Electronic devices having displays with compensation for oxide transistor threshold voltage

    公开(公告)号:US11081053B2

    公开(公告)日:2021-08-03

    申请号:US16283481

    申请日:2019-02-22

    Applicant: Apple Inc.

    Abstract: A display may have an array of organic light-emitting diode display pixels. Each display pixel may include a drive transistor coupled in series with one or more emission transistors and a respective organic light-emitting diode (OLED). A semiconducting-oxide transistor may be coupled between a drain terminal and a gate terminal of the drive transistor to help reduce leakage during low-refresh-rate display operations. To compensate for variations in the threshold voltage of the semiconducting-oxide transistor, the magnitude of a high voltage level of a scan control signal provided to the gate terminal of the semiconducting-oxide transistor may be adjusted. Sensing circuitry may be used to sense a display current while displaying a calibration image. The sensed display current may be compared to an expected display current associated with the calibration image. Processing circuitry may update the high voltage level based on the actual display current compared to the expected display current.

    Electronic device display with charge accumulation tracker

    公开(公告)号:US10789902B2

    公开(公告)日:2020-09-29

    申请号:US16113132

    申请日:2018-08-27

    Applicant: Apple Inc.

    Abstract: An electronic device may generate content that is to be displayed on a display. The display may have an array of liquid crystal display pixels for displaying image frames of the content. The image frames may be displayed with positive and negative polarities to help reduce charge accumulation effects. A charge accumulation tracker may analyze the image frames to determine when there is a risk of excess charge accumulation. The charge accumulation tracker may analyze information on gray levels, frame duration, and frame polarity. The charge accumulation tracker may compute a charge accumulation metric for entire image frames or may process subregions of each frame separately. When subregions are processed separately, each subregion may be individually monitored for a risk of excess charge accumulation.

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