ELECTRON IMAGING METHOD AND SYSTEM
    112.
    发明申请

    公开(公告)号:US20200161084A1

    公开(公告)日:2020-05-21

    申请号:US16689680

    申请日:2019-11-20

    IPC分类号: H01J37/22 H01J37/26

    摘要: A transmission electron microscopy system for imaging a sample, comprising: a pulse generator for generating an initial electron pulse towards the sample, the initial electron pulse to be propagated through the sample to obtain a transmitted electron pulse; an encoding device for encoding the transmitted electron pulse according to a predefined pattern to obtain an encoded electron pulse; a shearing device for temporally shearing the encoded electron pulse in a given direction to obtain a given electron pulse; a detector for detecting the given electron pulse to obtain a single image of the sample; and a datacube generator for determining a spatiotemporal datacube from the single image using the predefined pattern, and outputting the spatiotemporal datacube.

    Humidity sensing system and method
    113.
    发明授权

    公开(公告)号:US10527539B2

    公开(公告)日:2020-01-07

    申请号:US15903638

    申请日:2018-02-23

    摘要: A humidity sensing method and system comprising a transmitter, comprising a fiber optic head and a light source comprising a single LED emitting a measuring light, a receiver, and a sensing assembly comprising a plurality of optical fibers each comprising a first end fed the measuring light, a transducer positioned along a length thereof, the transducer comprising a side-polished portion of the optical fiber, the side polished portion coated with a gold layer and a film of a hydrophilic material wherein the transducer modifies an intensity of the measuring light dependent on an ambient humidity, and a second end for feeding the modified measuring light to the receiver, wherein the receiver compares an intensity of the measuring light with an intensity of the modified measuring light deriving therefrom a corresponding humidity level and dew point temperature.

    METHOD AND APPARATUS FOR CHARACTERIZATION OF TERAHERTZ RADIATION

    公开(公告)号:US20170336262A1

    公开(公告)日:2017-11-23

    申请号:US15524488

    申请日:2015-11-04

    IPC分类号: G01J3/42 G01J3/02

    摘要: A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.