FRAME MASK FOR SINGULATING WAFERS BY PLASMA ETCHING

    公开(公告)号:US20230154795A1

    公开(公告)日:2023-05-18

    申请号:US18054547

    申请日:2022-11-11

    CPC classification number: H01L21/78 H01L21/3086 H01L21/3085 H01L21/3081

    Abstract: The present disclosure relates to plasma dicing of wafer. More specifically, the present disclosure is directed to frame masks and methods for plasma dicing wafers utilizing frame masks. The frame mask includes a mask frame, wherein the mask frame includes a top ring mask support and a side ring mask support. A plurality of mask segments suspended from the top ring mask support by segment supports, the mask segments are configured to define dicing channels on a blank wafer. The frame mask is configured to removably sit onto a frame lift assembly in a plasma chamber of a plasma dicing tool, when fitted onto the frame lift assembly, the mask segments are disposed above a wafer on a wafer ring frame for plasma dicing. The mask frame is configured to enable flow of plasma therethrough to the wafer to etch the wafer to form dicing channels defined by the mask segments.

    RELIABLE SEMICONDUCTOR PACKAGES
    5.
    发明申请

    公开(公告)号:US20220093664A1

    公开(公告)日:2022-03-24

    申请号:US17478978

    申请日:2021-09-20

    Abstract: A semiconductor package and a method of manufacturing thereof is disclosed. The package includes a package substrate having a die attach region with a die attached thereto. A protective cover with a cover adhesive is disposed over a sensor region of the die and attached to the die by the cover adhesive. The cover adhesive is disposed in a cap bonding region of the protective cover.

    SEMICONDUCTOR PACKAGE WITH DAMS
    6.
    发明申请

    公开(公告)号:US20220093482A1

    公开(公告)日:2022-03-24

    申请号:US17480090

    申请日:2021-09-20

    Abstract: A semiconductor package and a method of manufacturing thereof is disclosed. The package includes a package substrate having a die attach region with a die attached thereto. A protective cover is disposed over a sensor region of the die and attached to the die by a cover adhesive. The package includes a dam structure configured to protect components of the semiconductor package from contamination.

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