摘要:
An information handling system including a frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.
摘要:
A method, an apparatus, and a computer program are provided to measure and/or correct duty cycles. Duty cycles of various signals, specifically clocking signals, are important. However, measurement of very high frequency signals, off-chip, and in a laboratory environment can be very difficult and present numerous problems. To combat problems associated with making off-chip measurements and adjustments of signal duty cycles, comparisons are made between input signals and divided input signals that allow for easy measurement and adjustment of on-chip signals, including clocking signals.
摘要:
A system and system for automatic voltage calibration is presented. A voltage calibration system includes three main units, which are a voltage level trimming unit, a trim detection unit, and a trim control unit. The three units work in conjunction with each other during a trimming operation in order to identify a tap voltage that is closest to a target voltage. In one embodiment, the voltage calibration system may be used to calibrate a voltage regulator. Upon commencement of calibration, the voltage regulator's feedback loop is open, and the target voltage is selected as the input for the feedback port of the amplifier. The voltage regulator serves as a voltage comparator that compares each tap voltage to the target voltage. When the calibration is complete, regulator's feedback loop is closed and the closest tap voltage to the target voltage is used as the regulator's input.
摘要:
A method, an apparatus, and a computer program are provided to minimize filter capacitor leakage in a Phased Locked Loop (PLL). In high frequency processors and devices, filter leakage currents can cause substantial problems by causing PLLs to drift out of phase lock. To combat the leakage currents, a dummy filter and other components are employed to provide additional charge or voltage to a low pass filter during lock. The provision of the charge or voltage exponentially decreases the rate of decay of voltage across the low pass filter caused by leakage currents.
摘要:
The present invention provides for a circuit for transitioning clocking speeds. A counter is coupled to the clocking means. A comparator is coupled to an output of the counter. A first divider is coupled to the output of the counter. A processor means is coupled to the output of the first divider, thereby lessening current surges.
摘要:
The present invention provides a method, apparatus, and computer program for measuring the current leakage in a Low Pass Filter (LPF) capacitor of a Phased Locked Loop (PLL). As a result of thinner and thinner film capacitors in Complementary Metal-Oxide Semiconductor (CMOS) technology, leakage current, which causes a PLL to drift out of phase lock, has become an increasingly difficult problem. To overcome the leakage current problems, knowing the leakage current of an LPF capacitor is important to implement the correction circuitry. In the present invention, an external interface and a time interface analyzer are used to charge the LPF capacitor and measure the output frequency of the PLL's Voltage Controlled Oscillator. Because of the change in the output frequency, the leakage current can be determined.
摘要:
A clock signal selector circuit is disclosed including a synchronizer circuit, two switching circuits, and a multiplexer. The synchronizer circuit synchronizes a first control signal to a first clock signal, thereby producing a second control signal. A first switching circuit produces the first clock signal at a first node when the second control signal is asserted. The multiplexer drives a second node with a signal at the first node when the second control signal is asserted. The second switching circuit forms an electrical connection between the first and second nodes when the second control signal is deasserted. The two switching circuits significantly reduce a probability of error at the second node due to metastability when the second control signal transitions from asserted to deasserted and the first clock signal is deselected. The second switching circuit provides electrical feedback from the second node to the first node.
摘要:
An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance are provided. A chip level built-in circuit that automatically calibrates the duty cycle correction (DCC) circuit setting for each chip is provided. This chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. Results of a built-in self test, i.e. pass or fail, of an array are provided to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
摘要:
The disclosed methodology and apparatus measure the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
摘要:
A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.