Abstract:
A semiconductor package and method for forming the same is disclosed herein. The semiconductor package includes a package support member, a pair of optoelectronic devices spaced from each other and coupled to the package support member, and an optically transmissive portion for separately encapsulating the pair of optoelectronic devices. A pair of lenses is formed as a unibody structure with the optically transmissive portion. The semiconductor package also includes an optically opaque portion, which extends between and around the separately encapsulated devices to optically isolate encapsulated optical devices. The optically opaque portion also extends outward from portions of the encapsulated devices, thereby forming a pair of fiber optic receptacles as a unibody structure with the optically opaque portion. By forming lensing elements and fiber optic receptacles in such a manner, the present method provides an easier and more accurate means by which to passively align optical conductors to underlying encapsulated optical devices.
Abstract:
A system may comprise multiple master/slave devices coupled to a common bus, where one of the devices may operate as the current master device and the other devices may operate as current slave devices. Current slave devices may embed bus ownership request information within response packets transmitted in response to standard bus operations, such as reads and writes, issued by the current master device. When the current master device is idle, its bus interface may continually poll the current slave devices at regular intervals, according to a specified protocol, to ascertain whether any of them are requesting bus ownership. A response to a request for bus ownership received by the current master device may be configured according to desired system functionality. In one system, ownership may always be transferred to the requesting device. In other systems, the current master device may transmit a subsequent standard bus operation request packet, or a unique response packet, either comprising embedded information indicating whether ownership of the bus has been granted.
Abstract:
In one set of embodiments, a temperature measurement system may include an analog to digital converter (ADC) to produce digital temperature readings according to a difference base-emitter voltage (ΔVBE) developed across a PN-junction. A clock generating circuit may be configured to provide a sampling clock used by the ADC, which in some embodiments may be a delta-sigma ADC, in performing the conversions. The clock generating circuit may be configured to change the frequency of the sampling clock a specified number of times within each one of the one or more conversion cycles to reduce an error component in the temperature measurement, where the error component is produced by an interfering signal, such as an electromagnetic interference (EMI) signal being coherent with the sampling clock, and/or a noise residing on the voltage supply and also being coherent with the sampling clock.
Abstract:
An interface chip is disclosed. In one embodiment, an interface chip includes a processor coupled to an internal data bus and an internal address bus. A plurality of interfaces, including at least on serial interface and at least one parallel interface are also coupled to the processor via the internal address bus and the internal data bus. The interface chip also includes data movement circuitry, wherein the data movement circuitry is configured for transmitting data between a first of the plurality of interfaces and a second of the plurality of interfaces using time division multiplexing.
Abstract:
A communication system, source and destination ports of the communication system, and methodology is provided for transporting data in one of possibly three different ways. Data is transported across the network at a frame sample rate that can be the same as or different from the sample rate or master clock within the source port or the destination port. If the sample rate of the source port is known, the sample rate of the destination port can be created using a PLL within the destination port and simply employing a phase comparator in the source port. The phase comparator forwards the phase or frequency difference of the network transfer rate and the source sample rate to the destination port, which then generates a local clock equivalent to the source which then compiles audio data being played at the same rate in which it was sampled at the source. Where economically feasible, sample rate conversion can be used at the source. However, sample rate conversion at the destination is preferred if the source sample rate is forwarded across the network relative to the frame transfer rate of the synchronous network. The sample rate converter simply produces a play rate from the transmitted information at the destination. Again, however, sample rate conversion compares relative phase difference changes similar to the phase difference compared in the digital PLL mode. As a further alternative, sample rates within the source and destination ports can be derived from the network frame rate using fractional dividers in the source and destination ports.
Abstract:
A linear, half-rate clock and data recovery (CDR) circuit for recovering clock information embedded in a received data signal. The half-rate CDR circuit comprises a phase detector that may receive the data signal and generate a phase error signal representative of the phase difference between the received data signal and a clock signal produced by a voltage-controlled oscillator (VCO) of the CDR circuit. The half-rate CDR typically changes the frequency of the clock signal and generates a clock signal that is aligned with the baud center of the received data signal. More specifically, when the half-rate CDR circuit is in a locked condition, both the rising and falling edges of the clock signal are aligned with the baud center of the received data signal. The half-rate CDR preferably generates a clock signal with an average frequency that is half the data rate of a received data signal.
Abstract:
A temperature measurement device may be implemented by coupling a PN-junction, which may be comprised in a diode, to an analog-to-digital converter (ADC) that comprises an integrator. Different currents may be successively applied to the diode, resulting in different VBE values across the diode. The ΔVBE values thus obtained may be successively integrated. Appropriate values for the different currents may be determined based on a set of mathematical equations, each equation relating the VBE value to the temperature of the diode, the current applied to the diode and parasitic series resistance associated with the diode. When the current sources with the appropriate values are sequentially applied to the diode and the resulting diode voltage differences are integrated by the integrator comprised in the ADC, the error in the temperature measurement caused by series resistance is canceled in the ADC, and an accurate temperature reading of the diode is obtained from the output of the ADC.
Abstract:
A device may include an upstream port and several downstream ports configured to transfer data at a different data transfer rate than the upstream port. The device may also include several downstream data handlers, each coupled to a respective one of the downstream ports, and an upstream data handler coupled to the upstream port. The data handlers are configured to implement a USB protocol. The upstream data handler is configured to provide data received via the upstream port to each of the downstream data handlers. Accordingly, the upstream data handler is shared between the various downstream data handlers
Abstract:
A system and method for generating a test signal used in measuring the speed of a rotating device, such as a fan in a computer system is disclosed. A pulse width modulated (PWM) signal may power the fan with the duty cycle of the PWM signal controlling the speed of the fan. The fan may generate tachometer pulses used for monitoring RPM of the fan. The frequency of the test signal may be selected to be at least twice the frequency of the tachometer pulses. The test signal may be generated from a base frequency signal using two cascaded frequency dividers. The first divider may output a scaled base frequency signal obtained by dividing the base frequency signal by a user programmable scale frequency coefficient corresponding to a maximum test signal frequency for the fan. The second divider may output the test signal by dividing the scaled base frequency signal by a fraction frequency coefficient obtained from and proportional to the current PWM duty cycle value. The test signal may be multiplexed with the PWM signal to obtain existing tachometer pulses even when the PWM signal is not asserted. The scale frequency coefficient may only need to be programmed once for each fan.
Abstract:
A system and method for designing an integrated relaxation oscillator that exhibits reduced change in the frequency of oscillation caused by process variation. Improved sensitivity to component variation due to process shift is achieved through using more than one structure type when implementing the resistors affecting the RC time constant and threshold (trip point) voltages of the oscillator. Structure types are related to the fabrication process and for a CMOS process include, but are not limited to n-diffusion, p-diffusion, n-well, p-well, pinched n-well, pinched p-well, poly-silicon and metal. Each structure type exhibits statistically independent process variations, allowing for application of Lyapunov's extension of the Central Limit Theorem for statistically uncorrelated events to desensitize the effect from different possible causes. Thus, improvement in the performance of the oscillator may be achieved with a reduced trim requirement and without using external precision resistors.