Active probe card
    151.
    发明授权
    Active probe card 有权
    主动探针卡

    公开(公告)号:US09506974B2

    公开(公告)日:2016-11-29

    申请号:US14476729

    申请日:2014-09-03

    CPC classification number: G01R31/2601 G01R1/073 G01R1/30 G01R31/27

    Abstract: An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; and an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input or output signal of the DUT.

    Abstract translation: 能够改进(DUT)测试下的设备的测试带宽的有源探测卡包括印刷电路板; 至少一个探针,固定到印刷电路板的第一表面,用于探测DUT; 电连接到所述至少一个探针的至少一个连接构件; 以及放大电路,形成在所述印刷电路板上并且耦合到所述至少一个连接构件,用于放大所述DUT的输入或输出信号。

    Method of reusing electrical energy and related electrical energy reusing circuit
    152.
    发明授权
    Method of reusing electrical energy and related electrical energy reusing circuit 有权
    重新使用电能和相关电能再利用电路的方法

    公开(公告)号:US09502967B2

    公开(公告)日:2016-11-22

    申请号:US14190095

    申请日:2014-02-26

    Inventor: Hung-Yu Lu

    CPC classification number: H02M3/07 H02M2001/0048 H02M2003/077 Y02B70/1491

    Abstract: The present disclosure provides a method of reusing electrical energy for a charge pump. The method comprises operating in a reusing phase after a boosting phase is completed; retrieving energy of parasitic capacitance in the reusing phase; and reusing the energy of the parasitic capacitance for an internal circuit.

    Abstract translation: 本公开提供了一种对电荷泵重新使用电能的方法。 该方法包括在升压阶段完成之后在重新使用阶段中操作; 在重复使用阶段检索寄生电容的能量; 并重新使用内部电路的寄生电容的能量。

    Power Circuit, Gate Driving Circuit and Display Module
    153.
    发明申请
    Power Circuit, Gate Driving Circuit and Display Module 有权
    电源电路,门驱动电路和显示模块

    公开(公告)号:US20160294279A1

    公开(公告)日:2016-10-06

    申请号:US14883650

    申请日:2015-10-15

    Inventor: Min-Nan Liao

    CPC classification number: H02M3/07 G09G2330/021

    Abstract: A power circuit includes a first charge pump for converting a supply voltage into a first high voltage and a first low voltage, at least one second charge pump, each for increasing the first high voltage by a first variance value to a second high voltage, and at least one third charge pump, each for decreasing the first low voltage by a second variance value to a second low voltage. A difference between the first high and low voltages is less than a breakdown threshold. The second and third variance margins are less than the breakdown threshold.

    Abstract translation: 电源电路包括用于将电源电压转换为第一高电压的第一电荷泵和至少一个第二电荷泵,每个第二电荷泵用于将第一高电压以第一方差值增加到第二高电压;以及 至少一个第三电荷泵,每个用于将第一低电压降低到第二低电压。 第一高低电压之间的差异小于击穿阈值。 第二和第三个方差边距小于击穿阈值。

    Integrated circuit testing interface on automatic test equipment
    154.
    发明授权
    Integrated circuit testing interface on automatic test equipment 有权
    自动测试设备集成电路测试接口

    公开(公告)号:US09435863B2

    公开(公告)日:2016-09-06

    申请号:US14492067

    申请日:2014-09-21

    CPC classification number: G01R31/31908 G01R31/31905

    Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

    Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备(ATE)的集成电路(IC)测试接口包括至少一个引脚,用于至少接收或发送测试信号到测试仪器的自动测试设备,多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元,用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备,其中IC测试接口被放置在测试器和自动测试设备的探测器之间。

    Scan driving circuit
    155.
    发明授权
    Scan driving circuit 有权
    扫描驱动电路

    公开(公告)号:US09378667B2

    公开(公告)日:2016-06-28

    申请号:US13664661

    申请日:2012-10-31

    Inventor: Chung-Hsin Su

    Abstract: The present invention relates to a scan driving circuit, which comprises a decoding circuit, a plurality of level-shift driving circuits, and a control circuit. The decoding circuit produces a decoding signal according to a decoding control signal. The plurality of level-shift driving circuits are coupled to the decoding circuit and produce scan signal sequentially according to the decoding signal. The control circuit is coupled to the plurality of level-shift driving circuit. The control circuit produces a first control signal and a second control signal according to the decoding control signal and transmits the first and second control signals to the plurality of level-shift driving circuits for controlling their turning on and off. Accordingly, by means of the control circuit according to the present invention, the circuit area of each level-shift driving circuit can be reduced, and thus the cost can be reduced as well.

    Abstract translation: 扫描驱动电路技术领域本发明涉及一种扫描驱动电路,其包括解码电路,多个电平移位驱动电路和控制电路。 解码电路根据解码控制信号产生解码信号。 多个电平移位驱动电路被耦合到解码电路,并根据解码信号顺序产生扫描信号。 控制电路耦合到多个电平移位驱动电路。 控制电路根据解码控制信号产生第一控制信号和第二控制信号,并将第一和第二控制信号发送到多个电平转换驱动电路,以控制其接通和断开。 因此,通过根据本发明的控制电路,可以减少每个电平移位驱动电路的电路面积,从而也可以降低成本。

    Proximity sensing method
    156.
    发明授权
    Proximity sensing method 有权
    接近感测方法

    公开(公告)号:US09360587B2

    公开(公告)日:2016-06-07

    申请号:US13946191

    申请日:2013-07-19

    Inventor: Hsien Jen Chang

    CPC classification number: G01V8/10 H03K17/941 H03K2217/94026 H03K2217/94116

    Abstract: The present invention relates to a proximity sensing method for proximity sensing unit in a mobile device. The proximity sensing method comprises steps of comparing a sensed value of the proximity sensing unit with a predetermined offset value or a first predetermined range to determine if the sensed value is smaller than the predetermined offset value or if the sensed value is within the first predetermined range; and providing an offset value for confirming if an object is near the mobile device according to the determination that if the sensed value is smaller than the predetermined offset value or within the first predetermined range.

