Downhole Sensors Using Anisotropic Permittivity
    102.
    发明申请
    Downhole Sensors Using Anisotropic Permittivity 审中-公开
    井下传感器使用各向异性介电常数

    公开(公告)号:US20130107258A1

    公开(公告)日:2013-05-02

    申请号:US13688907

    申请日:2012-11-29

    Inventor: Sebastian Csutak

    Abstract: A apparatus for use in a borehole in an earth formation. The apparatus may include: an electromagnetic source; an anisotropic permittivity material, either natural or manufactured, receiving electromagnetic radiation from the electromagnetic source; and a detector for estimating the electromagnetic radiation transmitted through the anisotropic permittivity material as an indication of a parameter of interest. Also, a method of estimating a parameter of interest using the aforementioned apparatus.

    Abstract translation: 一种用于地层钻孔的装置。 该装置可以包括:电磁源; 自然或制造的各向异性介电常数材料接收来自电磁源的电磁辐射; 以及用于估计通过各向异性介电常数材料传输的电磁辐射作为感兴趣参数的指示的检测器。 此外,使用上述装置估计感兴趣的参数的方法。

    Downhole sensors using manufactured anisotropic permittivity
    103.
    发明授权
    Downhole sensors using manufactured anisotropic permittivity 有权
    井下传感器使用制造的各向异性介电常数

    公开(公告)号:US08358414B2

    公开(公告)日:2013-01-22

    申请号:US12758545

    申请日:2010-04-12

    Inventor: Sebastian Csutak

    Abstract: A apparatus for use in a borehole in an earth formation. The apparatus may include: an electromagnetic source; an anisotropic permittivity material, either natural or manufactured, receiving electromagnetic radiation from the electromagnetic source; and a detector for estimating the electromagnetic radiation transmitted through the anisotropic permittivity material as an indication of a parameter of interest. Also, a method of estimating a parameter of interest using the aforementioned apparatus.

    Abstract translation: 一种用于地层钻孔的装置。 该装置可以包括:电磁源; 自然或制造的各向异性介电常数材料接收来自电磁源的电磁辐射; 以及用于估计通过各向异性介电常数材料传输的电磁辐射作为感兴趣参数的指示的检测器。 此外,使用上述装置估计感兴趣的参数的方法。

    METHOD FOR INSPECTING DEFECTS, INSPECTED WAFER OR SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME, METHOD FOR QUALITY CONTROL OF WAFERS OR SEMICONDUCTOR DEVICES AND DEFECT INSPECTING APPARATUS
    104.
    发明申请
    METHOD FOR INSPECTING DEFECTS, INSPECTED WAFER OR SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME, METHOD FOR QUALITY CONTROL OF WAFERS OR SEMICONDUCTOR DEVICES AND DEFECT INSPECTING APPARATUS 有权
    用于检查缺陷的方法,使用其制造的检查的半导体器件或半导体器件,用于质量控制的半导体器件和半导体器件的方法和缺陷检查器件

    公开(公告)号:US20120262715A1

    公开(公告)日:2012-10-18

    申请号:US13510769

    申请日:2010-11-19

    Abstract: Light from a light source device is polarized through a polarizer and is caused to impinge obliquely onto an object to be inspected. The resulting scattered light is received by a CCD imaging device having an element for separating scattered polarized light disposed in a dark field. Component light intensities are worked out for an obtained P-polarized component image and an obtained S-polarized component image and a polarization direction is determined as a ratio of them. The component light intensities and the polarization directions are determined from images obtained by imaging of the light scattering entities in a state where static stress is not applied to the object to the inspected and in a state where static load is applied thereto so as to generate tensional stress on the side irradiated by light. The component light intensities and the polarization directions are compared with predetermined threshold values.

