Probing apparatus and method for adjusting probing apparatus
    11.
    发明授权
    Probing apparatus and method for adjusting probing apparatus 失效
    探测装置及其调试方法

    公开(公告)号:US08063652B2

    公开(公告)日:2011-11-22

    申请号:US11542759

    申请日:2006-10-02

    IPC分类号: G01R31/20

    CPC分类号: G01R1/07371

    摘要: The present invention stably maintains contact between probe pins and a wafer. Screws are provided at a plurality of positions in an outer circumferential portion of a printed circuit board. On a lower surface side of the outer circumferential portion of the printed circuit board, a retainer plate is provided, and a bottom end surface of each of the screws is held down with the retainer plate. Turning each of the screws in a state where the bottom end surface of the each of the screws is held down with the retainer plate causes the outer circumferential portion of the printed circuit board to be moved up and down. Adjusting a height of the outer circumferential portion of the printed circuit board by turning each of the screws located at the plurality of positions enables parallelism of the entire probe card with respect to the wafer to be adjusted.

    摘要翻译: 本发明稳定地保持探针和晶片之间的接触。 螺钉设置在印刷电路板的外周部的多个位置。 在印刷电路板的外周部的下表面侧设置有保持板,并且每个螺钉的底端面用保持板保持。 在每个螺钉的底端表面用保持板压住的状态下转动每个螺钉使得印刷电路板的外周部分上下移动。 通过转动位于多个位置的每个螺钉来调节印刷电路板的外周部分的高度使得能够平行整个探针卡相对于待调整的晶片。

    Inspection contact structure and probe card
    12.
    发明授权
    Inspection contact structure and probe card 有权
    检查接触结构和探针卡

    公开(公告)号:US07719296B2

    公开(公告)日:2010-05-18

    申请号:US11819273

    申请日:2007-06-26

    IPC分类号: G01R31/02 H01R12/00

    摘要: In the present invention, an inspection contact structure is attached to the lower surface side of a circuit board in a probe card. In the inspection contact structure, elastic sheets with protruding conductive portions are respectively attached to both surfaces of a silicone substrate. The silicone substrate is formed with current-carrying paths passing therethrough in the vertical direction, and the sheet conductive portions are in contact with the current-carrying paths from above and below. The conductive portions on the upper side are in contact with connecting terminals of the circuit board. At the time of inspection of electric properties of a wafer, electrode pads on the wafer are pressed against the conductive portions on the lower side and thereby brought into contact with them.

    摘要翻译: 在本发明中,在探针卡的电路基板的下表面侧安装有检查接触结构。 在检查接触结构中,具有突出导电部分的弹性片分别安装在硅树脂基底的两个表面上。 硅基板在垂直方向上形成有通过其的通电路径,并且片状导电部分从上方和下方与导流路径接触。 上侧的导电部与电路基板的连接端子接触。 在检查晶片的电性的时候,晶片上的电极焊盘被压在下侧的导电部分上,从而与它们接触。

    Fluororubber base sealant composition and fluororubber base sealant
    13.
    发明申请
    Fluororubber base sealant composition and fluororubber base sealant 失效
    氟橡胶基础密封剂组合物和氟橡胶基础密封剂

    公开(公告)号:US20060058450A1

    公开(公告)日:2006-03-16

    申请号:US10544296

    申请日:2004-02-05

    IPC分类号: C08L27/16 C08L27/12

    摘要: A fluororubber sealant includes 100 parts by weight of a fluororubber, which is a copolymer having a cross-linking site derived from a bromine-containing and/or iodine-containing compound, capable of crosslinking with peroxide and having a component unit composition comprising 20 to 23% by mol of a perfluoromethyl vinylether component unit, 60 to 70% by mol of a vinylidene fluoride component unit, 10 to 20% by mol of a tetrafluoroethylene component unit, 0 to 10% by mol of hexafluoropropylene component unit (based on 100% of the total of the above component units), and a small amount of a bromide and/or iodide unsaturated fluorohydrocarbon component unit as a crosslinking site based on 100% by mol of the total of the above component units; and further comprising, based on 100 parts by weight of the fluororubber, 2 to 50 parts by weight of a bituminous fine powder; 0.5 to 6 parts by weight of an organoperoxide; and 1 to 10 parts by weight of a polyfunctional monomer. A sealant is prepared by vulcanizing the above composition. The composition has not only excellent ordinary physical properties but also excellent heat resistance, freeze resistance and fuel oil resistance so that it is suitably used as sealants for automobile fuel.

