Column redundancy techniques
    111.
    发明授权

    公开(公告)号:US11664086B2

    公开(公告)日:2023-05-30

    申请号:US17375887

    申请日:2021-07-14

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a device having memory architecture with an array of memory cells arranged in multiple columns with redundancy including first columns of memory cells disposed in a first region along with second columns of memory cells and redundancy columns of memory cells disposed in a second region that is laterally opposite the first region. The device may have column shifting logic that is configured to receive data from the multiple columns, shift the data from the first columns in the first region to a first set of the redundancy columns in the second region, and shift data from the second columns in the second region to a second set of the redundancy columns in the second region.

    Circuitry apportioning of an integrated circuit

    公开(公告)号:US11532353B2

    公开(公告)日:2022-12-20

    申请号:US17162532

    申请日:2021-01-29

    Applicant: Arm Limited

    Abstract: According to one implementation of the present disclosure, an integrated circuit comprises a memory macro unit that includes an input/output (I/O) circuit block, where read/write circuitry of the I/O circuit block is apportioned on at least first and second tiers of the memory macro unit. In a particular implementation, read circuitry of the read/write circuitry is arranged on the first tier and write circuitry of the read/write circuitry is arranged on the second tier.

    3D storage architecture with tier-specific controls

    公开(公告)号:US11468945B2

    公开(公告)日:2022-10-11

    申请号:US17071449

    申请日:2020-10-15

    Applicant: Arm Limited

    Abstract: A three-dimensional (3D) storage circuit includes two or more tiers of semiconductor dies, and a storage array of bitcells distributed on the two or more tiers to form a plurality of storage subarrays. One of the storage subarrays is arranged on a respective one of the tiers. Row and column replica/dummy tracking cells are arranged on each of the tiers. A timing circuit is coupled to the tracking cells of each of the tiers. In response to receipt of tier-specific trim bits for each of the tiers, the timing circuit independently controls a timing and/or voltage state of each of the tiers during an access operation of the 3D storage circuit to account for process and/or thermal variation between tiers of the 3D storage circuit.

    Row Redundancy Techniques
    117.
    发明申请

    公开(公告)号:US20220319632A1

    公开(公告)日:2022-10-06

    申请号:US17218927

    申请日:2021-03-31

    Applicant: Arm Limited

    Abstract: Various implementations described herein are related to a method for identifying multi-bank memory architecture having multiple banks including a first bank and a second bank. The method may receive a faulty row address having a faulty bank selection bit, and also, the method may select the first bank or the second bank for row redundancy operations based on the faulty bank selection bit.

    Buried Power Rail Architecture
    118.
    发明申请

    公开(公告)号:US20220293522A1

    公开(公告)日:2022-09-15

    申请号:US17199143

    申请日:2021-03-11

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a method for routing buried power rails underneath a memory instance. The method may identify first rails of the buried power rails disposed in a first layer and second rails of the buried power rails disposed perpendicular to the first rails in a second layer. The method may identify long rails of the first rails with a first length and short rails of the first rails with a second length that is less than the first length. The method may separately couple the long rails and the short rails to the second rails with vias that extend between the first layer and the second layer.

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