公开(公告)号：US20170122980A1

公开(公告)日：2017-05-04

申请号：US15405048

申请日：2017-01-12

Applicant: Technoprobe S.p.A.

Inventor： Roberto Crippa ,  Raffaele Ubaldo Vallauri ,  Emanuele Bertarelli

IPC: G01R1/067 ,  H01R43/16 ,  B23K26/40 ,  H01R43/02 ,  B23K1/19 ,  B23K1/00

CPC classification number: G01R1/06761 ,  B23K1/0016 ,  B23K1/19 ,  B23K26/40 ,  B23K2101/38 ,  B23K2103/18 ,  G01R1/06755 ,  G01R1/07307 ,  G01R1/07357 ,  H01R43/02 ,  H01R43/16

Abstract: A contact probe for a testing head of an apparatus for testing electronic devices is described comprising a body extending between a contact tip and a contact head, that contact probe comprising at least one first section and one second section made of at least two different materials and joined together in correspondence of a soldering line.

公开(公告)号：US10401387B2

公开(公告)日：2019-09-03

申请号：US15640159

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Raffaele Ubaldo Vallauri

IPC: G01R31/00 ,  G01R1/067 ,  G01R1/073 ,  G01R1/04 ,  G01R3/00 ,  B23K26/38 ,  B44C1/22 ,  B23K101/38

Abstract: A manufacturing method of contact probes for a testing head comprises the steps of: providing a substrate made of a conductive material; and defining at least one contact probe by laser cutting the substrate. The method further includes at least one post-processing fine definition step of at least one end portion of the contact probe, that follows the step of defining the contact probe by laser cutting, the end portion being a portion including a contact tip or a contact head of the contact probe. The fine definition step does not involve a laser processing and includes geometrically defining the end portion of the contact probe with at least a substantially micrometric precision.

公开(公告)号：US20170307656A1

公开(公告)日：2017-10-26

申请号：US15640159

申请日：2017-06-30

Applicant: Technoprobe S.p.A.

Inventor： Raffaele Ubaldo Vallauri

IPC: G01R1/067 ,  G01R1/073 ,  B44C1/22 ,  G01R3/00 ,  B23K26/38 ,  B23K101/38

CPC classification number: G01R1/06744 ,  B23K26/38 ,  B23K2101/38 ,  B44C1/22 ,  G01R1/0408 ,  G01R1/0433 ,  G01R1/07307 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07364 ,  G01R1/07371 ,  G01R3/00

Abstract: A manufacturing method of contact probes for a testing head comprises the steps of:—providing a substrate made of a conductive material; and—defining at least one contact probe by laser cutting the substrate. The method further includes at least one post-processing fine definition step of at least one end portion of the contact probe, that follows the step of defining the contact probe by laser cutting, the end portion being a portion including a contact tip or a contact head of the contact probe. The fine definition step does not involve a laser processing and includes geometrically defining the end portion of the contact probe with at least a substantially micrometric precision.

公开(公告)号：US20170122983A1

公开(公告)日：2017-05-04

申请号：US15405062

申请日：2017-01-12

Applicant: Technoprobe S.p.A.

Inventor： Daniele Acconcia ,  Raffaele Ubaldo Vallauri

IPC: G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07357 ,  G01R1/06716

Abstract: A testing head comprising vertical probes includes at least one guide provided with guide holes for housing a plurality of contact probes, each of the contact probes having at least one contact tip able to ensure the mechanical and electrical contact with a corresponding contact pad of a device under test, the guide being housed in a containment element of the testing head. Suitably, each of the contact probes comprises a deformed portion, placed in a bending zone between the guide and the device under test, that deformed portion being adapted to further deform during the normal working of the testing head and being prolonged, at least towards the device under test, by an end portion having a diameter suitable to realize the contact tip, the end portion having a longitudinal extension or height exceeding 500 μm.