Method of forming a spin valve structure with a composite spacer in a magnetic read head
    121.
    发明授权
    Method of forming a spin valve structure with a composite spacer in a magnetic read head 有权
    在磁读头中用复合间隔物形成自旋阀结构的方法

    公开(公告)号:US08978240B2

    公开(公告)日:2015-03-17

    申请号:US13200013

    申请日:2011-09-15

    摘要: A CPP-GMR spin valve having a composite spacer layer comprised of at least one metal (M) layer and at least one semiconductor or semi-metal (S) layer is disclosed. The composite spacer may have a M/S, S/M, M/S/M, S/M/S, M/S/M/S/M, or a multilayer (M/S/M)n configuration where n is an integer≧1. The pinned layer preferably has an AP2/coupling/AP1 configuration wherein the AP2 portion is a FCC trilayer represented by CoZFe(100-Z)/FeYCo(100-Y)/CoZFe(100-Z) where y is 0 to 60 atomic %, and z is 75 to 100 atomic %. In one embodiment, M is Cu with a thickness from 0.5 to 50 Angstroms and S is ZnO with a thickness of 1 to 50 Angstroms. The S layer may be doped with one or more elements. The dR/R ratio of the spin valve is increased to 10% or greater while maintaining acceptable EM and RA performance.

    摘要翻译: 公开了具有由至少一个金属(M)层和至少一个半导体或半金属(S)层组成的复合间隔层的CPP-GMR自旋阀。 复合间隔物可以具有M / S,S / M,M / S / M,S / M / S,M / S / M / S / M或多层(M / S / M) 是整数≧1。 钉扎层优选具有AP2 /耦合/ AP1配置,其中AP2部分是由CoZFe(100-Z)/ FeYCo(100-Y)/ CoZFe(100-Z)表示的FCC三层,其中y为0至60原子% ,z为75〜100原子%。 在一个实施方案中,M是厚度为0.5至50埃的Cu,S是厚度为1至50埃的ZnO。 S层可以掺杂有一个或多个元素。 自旋阀的dR / R比提高到10%以上,同时保持可接受的EM和RA性能。

    Low resistance tunneling magnetoresistive sensor with natural oxidized double MgO barrier
    122.
    发明授权
    Low resistance tunneling magnetoresistive sensor with natural oxidized double MgO barrier 有权
    具有自然氧化双MgO阻挡层的低阻隧道磁阻传感器

    公开(公告)号:US08557407B2

    公开(公告)日:2013-10-15

    申请号:US12806164

    申请日:2010-08-06

    IPC分类号: G11B5/39

    摘要: A high performance TMR sensor is fabricated by incorporating a tunnel barrier having a Mg/MgO/Mg configuration. The 4 to 14 Angstroms thick lower Mg layer and 2 to 8 Angstroms thick upper Mg layer are deposited by a DC sputtering method while the MgO layer is formed by a NOX process involving oxygen pressure from 0.1 mTorr to 1 Torr for 15 to 300 seconds. NOX time and pressure may be varied to achieve a MR ratio of at least 34% and a RA value of 2.1 ohm-um2. The NOX process provides a more uniform MgO layer than sputtering methods. The second Mg layer is employed to prevent oxidation of an adjacent ferromagnetic layer. In a bottom spin valve configuration, a Ta/Ru seed layer, IrMn AFM layer, CoFe/Ru/CoFeB pinned layer, Mg/MgO/Mg barrier, CoFe/NiFe free layer, and a cap layer are sequentially formed on a bottom shield in a read head.

    摘要翻译: 通过并入具有Mg / MgO / Mg构型的隧道势垒来制造高性能TMR传感器。 通过DC溅射法沉积4至14埃厚的较低的Mg层和2至8埃厚的上部Mg层,而MgO层通过氧化压力为0.1毫托至1托的NOX工艺形成15至300秒。 可以改变NOX时间和压力以实现至少34%的MR比和2.1ohm-um2的RA值。 NOX工艺提供比溅射方法更均匀的MgO层。 第二Mg层用于防止相邻铁磁层的氧化。 在底部自旋阀结构中,Ta / Ru籽晶层,IrMn AFM层,CoFe / Ru / CoFeB钉扎层,Mg / MgO / Mg阻挡层,CoFe / NiFe自由层和覆盖层依次形成在底部屏蔽 在读头。

    TMR device with low magnetorestriction free layer
    123.
    发明授权
    TMR device with low magnetorestriction free layer 有权
    具有低磁阻自由层的TMR器件