    摘要翻译: 氟橡胶密封剂包括100重量份的氟橡胶,其是具有衍生自含溴和/或含碘化合物的交联位点的共聚物,其能够与过氧化物交联并且具有包含20至 全氟甲基乙烯基醚成分为23摩尔%,偏二氟乙烯成分为60〜70摩尔%,四氟乙烯成分为10〜20摩尔%,六氟丙烯成分为0〜10摩尔%(基于100摩尔 基于上述组分单元的总量的百分比)和少量的溴化物和/或碘化物不饱和氟代烃组分作为交联位点,基于100摩尔%的上述组分单元; 并且还包括基于100重量份的氟橡胶,2至50重量份的沥青细粉末; 0.5〜6重量份的有机过氧化物; 和1至10重量份的多官能单体。 通过硫化上述组合物制备密封剂。 该组合物不仅具有优异的普通物理性能,而且具有优异的耐热性,耐冻结性和耐燃油性,因此适合用作汽车燃料用密封剂。

    Conductor pattern check apparatus for locating and repairing open
circuits
    14.
    发明授权
    Conductor pattern check apparatus for locating and repairing open circuits 失效
    用于定位和修理开路的导体图案检查装置

    公开(公告)号:US5639390A

    公开(公告)日:1997-06-17

    申请号:US362866

    申请日:1994-12-23

    摘要: A conductor pattern test apparatus comprises a DC voltage power source for applying a predetermined DC voltage to an end of one of a plurality of conductor patterns arranged in parallel with each other, a current measurement circuit for measuring a current flowing to another conductor pattern adjacent to the one of the conductor patterns via the end by the DC voltage power source to the end, and a short-circuit position calculation circuit for calculating a resistance value from the end to a short-circuited part of the two conductor patterns adjacent to each other, based on the current value measured by the current measurement circuit and the voltage value applied by the DC power source, and locating a position of the short-circuited part based on the calculated resistance value and a resistance value of a conductor pattern having no short-circuit. A disconnection position calculator calculates a capacitance value from voltage values.

    摘要翻译: 导体图案测试装置包括用于将预定DC电压施加到彼此并联布置的多个导体图案之一的端部的DC电压电源,用于测量流向与其相邻的另一个导体图案的电流的电流测量电路 通过直流电压电源的末端的导体图案中的一个到端部,以及用于计算从彼此相邻的两个导体图案的端部到短路部分的电阻值的短路位置计算电路 基于由当前测量电路测量的电流值和由DC电源施加的电压值,并且基于计算的电阻值和不短的导体图案的电阻值来定位短路部分的位置 电路 断开位置计算器根据电压值计算电容值。

    Fuel cell powerplant system
    15.
    发明授权
    Fuel cell powerplant system 失效
    燃料电池动力装置系统

    公开(公告)号:US5178969A

    公开(公告)日:1993-01-12

    申请号:US718427

    申请日:1991-06-20

    申请人: Takashi Amemiya

    发明人: Takashi Amemiya

    IPC分类号: H01M8/04

    CPC分类号: H01M8/04223 H01M8/04029

    摘要: A fuel cell powerplant system comprises a fuel cell that houses in an airtight containment vessel a cell stack formed from many layers of individual fuel cells, a cooling water loop that cools the fuel cell, and a steam separator that is disposed on the side of an outlet of a fuel cell of the cooling loop and that discharges steam, and wherein one portion of the steam discharged from the steam separator is introduced via a purge steam line to the containment vessel or the cathode of the fuel cell for the purpose of purging containment vessel.

    摘要翻译: 燃料电池动力装置系统包括燃料电池,其在气密容纳容器中容纳由多层单独的燃料电池形成的电池组,冷却燃料电池的冷却水回路和设置在燃料电池侧的蒸汽分离器 冷却回路的燃料电池出口并且排出蒸汽,并且其中从蒸汽分离器排出的蒸汽的一部分经由吹扫蒸汽管线被引入到燃料电池的容纳容器或阴极,用于清洗容器 船只。

    Fuel cell generation system
    16.
    发明授权
    Fuel cell generation system 失效
    燃料电池生成系统

    公开(公告)号:US5085949A

    公开(公告)日:1992-02-04

    申请号:US650761

    申请日:1991-02-05

    IPC分类号: H01M8/04

    摘要: A fuel cell generation system comprises a cell stack consisting of a plurality of cells, said cell having a fuel electrode, an oxidizer electrode, and an electrolyte layer located between said both electrodes, a fuel cell main body having a plurality of cooling plates for absorbing heat generated in said cell, said plate being located between said cells, and a cooling unit for supplying a coolant through said cooling plate. The system further provides a reference voltage source for supplying a reference voltage and a determining unit for comparing an output voltage of at least one cell located at the upper portion of the cell main body with the reference voltage and determining if an abnormal state occurs in the cooling unit based on the comparing result. The reference voltage is picked up out of a part of the cell stack.

