公开(公告)号：US20240214068A1

公开(公告)日：2024-06-27

申请号：US18595085

申请日：2024-03-04

Applicant: Tektronix, Inc.

Inventor： Evan Douglas Smith ,  John J. Pickerd ,  Williams Fabricio Flores Yepez ,  Heike Tritschler

IPC: H04B10/079 ,  G06N20/00 ,  H04B10/07 ,  H04B10/077 ,  H04B10/40 ,  H04B10/564 ,  H04B10/572 ,  H04B10/58

CPC classification number: H04B10/0795 ,  H04B10/0771 ,  H04B10/0775 ,  H04B10/0777 ,  G06N20/00 ,  H04B10/07 ,  H04B10/40 ,  H04B10/564 ,  H04B10/572 ,  H04B10/58

Abstract: A method of training a machine learning system to determine operating parameters for optical transceivers includes connecting the transceiver to a test and measurement device, tuning the transceiver with a set of parameters, capturing a waveform from the transceiver, sending the waveform and the set of parameters to a machine learning system, and repeating the tuning, capturing, and sending until a sufficient number of samples are gathered.

公开(公告)号：US20240353491A1

公开(公告)日：2024-10-24

申请号：US18756281

申请日：2024-06-27

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Evan Douglas Smith

IPC: G01R31/319 ,  G01R31/28 ,  G01R31/3183

CPC classification number: G01R31/31908 ,  G01R31/2862 ,  G01R31/318307 ,  G01R31/318371

Abstract: A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

公开(公告)号：US20240235669A1

公开(公告)日：2024-07-11

申请号：US18582609

申请日：2024-02-20

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler ,  Williams Fabricio Flores Yepez

IPC: H04B10/073 ,  H04B10/077 ,  H04B10/572

CPC classification number: H04B10/0731 ,  H04B10/0775 ,  H04B10/572

Abstract: A test and measurement system includes a test and measurement instrument, including a port to receive a signal from a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: adjust a set of operating parameters for the DUT to a first set of reference parameters; acquire, using the test and measurement instrument, a waveform from the DUT; repeatedly execute the code to cause the one or more processors to adjust the set of operating parameters and acquire a waveform, for each of a predetermined number of sets of reference parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted optimal operating parameters; adjust the set of operating parameters for the DUT to the predicted optimal operating parameters; and determine whether the DUT passes a predetermined performance measurement when adjusted to the set of predicted optimal operating parameters.

公开(公告)号：US11923896B2

公开(公告)日：2024-03-05

申请号：US17701411

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： Evan Douglas Smith ,  John J. Pickerd ,  Williams Fabricio Flores Yepez ,  Heike Tritschler

IPC: H04B10/07 ,  H04B10/077 ,  H04B10/079 ,  G06N20/00 ,  H04B10/40 ,  H04B10/564 ,  H04B10/572 ,  H04B10/58

CPC classification number: H04B10/0795 ,  H04B10/0771 ,  H04B10/0775 ,  H04B10/0777 ,  G06N20/00 ,  H04B10/07 ,  H04B10/40 ,  H04B10/564 ,  H04B10/572 ,  H04B10/58

Abstract: A test and measurement device has a connection to allow the test and measurement device to connect to an optical transceiver, one or more processors, configured to execute code that causes the one or more processors to: initially set operating parameters for the optical transceiver to average parameters, acquire a waveform from the optical transceiver, measure the acquired waveform and determine if operation of the transceiver passes or fails, send the waveform and the operating parameters to a machine learning system to obtain estimated parameters if the transceiver fails, adjust the operating parameters based upon the estimated parameters, and repeat the acquiring, measuring, sending, and adjusting as needed until the transceiver passes. A method to tune optical transceivers includes connecting a transceiver to a test and measurement device, setting operating parameters for the transceiver to an average set of parameters, acquiring a waveform from the transceiver, measuring the waveform to determine if the transceiver passes or fails, sending the waveform and operating parameters to a machine learning system when the transceiver fails, using the machine learning system to provide adjusted operating parameters, setting the operating parameters to the adjusted parameters, and repeating the acquiring, measuring, sending, using, and setting until the transceiver passes.

公开(公告)号：US20220311514A1

公开(公告)日：2022-09-29

申请号：US17701411

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： Evan Douglas Smith ,  John J. Pickerd ,  Williams Fabricio Flores Yepez ,  Heike Tritschler

IPC: H04B10/079 ,  H04B10/077

Abstract: A test and measurement device has a connection to allow the test and measurement device to connect to an optical transceiver, one or more processors, configured to execute code that causes the one or more processors to: initially set operating parameters for the optical transceiver to average parameters, acquire a waveform from the optical transceiver, measure the acquired waveform and determine if operation of the transceiver passes or fails, send the waveform and the operating parameters to a machine learning system to obtain estimated parameters if the transceiver fails, adjust the operating parameters based upon the estimated parameters, and repeat the acquiring, measuring, sending, and adjusting as needed until the transceiver passes. A method to tune optical transceivers includes connecting a transceiver to a test and measurement device, setting operating parameters for the transceiver to an average set of parameters, acquiring a waveform from the transceiver, measuring the waveform to determine if the transceiver passes or fails, sending the waveform and operating parameters to a machine learning system when the transceiver fails, using the machine learning system to provide adjusted operating parameters, setting the operating parameters to the adjusted parameters, and repeating the acquiring, measuring, sending, using, and setting until the transceiver passes.

公开(公告)号：US20220311513A1

公开(公告)日：2022-09-29

申请号：US17701186

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler

IPC: H04B10/077 ,  H04B10/40

Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.

公开(公告)号：US11923895B2

公开(公告)日：2024-03-05

申请号：US17701186

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler

IPC: H04B10/077 ,  H04B10/40

CPC classification number: H04B10/0779 ,  H04B10/40

Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.

公开(公告)号：US20240028002A1

公开(公告)日：2024-01-25

申请号：US18353844

申请日：2023-07-17

Applicant: Tektronix, Inc.

Inventor： Wenzheng Sun ,  Evan Douglas Smith ,  John J. Pickerd

IPC: G05B19/418

CPC classification number: G05B19/4183 ,  G05B19/41885

Abstract: A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.

公开(公告)号：US20220390515A1

公开(公告)日：2022-12-08

申请号：US17831181

申请日：2022-06-02

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Mark Anderson Smith ,  Kan Tan ,  Evan Douglas Smith ,  Justin E. Patterson ,  Heike Tritschler

IPC: G01R31/3183 ,  G01R31/317

Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.

公开(公告)号：US20220334180A1

公开(公告)日：2022-10-20

申请号：US17724393

申请日：2022-04-19

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Heike Tritschler ,  Evan Douglas Smith ,  Williams Fabricio Flores Yepez

IPC: G01R31/317 ,  G01R31/319 ,  G06N20/00

Abstract: A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the waveform image and provide operating parameters for the device under test. A test and measurement system includes a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing a signal received from a device under test, a row selection circuit configured to select a row in the array of counters, a column selection circuit configured to select a column in the array of counters, a sample clock connected to the row selection circuit and the column selection circuit, and a machine learning system configured to receive the waveform image from the flash array digitizer and provide operating parameters for the device under test.