WAVELENGTH-SELECTABLE COATING THICKNESS MEASUREMENT APPARATUS
    15.
    发明申请
    WAVELENGTH-SELECTABLE COATING THICKNESS MEASUREMENT APPARATUS 有权
    波长选择涂层厚度测量仪

    公开(公告)号:US20150159997A1

    公开(公告)日:2015-06-11

    申请号:US14505747

    申请日:2014-10-03

    CPC classification number: G01B17/025 G01B11/0666

    Abstract: Provided is an apparatus that measures a thickness of a coating by selecting a wavelength of a laser based on a color of the coating using a contactless method using a photoacoustic effect and an interferometer, the apparatus including a pulsed laser source to irradiate a pulsed laser beam toward the coating, a continuous wave (CW) laser source to irradiate a CW laser beam toward the coating, a detector to detect an optical interference signal corresponding to the CW laser beam, and a signal processor to process the optical interference signal to calculate a thickness of the coating.

    Abstract translation: 提供了一种通过使用光声效应和干涉仪的非接触式方法来选择基于涂层的颜色的激光的波长来测量涂层的装置,该装置包括用于照射脉冲激光束的脉冲激光源 向涂层提供连续波(CW)激光源,以朝向涂层照射CW激光束;检测器,用于检测对应于CW激光束的光学干涉信号;以及信号处理器,用于处理光学干涉信号以计算 涂层厚度。

    SPECTROSCOPIC DEVICE
    19.
    发明申请

    公开(公告)号:US20190128733A1

    公开(公告)日:2019-05-02

    申请号:US15870012

    申请日:2018-01-12

    Abstract: Disclosed is a spectroscopic device including a planar lightwave circuit to which light passing through an optical fiber is input, a wavelength divider configured to divide a wavelength of light passing through the planar lightwave circuit, a beam splitter configured to divide a traveling direction of light passing through the wavelength divider into an external sample inlet and an internal sample inlet and adjust power of the divided light, a charge-coupled device (CCD) image sensor configured to covert light transmitted from the internal sample inlet to an electrical signal or convert light reflected by the external sample inlet to an electrical signal, a control and signal processor configured to process the electrical signal to indicate a light intensity based on each wavelength, and an input and output interface configured to perform a spectrum analysis for each wavelength using the processed electrical signal.

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