    公开(公告)号:US08472151B2

    公开(公告)日:2013-06-25

    申请号:US13444497

    申请日:2012-04-11

    IPC分类号: G11B5/33 G11B5/127

    摘要: A high performance TMR sensor is fabricated by employing a free layer with a trilayer configurations represented by FeCo/CoFeB/CoB, FeCo/CoB/CoFeB, FeCo/CoFe/CoB, or FeCo/FeB/CoB may also be employed. Alternatively, CoNiFeB or CoNiFeBM formed by co-sputtering CoB with CoNiFe or CoNiFeM, respectively, where M is V, Ti, Zr, Nb, Hf, Ta, or Mo may be included in a composite free layer or as a single free layer in the case of CoNiFeBM. A 15 to 30% in improvement in TMR ratio over a conventional CoFe/NiFe free layer is achieved while maintaining low Hc and RA

    摘要翻译: 通过采用由FeCo / CoFeB / CoB,FeCo / CoB / CoFeB,FeCo / CoFe / CoB或FeCo / FeB / CoB表示的三层结构的自由层制造高性能TMR传感器。 或者,通过共溅射CoB与CoNiFe或CoNiFeM(其中M是V,Ti,Zr,Nb,Hf,Ta或Mo)分别形成的CoNiFeB或CoNiFeBM可以包括在复合自由层中或作为单个自由层 CoNiFeBM的情况。 在保持低Hc和RA <3欧姆 - um2的同时,实现了常规CoFe / NiFe自由层的TMR比提高15至30%。 在双层或三层实施例中,通过组合CoB(λ)和一个或多个具有正λ的层来实现-5×10-6和5×10-6之间的磁致伸缩(λ)。

    Very thin high coercivity film and process for making it
    124.
    发明申请
    Very thin high coercivity film and process for making it 有权
    非常薄的高矫顽力膜及其制造方法

    公开(公告)号:US20130084452A1

    公开(公告)日:2013-04-04

    申请号:US13200790

    申请日:2011-09-30

    IPC分类号: B32B3/00 C23F1/00 H01F41/14

    摘要: High Hc (>4,000 Oe) and high Hk (>1 Tesla) has been achieved in FePt films as thin as 70 Angstroms. This was accomplished by starting with a relatively thick film having the required high coercivity, coating it with a suitable material such as Ta, and then using ion beam etching to remove surface material until the desired thickness was reached.

    摘要翻译: 在70埃的FePt薄膜中已经实现了高Hc(> 4,000 Oe)和高Hk(> 1特斯拉)。 这是通过用具有所需高矫顽力的相对厚的膜开始,用合适的材料如Ta涂覆,然后使用离子束蚀刻去除表面材料直至达到所需的厚度来实现的。

    TMR or CPP structure with improved exchange properties
    125.
    发明授权
    TMR or CPP structure with improved exchange properties 有权
    具有改进的交换性能的TMR或CPP结构

    公开(公告)号:US08339754B2

    公开(公告)日:2012-12-25

    申请号:US13135277

    申请日:2011-06-30

    IPC分类号: G11B5/39

    摘要: An insertion layer is provided between an AFM layer and an AP2 pinned layer in a GMR or TMR element to improve exchange coupling properties by increasing Hex and the Hex/Hc ratio without degrading the MR ratio. The insertion layer may be a 1 to 15 Angstrom thick amorphous magnetic layer comprised of at least one element of Co, Fe, or Ni, and at least one element having an amorphous character selected from B, Zr, Hf, Nb, Ta, Si, or P, or a 1 to 5 Angstrom thick non-magnetic layer comprised of Cu, Ru, Mn, Hf, or Cr. Preferably, the content of the one or more amorphous elements in the amorphous magnetic layer is less than 40 atomic %. Optionally, the insertion layer may be formed within the AP2 pinned layer. Examples of an insertion layer are CoFeB, CoFeZr, CoFeNb, CoFeHf, CoFeNiZr, CoFeNiHf, and CoFeNiNbZr.