    Abstract translation: 本发明涉及一种用于移动设备中的接近感测单元的接近感测方法。 接近感测方法包括以下步骤:将接近感测单元的感测值与预定偏移值或第一预定范围进行比较,以确定感测值是否小于预定偏移值,或者如果感测值在第一预定范围内 ; 以及根据所述检测值是否小于所述预定偏移值或在所述第一预定范围内,提供用于确定物体是否在所述移动装置附近的偏移值。

    Transmission interface device capable of calibrating transmission frequency automatically and method thereof
    157.
    发明授权
    Transmission interface device capable of calibrating transmission frequency automatically and method thereof 有权
    能自动校准传输频率的传输接口设备及其方法

    公开(公告)号:US09184868B2

    公开(公告)日:2015-11-10

    申请号:US14036305

    申请日:2013-09-25

    CPC classification number: H04L1/0002 H04L7/0004 H04L7/0016 H04L7/0091

    Abstract: The present invention relates to a transmission interface device capable of calibrating the transmission frequency automatically, which comprises a clock generating unit, a data transmission unit, and a control unit. The clock generating unit is used for generating an operating clock, which determines a transmission frequency. The data transmission unit is used for connecting to a host and transmitting a plurality of data to the host or receiving the plurality of data from the host according to the operating clock. When the host or the data transmission unit detects transmission errors in the plurality of data, the host or the data transmission unit generates an error handling. The control unit generates an adjusting signal according to the error handling and transmits the adjusting signal to the clock generating unit for adjusting the transmission frequency of the operating clock.

    Abstract translation: 本发明涉及一种能够自动校准传输频率的传输接口设备,包括时钟发生单元,数据传输单元和控制单元。 时钟发生单元用于产生确定传输频率的操作时钟。 数据发送单元用于连接主机,并将多个数据发送到主机,或者根据操作时钟从主机接收多个数据。 当主机或数据发送单元检测到多个数据中的传输错误时,主机或数据传输单元产生错误处理。 控制单元根据误差处理生成调整信号,并将该调整信号发送到时钟发生单元,调整工作时钟的发送频率。

    Power Conversion System
    158.
    发明申请
    Power Conversion System 有权
    电力转换系统

    公开(公告)号:US20150261244A1

    公开(公告)日:2015-09-17

    申请号:US14281852

    申请日:2014-05-19

    CPC classification number: G05F3/02 G09G3/3696 G09G5/00 G09G5/18 G09G2330/021

    Abstract: A power conversion system in an electronic device is utilized for converting an input voltage of a power source terminal to a required voltage of a load circuit to provide power to the load circuit. The power conversion system includes a first voltage conversion circuit for converting the input voltage to the required voltage of the load circuit according to a first control signal; and a power control module for generating the first control signal according to a starting signal or a load voltage of the load circuit; wherein the load circuit receives the voltage outputted from the first voltage conversion circuit to perform operations.

    Abstract translation: 电子设备中的电力转换系统用于将电源端子的输入电压转换为负载电路的所需电压以向负载电路提供电力。 电力转换系统包括:第一电压转换电路,用于根据第一控制信号将输入电压转换为负载电路的所需电压; 以及功率控制模块,用于根据负载电路的启动信号或负载电压产生第一控制信号; 其中所述负载电路接收从所述第一电压转换电路输出的电压以执行操作。

    Integrated Circuit Testing Interface on Automatic Test Equipment
    159.
    发明申请
    Integrated Circuit Testing Interface on Automatic Test Equipment 有权
    自动测试设备集成电路测试接口

    公开(公告)号:US20150212155A1

    公开(公告)日:2015-07-30

    申请号:US14492067

    申请日:2014-09-21

    CPC classification number: G01R31/31908 G01R31/31905

    Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

    Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备(ATE)的集成电路(IC)测试接口包括至少一个引脚,用于至少接收或发送测试信号到测试仪器的自动测试设备,多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元,用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备,其中IC测试接口被放置在测试器和自动测试设备的探测器之间。

    Mobile device having a protection mechanism for sensitive information
    160.
    发明授权
    Mobile device having a protection mechanism for sensitive information 有权
    具有敏感信息保护机制的移动设备

    公开(公告)号:US08798582B2

    公开(公告)日:2014-08-05

    申请号:US13707482

    申请日:2012-12-06

    CPC classification number: H04W12/02 H04W4/027 H04W88/02

    Abstract: The present invention discloses a mobile phone comprising a gravity sensor, a processor, and a memory. The gravity sensor senses inertia data along a specific direction, the processor couples with the gravity sensor and receives a output signal from the gravity sensor, and the memory stores at least one personal information and operates under the processor's control. When either the gravity sensor or the processor detects a vertical free-fall motion, the processor performs a information security process to lock the personal information to become inaccessible.

    Abstract translation: 本发明公开了一种包括重力传感器,处理器和存储器的移动电话。 重力传感器感测沿着特定方向的惯性数据,处理器与重力传感器耦合并接收来自重力传感器的输出信号,并且存储器存储至少一个个人信息并且在处理器的控制下操作。 当重力传感器或处理器检测到垂直自由落体运动时,处理器执行信息安全处理以锁定个人信息变得不可访问。

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