Dynamic biasing circuit
    1.
    发明授权

    公开(公告)号:US10819294B1

    公开(公告)日:2020-10-27

    申请号:US16574231

    申请日:2019-09-18

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

    Analog-to-digital converter
    2.
    发明授权

    公开(公告)号:US11349492B2

    公开(公告)日:2022-05-31

    申请号:US17112095

    申请日:2020-12-04

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10727852B2

    公开(公告)日:2020-07-28

    申请号:US16555265

    申请日:2019-08-29

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US11095300B2

    公开(公告)日:2021-08-17

    申请号:US16904604

    申请日:2020-06-18

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    REDUCED NOISE DYNAMIC COMPARATOR FOR A SUCCESSIVE APPROXIMATION REGISTER ANALOG-TO-DIGITAL CONVERTER

    公开(公告)号:US20200321970A1

    公开(公告)日:2020-10-08

    申请号:US16904604

    申请日:2020-06-18

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Analog-to-digital converter
    7.
    发明授权

    公开(公告)号:US10886933B1

    公开(公告)日:2021-01-05

    申请号:US16656913

    申请日:2019-10-18

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10447290B2

    公开(公告)日:2019-10-15

    申请号:US15837040

    申请日:2017-12-11

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Dynamic biasing circuit
    9.
    发明授权

    公开(公告)号:US11527999B2

    公开(公告)日:2022-12-13

    申请号:US17027093

    申请日:2020-09-21

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

    Analog to digital (A/D) converter with internal diagnostic circuit

    公开(公告)号:US11206035B2

    公开(公告)日:2021-12-21

    申请号:US16702090

    申请日:2019-12-03

    Abstract: An analog to digital (A/D) converter includes a capacitor array having respective first terminals selectively coupled to a reference voltage or ground via a plurality of switches and having respective second terminals coupled to a sample and hold (S/H) output. The A/D converter also includes a voltage comparator having a first input coupled to the S/H output and having a second input coupled to a bias voltage. The voltage comparator is configured to output a comparison voltage responsive to a sampled charge at the S/H output and the bias voltage. The A/D converter also includes a successive approximation register coupled to receive the comparison voltage and configured to output an approximate digital code responsive to the comparison voltage, wherein the approximate digital code is varied by controlling an equivalent capacitance of the capacitor array.

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