Abstract:
A multichannel digitizer and method of digitizing are provided. One digitizer includes an analog to digital convertor (ADC) having a plurality of channels receiving input analog signals; an operational amplifier in each channel and a comparator connected to the operational amplifier. The ADC further includes a logic circuit in each channel connected to the comparator and configured to generate an output based on a comparator signal received from the comparator. The ADC also includes a ramp generator connected to the plurality of channels and configured to provide a time varying reference signal.
Abstract:
In one embodiment, an analog-to-digital converter (ADC) includes a comparator and a supply circuit. The comparator is configured to compare an input signal to a reference signal. The supply circuit is configured to supply the reference signal. The supply circuit is configured to provide different circuit configurations for supplying the reference signal during different stages of analog-to-digital conversion such that the reference signal is scaled in substantially a same manner during at least two of the stages.
Abstract:
An analog-to-digital converter (ADC) generates an output digital value equivalent to the difference between two analog signal values. The ADC 30 receives a first analog signal level, a second analog signal level and a ramp signal. A counter 32 is operable to count in a single direction. A control stage is arranged to enable the counter 32 based on a comparison 19 of the ramp signal with the first analog signal and the second analog signal. A digital value accumulated by the counter during a period when it is enabled forms the output. The ADC can perform the conversion during a single cycle of the ramp signal. The counter 32 can be loaded with a starting digital value representing an exposure level accumulated during a previous exposure period. Techniques are described for reducing the conversion time.
Abstract:
An electronic apparatus includes: an AD conversion section that has a comparing section, which receives a reference signal whose level changes gradually from a reference signal generating section that generates the reference signal and which compares the reference signal with an analog signal to be processed, and a counter section, which receives a count clock for AD conversion and performs a count operation on the basis of a comparison result of the comparing section, and that acquires digital data of the signal to be processed on the basis of output data of the counter section; a count operation period control section that controls an operation period of the counter section in each processing period on the basis of the comparison result of the comparing section; and a driving control section that controls the reference signal generating section and the AD conversion section.
Abstract:
An analog-to-digital converter in an image sensor is implemented with a plurality of comparator units. Each comparator unit has a respective capacitor array and respective switches integrated therein. Such capacitors and switches across the comparator units are operated for generating ramp voltages for such comparator units for performing analog-to-digital conversion with correlated double sampling. Thus, circuit area and power consumption of the CMOS image sensor may be minimized.
Abstract:
A ramp generation circuit including, a charge supply unit which generates predetermined charges every predetermined time, an integration circuit which accumulates the charges generated from the charge supply unit and converts the charges into a voltage, and, an attenuation unit which outputs, to an output terminal, a voltage obtained by attenuating a noise value of an output voltage from the integration circuit.
Abstract:
An analog signal is converted to a digital value having a given number of bits that define given quantization levels, by repeatedly sampling the analog signal at a resolution that is less than that which is defined by the given number of bits. Lower resolution sampling results are thereby obtained. The lower resolution sampling results are summed to obtain the digital value having the given number of bits.
Abstract:
An analog to digital converter ADC is adapted for low power for use in an imaging array. The ADC is a digital inverter with feedback to convert an asynchronous ramp voltage to an output count at each crossing of a voltage threshold. A separate circuit generates a voltage ramp that is coupled through a capacitor to a photocurrent from a detector, generating an integrating voltage that is raised at a source follower circuit. The integrating voltage from the source follower circuit is converted to another voltage ramp and inverted at the ADC. A global count from an array of such ADCs is stored in a grey counter. The ADC is sufficiently power-efficient that each unit cell of an array of photo detectors can have its own ADC. Circuit and device-level embodiments are disclosed.
Abstract:
A ramp waveform generation circuit which comprises a first reference power supply, and supplies a ramp waveform signal to an analog/digital conversion circuit further comprises a connection circuit for reflecting the amount of fluctuation of the output potential of a second reference power supply which is installed in a noise elimination circuit for eliminating the noise of an analog signal inputted to the analog/digital conversion circuit in the output potential of the first reference power supply.
Abstract:
A solid state imager includes an arrangement for converting analog pixel values to digital form on an arrayed per-column basis. An N-bit counter supplies an N-bit DAC to produce an analog ramp output providing a ramp signal with a level that varies corresponding to the contents of the counter. Latches or equivalent digital storage elements are each associated with a respective column. A counter bus connects the counter to latch inputs of said latches, and comparators associated the columns gate the latches when the analog ramp equals the pixel value for that column. The contents of the latch elements are transferred sequentially to a video output bus to produce the digital video signal. There can be additionally black-level readout latch elements, for storing a digital value that corresponds to the dark or black video level, and a subtraction element subtracts the black level value from the pixel value to reduce fixed pattern noise. An additional array of buffer latches can be employed.