    摘要翻译: 在GMR或TMR元件中的AFM层和AP2钉扎层之间设置插入层,以通过增加Hex和Hex / Hc比来提高交换耦合性能,而不降低MR比。 插入层可以是由至少一种Co,Fe或Ni元素组成的1至15埃厚的非晶磁性层,以及至少一种具有选自B,Zr,Hf,Nb,Ta,Si ,或P,或由Cu,Ru,Mn,Hf或Cr组成的1至5埃厚的非磁性层。 优选地,非晶磁性层中的一种或多种非晶质元素的含量小于40原子%。 可选地,插入层可以形成在AP2钉扎层内。 插入层的实例是CoFeB,CoFeZr,CoFeNb,CoFeHf,CoFeNiZr,CoFeNiHf和CoFeNiNbZr。

    Low resistance tunneling magnetoresistive sensor with natural oxidized double MgO barrier
    126.
    发明授权
    Low resistance tunneling magnetoresistive sensor with natural oxidized double MgO barrier 有权
    具有自然氧化双MgO阻挡层的低阻隧道磁阻传感器

    公开(公告)号:US08337676B2

    公开(公告)日:2012-12-25

    申请号:US12806082

    申请日:2010-08-05

    IPC分类号: C23C14/34

    摘要: A high performance TMR sensor is fabricated by incorporating a tunnel barrier having a Mg/MgO/Mg configuration. The 4 to 14 Angstroms thick lower Mg layer and 2 to 8 Angstroms thick upper Mg layer are deposited by a DC sputtering method while the MgO layer is formed by a NOX process involving oxygen pressure from 0.1 mTorr to 1 Torr for 15 to 300 seconds. NOX time and pressure may be varied to achieve a MR ratio of at least 34% and a RA value of 2.1 ohm-um2. The NOX process provides a more uniform MgO layer than sputtering methods. The second Mg layer is employed to prevent oxidation of an adjacent ferromagnetic layer. In a bottom spin valve configuration, a Ta/Ru seed layer, IrMn AFM layer, CoFe/Ru/CoFeB pinned layer, Mg/MgO/Mg barrier, CoFe/NiFe free layer, and a cap layer are sequentially formed on a bottom shield in a read head.

    摘要翻译: 通过并入具有Mg / MgO / Mg构型的隧道势垒来制造高性能TMR传感器。 通过DC溅射法沉积4至14埃厚的较低的Mg层和2至8埃厚的上部Mg层,而MgO层通过氧化压力为0.1毫托至1托的NOX工艺形成15至300秒。 可以改变NOX时间和压力以实现至少34%的MR比和2.1ohm-um2的RA值。 NOX工艺提供比溅射方法更均匀的MgO层。 第二Mg层用于防止相邻铁磁层的氧化。 在底部自旋阀结构中,Ta / Ru籽晶层,IrMn AFM层,CoFe / Ru / CoFeB钉扎层,Mg / MgO / Mg阻挡层,CoFe / NiFe自由层和覆盖层依次形成在底部屏蔽 在读头。

    Laminated high moment film for head applications
    127.
    发明授权
    Laminated high moment film for head applications 有权
    用于头部应用的层压高力矩胶片

    公开(公告)号:US08329320B2

    公开(公告)日:2012-12-11

    申请号:US12291715

    申请日:2008-11-13

    IPC分类号: G11B5/31 G11B5/127

    摘要: A laminated high moment film with a non-AFC configuration is disclosed that can serve as a seed layer for a main pole layer or as the main pole layer itself in a PMR writer. The laminated film includes a plurality of (B/M) stacks where B is an alignment layer and M is a high moment layer. Adjacent (B/M) stacks are separated by an amorphous layer that breaks the magnetic coupling between adjacent high moment layers and reduces remanence in a hard axis direction while maintaining a high magnetic moment and achieving low values for Hch, Hce, and Hk. The amorphous material layer may be made of an oxide, nitride, or oxynitride of one or more of Hf, Zr, Ta, Al, Mg, Zn, Ti, Cr, Nb, or Si, or may be Hf, Zr, Ta, Nb, CoFeB, CoB, FeB, or CoZrNb. Alignment layers are FCC soft ferromagnetic materials or non-magnetic FCC materials.

    摘要翻译: 公开了一种具有非AFC配置的叠层高力矩薄膜,其可用作主磁极层的种子层或作为PMR写入器中的主极点本身。 层叠膜包括多个(B / M)堆叠,其中B是取向层,M是高力矩层。 相邻的(B / M)堆叠被非晶层隔开,其破坏相邻高力矩层之间的磁耦合,并且在保持高磁矩并且实现Hch,Hce和Hk的低值的同时降低硬轴方向的剩磁。 非晶材料层可以由Hf,Zr,Ta,Al,Mg,Zn,Ti,Cr,Nb或Si中的一种或多种的氧化物,氮化物或氮氧化物制成,或者可以是Hf,Zr,Ta, Nb,CoFeB,CoB,FeB或CoZrNb。 对准层是FCC软铁磁材料或非磁性FCC材料。

