Abstract:
A hard disk drive includes a voice coil motor yoke, a base to support the voice coil motor yoke, and formed of a material different from that of the voice coil motor yoke, and a thermal deformation prevention unit which is formed of a material that is substantially the same as that of the voice coil motor yoke, provided between the voice coil motor yoke and the base, and thereby preventing mechanical deformation due to different thermal expansion coefficients between the voice coil motor yoke and the base.
Abstract:
Semiconductor devices and methods of fabricating the same are disclosed. A disclosed method comprises: partially forming a first gate stack; partially forming a second gate stack adjacent the first gate stack; forming a first interlayer dielectric; and completing the formation of the first and second gate stacks after the first interlayer dielectric has filled a distance between the first and second gate electrodes.
Abstract:
The capacitor in a semiconductor device includes a substrate, a lower electrode formed over the substrate, a diffusion barrier formed over the lower electrode, a plurality of agglomerates formed over the diffusion barrier, a dielectric layer formed over the surface of the agglomerates to form an uneven surface, and an upper electrode formed over the dielectric layer.
Abstract:
The present invention relates to a terphenyl dihalide monomer having sulfonate groups and a process for preparing the same. More particularly, the present invention relates to a terphenyl dihalide monomer having sulfonate groups prepared by a process comprising obtaining a terphenyl dihalide derivative by Suzuki cross-coupling of a tetrahalobenzene and phenylboronic acid and introducing sulfonate groups into the phenyl rings at each end of the terphenyl dihalide derivative, the resultant monomer capable of being prepared into a polymer electrolyte having superior ion conductivity through nucleophilic aromatic substitution (SNAr) polymerization due to the presence of two halogen atoms and two conducting sulfonate groups in the monomer molecule, and a process for preparing the same.
Abstract translation:本发明涉及具有磺酸盐基团的三联苯二卤化物单体及其制备方法。 更具体地,本发明涉及具有磺酸盐基团的三联苯二卤化物单体,其通过以下方法制备,所述方法包括通过四卤代苯和苯硼酸的Suzuki交叉偶联获得三联苯二卤化物衍生物,并且在三联苯的每个末端将引入磺酸基团引入苯环 二卤化物衍生物,所得单体能够通过亲核芳香取代(S N N Ar)聚合制备成具有优异离子传导性的聚合物电解质,由于两个卤素原子和两个导电磺酸基团的存在, 单体分子及其制备方法。
Abstract:
A connector, and a hard disk drive having the connector, the connector including connecting pins arranges so as to be spaced apart from one another; and a connecting member to contact the connecting pins and cause an electrical short in response to no external force being applied to the connecting pins; wherein the electrical short is removed in response to an external force being applied to the connecting pins. The connecting pins are moved so as not to contact the connecting member in response to an external force being applied to the connecting pins.
Abstract:
The present invention relates to terphenyl dihydroxy monomers containing fluorine and fluorinated poly(arylene ether sulfide)s prepared by using the monomers, more particularly, terphenyl dihydroxy monomers containing both two hydroxy functional groups and fluorine and fluorinated poly(arylene ether sulfide)s prepared by an aromatic nucleophilic substitution polymerization (SNAr) using the monomers, which are thus useful as optical materials in the field of information telecommunications.
Abstract translation:本发明涉及通过使用单体制备的含氟和氟化聚(亚芳基醚硫醚)的三联苯基二羟基单体,更具体地说,涉及含有两个羟基官能团的三联苯基二羟基单体和氟和氟化聚(亚芳基醚硫醚),其由 使用单体的芳族亲核取代聚合(S N N Ar),因此可用作信息通信领域的光学材料。
Abstract:
Semiconductor devices having a copper line layer and methods for manufacturing the same are disclosed. An illustrated semiconductor device comprises a damascene insulating layer having a contact hole, a barrier metal layer including a first ruthenium layer, a ruthenium oxide layer and a second ruthenium layer, a seed copper layer formed on the barrier metal layer, and a copper line layer made of a Cu—Ag—Au solid solution. A disclosed example method of manufacturing a semiconductor device reduces and/or prevents contact characteristic degradation of the barrier metal layer with the silicon substrate or the damascene insulating layer. In addition, by forming the copper line layer made of the Cu—Ag—Au solid solution, long term device reliability may be improved.
Abstract:
Method for forming intermetal dielectric layer is disclosed including steps of: preparing a substrate with wiring on a lower insulating layer, the wiring having a plurality of separating portions; forming first and second water marks on the lower insulating layer located in the separating portions and on upper surfaces of the wiring; transforming the first and second water marks into first and second air bubbles, respectively; depositing a first insulating layer of lower dielectric constant on the whole surface of the substrate, and at the same time, forming first and second air gaps by growing said first and second air bubbles on and between the wirings, respectively; removing the upper portion of the first insulating layer to make open the second air gap; and depositing a second insulating layer of lower dielectric constant on the first insulating layer to fill the opened second air gap.
Abstract:
A hard disk drive having a housing including a base member, a cover member, a damping plate, and a buffer member. The base member supports a spindle motor for rotating a data storage disk and an actuator having a read/write head, with the cover member being attached to the base member to enclose the disk, the spindle motor, and the actuator. The damping plate is spaced a predetermined distance from a top surface of the cover member to form an air-gap. The buffer member is disposed between the cover member and the damping plate and along the circumference of the air-gap, with the buffer member being made of a material pervious to air but impervious/sealed to water, for example, polyurethane foam having a plurality of open-cells and closed-cells. Accordingly, even though air pressure varies, air pressures inside and outside the air-gap can be equalized.
Abstract:
Semiconductor devices and methods of manufacturing the same are disclosed. In a disclosed method, a dangling bond in the active region(s) is removed by providing an enough H2 in the PMD liner layer and the interlayer insulating layer directly contacting the active regions, and then gradually diffusing the H2 in a subsequent heat treatment. The method includes forming a gate electrode having a side wall spacer, forming source and drain regions, forming a PMD liner layer by sequentially forming a SiO2:H layer, a SiON:H layer and a SiN:H layer above the gate electrode and the source and drain regions, forming an interlayer insulating layer above the PMD liner layer, and diffusing hydrogen in the PMD liner layer and the interlayer insulating layer to the source and drain region by N2 annealing or Ar annealing.