Contact probe arrangement for electrically connecting a test system to
the contact pads of a device to be tested
    92.
    发明授权
    Contact probe arrangement for electrically connecting a test system to the contact pads of a device to be tested 失效
    用于将测试系统电连接到待测试设备的接触垫的接触探针布置

    公开(公告)号:US4843315A

    公开(公告)日:1989-06-27

    申请号:US167676

    申请日:1988-03-14

    IPC分类号: G01R31/26 G01R1/073 G01R31/28

    CPC分类号: G01R1/07357

    摘要: The contact probe arrangement includes a stack of perforated plates (1, 1a) through which extend a plurality contact probes. The stack of perforated plates consists of two kinds of plates. The first kind forms the lowermost plates (1a). They have circular or square holes permitting a vertical placing of the contact probes onto the contact pads (4) of the device (5) to be tested. The plates (1) of the second kind have oblong, rectangular, square, circular, elliptical or trapezoidal holes (3). With respect to the stacked plates of the second kind, alternate ones are offset against the two other adjacent plates which are aligned relative to each other, in such a manner that each contact probe is surrounded by part of the lower edge of the upper of two adjacent perforated plates, and part of the upper edge of the lower of two adjacent perforated plates. If axial stress is applied, the contact probe can thus not buckle any farther than to a part of the perforation wall limiting its maximum buckling. This ensures a sufficiently low contact resistance between the contact probe and the contact pad of the device to be tested. By using a corresponding number of perforated plates of the second kind the contact probes can adapt to height differences of the contact pads caused by irregularities in the surface of the device to be tested.

    摘要翻译: 接触探针装置包括多个多孔板(1,1a)的堆叠,通过该堆叠多个多孔板延伸多个接触探针。 多孔板堆叠由两种板组成。 第一种形成最下面的板(1a)。 它们具有允许将接触探针垂直放置在待测试装置(5)的接触垫(4)上的圆形或方形孔。 第二类的板(1)具有长方形,矩形,正方形,圆形,椭圆形或梯形孔(3)。 对于第二类的堆叠板,替代物相对于彼此对准的另外两个相邻的板偏移,使得每个接触探针被两个上部的下边缘的一部分包围 相邻的穿孔板和两个相邻多孔板的下部的上边缘的一部分。 如果施加轴向应力,则接触探针因此可能不会比限制其最大屈曲的穿孔壁的一部分更加弯曲。 这确保接触探针和待测试装置的接触垫之间的接触电阻足够低。 通过使用相应数量的第二种多孔板,接触探针可以适应由待测试装置的表面中的不规则引起的接触垫的高度差异。