    Abstract translation: 来自光源装置的光通过偏振片偏振,并被倾斜地撞击到被检查物体上。 所得到的散射光由具有用于分离设置在暗场中的散射偏振光的元件的CCD成像装置接收。 对于获得的P偏振分量图像计算分量光强度,并且将所获得的S偏振分量图像和偏振方向确定为它们的比率。 分量光强度和偏振方向由静态应力未被施加到检查对象的状态下的光散射体成像得到的图像和静电负荷施加到其上的状态来确定,以产生张力 在光线照射的一侧的应力。 将分量光强度和偏振方向与预定阈值进行比较。

    Method and member for measuring stress distribution of natural bone, synthetic bone, or member attached to them
    105.
    发明授权
    Method and member for measuring stress distribution of natural bone, synthetic bone, or member attached to them 有权
    用于测量天然骨骼,合成骨骼或附着于其上的构件的应力分布的方法和构件

    公开(公告)号:US08056422B2

    公开(公告)日:2011-11-15

    申请号:US11814450

    申请日:2006-01-11

    Abstract: When visualizing the stress distribution of natural bone, synthetic bone, or a member attached to either thereof without omitted points, in order to measure accurately in a variety of modes using an inexpensive system, a mechanoluminescence material thin film 6 is formed in advance on a bone material peripheral surface 5 in an appropriate area thereof including the portion where an insertion support portion 4 of an artificial hip prosthesis 2 is inserted into a hollow inside 3 of a damaged femur 1 or a synthetic bone simulating the damaged femur. The mechanoluminescence material thin film 6 portion is photographed over its entire circumference with an IICCD camera 7 from the external peripheral side thereof as or after the artificial hip prosthesis 2 is inserted. The obtained image is fed to a computer 11 to obtain a luminescence image 8. The computer 11 outputs the intensities of the received light in the form of an image as is, so that the luminescence image 8 can be obtained easily. Particularly, the data about the intensities of the received light can be used as stress/strain data virtually as is. Such method is also suitable for dynamic analysis.

    Abstract translation: 当可视化天然骨骼,合成骨骼或附着于其中的部件的应力分布而不省略时,为了使用廉价的系统以各种模式精确地测量,机械发光材料薄膜6预先形成在 骨材料周边表面5在其适当的区域中,包括将人造髋假体2的插入支撑部分4插入损伤股骨1的中空内侧3中的部分或模拟受损股骨的合成骨。 机械发光材料薄膜6部分在其人造髋假体2插入之后或之后,利用来自其外周侧的IICCD照相机7在其整个圆周上进行拍照。 所获得的图像被馈送到计算机11以获得发光图像8.计算机11原样输出图像形式的接收光的强度,使得可以容易地获得发光图像8。 特别地,关于接收光的强度的数据可以被虚拟地用作应力/应变数据。 这种方法也适用于动态分析。

    GLASS CONTAINER WALL THICKNESS MEASUREMENT USING FLUORESCENCE
    106.
    发明申请
    GLASS CONTAINER WALL THICKNESS MEASUREMENT USING FLUORESCENCE 有权
    玻璃容器的厚度采用荧光测量

    公开(公告)号:US20110032523A1

    公开(公告)日:2011-02-10

    申请号:US12535828

    申请日:2009-08-05

    CPC classification number: G01B11/06 G01L1/2206 G01L1/241 G01N21/90

    Abstract: An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.

    Abstract translation: 公开了用于测量玻璃容器的壁的应力和厚度的装置和方法,除了玻璃容器中的应力曲线之外,还使用荧光来快速准确地确定应力层的厚度和壁厚。 该装置和方法可用于快速且准确地测量玻璃容器在玻璃容器的整个圆周上的侧壁的应力和厚度。 该装置和方法适用于大规模玻璃容器制造,并且能够高速测量玻璃容器的侧壁的应力和厚度。

    Strain measurement method and device
    110.
    发明授权
    Strain measurement method and device 失效
    应变测量方法和装置

    公开(公告)号:US07487685B2

    公开(公告)日:2009-02-10

    申请号:US11513934

    申请日:2006-08-31

    Inventor: Koichi Kobayashi

    CPC classification number: G01B11/167 G01L1/241 G01L5/0047

    Abstract: A non-contacting strain measurement method and system employs a laser light source for irradiating a test piece to provide a spectral pattern in spaced relationship from the test piece. The pattern is viewed while the test piece is placed under tension by a plurality of video cameras. The CCD video cameras are coupled to signal processing circuits which calculate the Poisson ratio according to the formula: ɛ xx = - Δ ⁢ ⁢ A x 2 ⁢ L 0 ⁢ tan ⁢ ⁢ θ 0 .

    Abstract translation: 非接触应变测量方法和系统采用激光光源照射测试片以提供与测试片间隔开的光谱图案。 当测试片被多个摄像机放置在张力下时,观察图案。 CCD摄像机耦合到信号处理电路,根据下列公式计算泊松比: = - mi> Delta mi> A x 2 / mi> 0 tan theta 0

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