    Inspection contact structure and probe card
    17.
    发明申请
    Inspection contact structure and probe card 有权
    检查接触结构和探针卡

    公开(公告)号:US20080211528A1

    公开(公告)日:2008-09-04

    申请号:US11819273

    申请日:2007-06-26

    IPC分类号: G01R31/02 H01R12/00

    摘要: In the present invention, an inspection contact structure is attached to the lower surface side of a circuit board in a probe card. In the inspection contact structure, elastic sheets with protruding conductive portions are respectively attached to both surfaces of a silicone substrate. The silicone substrate is formed with current-carrying paths passing therethrough in the vertical direction, and the sheet conductive portions are in contact with the current-carrying paths from above and below. The conductive portions on the upper side are in contact with connecting terminals of the circuit board. At the time of inspection of electric properties of a wafer, electrode pads on the wafer are pressed against the conductive portions on the lower side and thereby brought into contact with them.

    摘要翻译: 在本发明中,在探针卡的电路基板的下表面侧安装有检查接触结构。 在检查接触结构中,具有突出导电部分的弹性片分别安装在硅树脂基底的两个表面上。 硅基板在垂直方向上形成有通过其的通电路径,并且片状导电部分从上方和下方与导流路径接触。 上侧的导电部与电路基板的连接端子接触。 在检查晶片的电性的时候,晶片上的电极焊盘被压在下侧的导电部分上,从而与它们接触。

    Probe Card
    18.
    发明申请
    Probe Card 失效
    探头卡

    公开(公告)号:US20080150558A1

    公开(公告)日:2008-06-26

    申请号:US11883885

    申请日:2006-06-27

    IPC分类号: G01R1/073

    CPC分类号: G01R1/07342 G01R1/07364

    摘要: [OBJECT] Contact of a wafer and a probe is stabilized.[ORGANIZATION] A probe card includes a contactor supporting probes, and a printed wiring board electrically connected to the contactor. An elastic sheet is interposed between the contactor and the printed wiring board. The elastic sheet is formed so that elasticity in a central side is smaller than that in an outer peripheral side of the contactor. An elastic reaction force which acts on the contactor from the elastic sheet when the elastic sheet is compressed becomes weaker at the central part side as compared with the outer peripheral side of the contactor. Thereby, the bending amount of a central part of the contactor which is away from a fixed end and bends the most is reduced, and horizontality of the contactor is maintained.

    摘要翻译: [对象]晶片和探针的接触是稳定的。 [组织]探针卡包括接触器支撑探针和电连接到接触器的印刷线路板。 在接触器和印刷电路板之间插入弹性片。 弹性片形成为使得中央侧的弹性小于接触器的外周侧的弹性。 弹性片被压缩时作用于弹性片的接触器的弹性反作用力与接触器的外周侧相比在中央部分变弱。 因此,远离固定端部并且弯曲最多的接触器的中心部分的弯曲量减小,并且保持接触器的水平度。

    Probing apparatus and method for adjusting probing apparatus
    19.
    发明申请
    Probing apparatus and method for adjusting probing apparatus 失效
    探测装置及其调试方法

    公开(公告)号:US20070108996A1

    公开(公告)日:2007-05-17

    申请号:US11542759

    申请日:2006-10-02

    IPC分类号: G01R31/02

    CPC分类号: G01R1/07371

    摘要: The present invention stably maintains contact between probe pins and a wafer. Screws are provided at a plurality of positions in an outer circumferential portion of a printed circuit board. On a lower surface side of the outer circumferential portion of the printed circuit board, a retainer plate is provided, and a bottom end surface of each of the screws is held down with the retainer plate. Turning each of the screws in a state where the bottom end surface of the each of the screws is held down with the retainer plate causes the outer circumferential portion of the printed circuit board to be moved up and down. Adjusting a height of the outer circumferential portion of the printed circuit board by turning each of the screws located at the plurality of positions enables parallelism of the entire probe card with respect to the wafer to be adjusted.

    摘要翻译: 本发明稳定地保持探针和晶片之间的接触。 螺钉设置在印刷电路板的外周部的多个位置。 在印刷电路板的外周部的下表面侧设置有保持板,并且每个螺钉的底端面用保持板保持。 在每个螺钉的底端表面用保持板压住的状态下转动每个螺钉使得印刷电路板的外周部分上下移动。 通过转动位于多个位置的每个螺钉来调节印刷电路板的外周部分的高度使得能够平行整个探针卡相对于待调整的晶片。