R31/00 ,  G01R3/00 ,  G01R1/073

Abstract: A manufacturing method of a semi-finished product that includes a plurality of contact for a testing head of electronic devices comprises the steps of: providing a substrate made of a conductive material; and defining each contact probe by removing material from the substrate, each contact probes being anchored to the substrate by at least one bridge of material. The step of defining the contact probes includes a step of laser cutting, in correspondence with a contour of the contact probes and of that at least one bridge of material.

公开(公告)号：US10228392B2

公开(公告)日：2019-03-12

申请号：US15352448

申请日：2016-11-15

Applicant: TECHNOPROBE S.P.A.

Inventor： Roberto Crippa ,  Giuseppe Crippa ,  Raffaele Vallauri

IPC: G01R1/067 ,  H01R13/03 ,  H01R13/24 ,  G01R1/073

Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.

公开(公告)号：US20160377656A1

公开(公告)日：2016-12-29

申请号：US15257443

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Rafaele Vallauri ,  Giuseppe Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.

Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件相关联的测试头和中间支撑件，其连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件相连的支撑件，该中间支架由与印刷电路板技术相兼容的材料制成并具有大于10×10-6℃-1的热膨胀系数， 支撑体由热膨胀系数低于6×10 -6℃-1的金属材料制成。