MICROSCOPE SPECTROMETER, OPTICAL AXIS SHIFT CORRECTION DEVICE, SPECTROSCOPE AND MICROSCOPE USING SAME
    1.
    发明申请
    MICROSCOPE SPECTROMETER, OPTICAL AXIS SHIFT CORRECTION DEVICE, SPECTROSCOPE AND MICROSCOPE USING SAME 有权
    微观光谱仪,光轴校正装置,光谱仪和使用相同的显微镜

    公开(公告)号:US20130258332A1

    公开(公告)日:2013-10-03

    申请号:US13897981

    申请日:2013-05-20

    Inventor: Mitsuhiro Iga

    Abstract: A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.

    Abstract translation: 一种显微镜光谱仪,其中当来自光源的激发光照射样品时,从进入显微镜的样品发射的光被分析,可以包括:第一光学装置,其将从样品发射的光形成为平行光束 ; 第一可变带通滤波器装置,其具有透射入射光的可变波长通带,入射光中的哪一个是预先建立的波长通带的光; 二维阵列光检测装置,其对波长通带中的光进行成像; 以及控制装置,其通过二维阵列光检测装置来控制成像的定时,并且根据该定时改变第一可变带通滤波器装置的波长通带。

    Environment information collecting system and aircraft

    公开(公告)号:US11429104B2

    公开(公告)日:2022-08-30

    申请号:US16552702

    申请日:2019-08-27

    Abstract: An environment information collecting system collects environment information on a surface of the earth or a surface layer of the earth. The environment information collecting system includes a sensor element which is scattered in a target region where the environment information is collected, of which at least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment, and an aircraft configured to receive the electromagnetic wave obtained from the sensor element and configured to collect the environment information in the target region.

    Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
    4.
    发明授权
    Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same 有权
    显微镜光谱仪,光轴偏移校正装置,分光镜和显微镜使用相同

    公开(公告)号:US09442013B2

    公开(公告)日:2016-09-13

    申请号:US13897981

    申请日:2013-05-20

    Inventor: Mitsuhiro Iga

    Abstract: A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.

    Abstract translation: 一种显微镜光谱仪,其中当来自光源的激发光照射样品时,从进入显微镜的样品发射的光被分析,可以包括:第一光学装置,其形成从样品发射的光作为平行光束 ; 第一可变带通滤波器装置,其具有透射入射光的可变波长通带,入射光中的哪一个是预先建立的波长通带的光; 二维阵列光检测装置,其对波长通带中的光进行成像; 以及控制装置,其通过二维阵列光检测装置来控制成像的定时,并且根据该定时改变第一可变带通滤波器装置的波长通带。

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