Abstract:
A method of programming a phase change memory device is disclosed. Write data is programmed in a plurality of phase change memory cells by applying write pulses to each of the plurality of phase change memory cells. Whether each of the phase change memory cells is programmed is verified by applying at least one verification pulse to each of the phase-change memory cells. A number of applications for the at least one verification pulse and the intervals between respective applications of the at least one verification pulse are varied in accordance with a verification result for each of the phase-change memory cells.
Abstract:
Disclosed is a 3D memory device including a first plane having a first mat formed on a first layer and a third mat formed on a second layer disposed over the first layer, the first and third mats sharing a bit line, and a second plane having a second mat formed on the first layer and a fourth mat formed on the second layer. The second and fourth mats share a bit line. Each one of the first through fourth mats includes a plurality of blocks and a block associated with the first plane is simultaneously accessed with a block of the second plane.
Abstract:
A programming method and a three-dimensional memory device are disclosed. The three-dimensional memory device includes a stacked plurality of layers, each layer having a memory array, and each memory array having a string of memory cells. The programming method includes, for each unselected string associated with an unselected layer in the plurality of layers, charging the channel of memory cells associated with unselected string with a shut-off voltage, and thereafter programming a selected string associated with a selected layer in the plurality of layers.
Abstract:
Provided are a nonvolatile memory device and a driving method thereof. In the method of driving a nonvolatile memory device, a structural shape and position of a memory cell to be driven is determined, and then the memory cell is driven with an optimized operating condition according to a distribution of the memory cell using a determination result.
Abstract:
A non-volatile memory device has multi-level cells (MLCs), which are programmed such that one page is written in the MLCs having previous states corresponding to at least one previous page. The non-volatile memory device includes a memory cell array, a row selection circuit and a page buffer block. The memory cell array includes the MLCs commonly coupled to a selected word line and respectively coupled to bitlines. The row selection circuit applies sequentially-decreasing read voltages to the selected wordline to read the previous states of the MLCs, and sequentially-decreasing verification voltages to the selected wordline to program states of the MLCs sequentially from a state having a highest threshold voltage to a state having a lowest threshold voltage. The page buffer block loads data corresponding to the one page, and controls a bitline voltage based on each previous state and each bit of the loaded data.