    TMR device with novel free layer structure
    129.
    发明授权
    TMR device with novel free layer structure 有权
    TMR器件具有新颖的自由层结构

    公开(公告)号:US08259420B2

    公开(公告)日:2012-09-04

    申请号:US12658005

    申请日:2010-02-01

    IPC分类号: G11B5/39 C21D1/04

    摘要: A composite free layer having a FL1/insertion/FL2 configuration where a top surface of FL1 is treated with a weak plasma etch is disclosed for achieving enhanced dR/R while maintaining low RA, and low λ in TMR or GMR sensors. The weak plasma etch removes less than about 0.2 Angstroms of FL1 and is believed to modify surface structure and possibly increase surface energy. FL1 may be CoFe, CoFe/CoFeB, or alloys thereof with Ni, Ta, Mn, Ti, W, Zr, Hf, Tb, or Nb having a (+) λ value. FL2 may be CoFe, NiFe, or alloys thereof having a (−) λ value. The thin insertion layer includes at least one magnetic element such as Co, Fe, and Ni, and at least one non-magnetic element selected from Ta, Ti, W, Zr, Hf, Nb, Mo, V, Cr, or B. When CoFeBTa is selected as insertion layer, the CoFeB:Ta ratio is from 1:1 to 4:1.

    摘要翻译: 公开了具有FL1 /插入/ FL2配置的复合自由层,其中用弱等离子体蚀刻处理FL1的顶表面,以实现增强的dR / R,同时保持低的RA和TMR或GMR传感器中的低λ。 弱等离子体蚀刻去除了小于约0.2埃的FL1,据信可以改变表面结构并可能增加表面能。 FL1可以是具有(+)λ值的Ni,Ta,Mn,Ti,W,Zr,Hf,Tb或Nb的CoFe,CoFe / CoFeB或其合金。 FL2可以是具有( - )λ值的CoFe,NiFe或其合金。 薄插入层包括至少一种诸如Co,Fe和Ni的磁性元件和至少一种选自Ta,Ti,W,Zr,Hf,Nb,Mo,V,Cr或B的非磁性元素。 当选择CoFeBTa作为插入层时,CoFeB:Ta的比例为1:1至4:1。

    Seed layer for TMR or CPP-GMR sensor
    130.
    发明授权
    Seed layer for TMR or CPP-GMR sensor 有权
    种子层用于TMR或CPP-GMR传感器

    公开(公告)号:US08164862B2

    公开(公告)日:2012-04-24

    申请号:US12080277

    申请日:2008-04-02

    IPC分类号: G11B5/39

    摘要: A composite seed layer that reduces the shield to shield distance in a read head while improving Hex (exchange coupling field) and Hex/Hc (Hc=coercivity) is disclosed and has a SM/A/SM/B configuration in which the SM layers are soft magnetic layers, the A (amorphous) layer is made of at least one of Co, Fe, Ni, and includes one or more amorphous elements, and the B layer is a buffer layer that contacts the AFM (anti-ferromagnetic) layer in the spin valve. The SM/A/SM stack together with the S1 (bottom) shield forms an effective shield such that the buffer layer serves as the effective seed layer while maintaining a blocking temperature of 260° C. in the AFM layer. The lower SM layer may be omitted. Examples of the amorphous layer are CoFeB, CoFeZr, CoFeNb, CoFeHf, CoFeNiZr, CoFeNiHf, and CoFeNiNbZr while the buffer layer may be Cu, Ru, Cr, Al, or NiFeCr.

    摘要翻译: 公开了一种复合种子层,其在改进Hex(交换耦合场)和Hex / Hc(Hc =矫顽力)的同时减小了读头中的屏蔽距离,并具有SM / A / SM / B配置,其中SM层 是软磁性层,A(非晶)层由Co,Fe,Ni中的至少一种构成,并且包括一个或多个非晶元素,并且B层是与AFM(反铁磁)层接触的缓冲层 在自旋阀中。 SM / A / SM堆叠与S1(底部)屏蔽件形成有效屏蔽,使得缓冲层用作有效种子层,同时在AFM层中保持260℃的阻挡温度。 可以省略下层SM层。 非晶层的实例是CoFeB,CoFeZr,CoFeNb,CoFeHf,CoFeNiZr,CoFeNiHf和CoFeNiNbZr,而缓冲层可以是Cu,Ru,Cr,Al或NiFeCr。