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    Probe tip with embedded skate
    11.
    发明授权
    Probe tip with embedded skate 有权

    公开(公告)号：US11054443B2

    公开(公告)日：2021-07-06

    申请号：US16362239

    申请日：2019-03-22

    Applicant: FormFactor, Inc.

    Inventor： January Kister ,  Chun-Chih Wang

    IPC: G01R1/067 ,  G01R3/00

    Abstract: A skate on a tip of a probe for testing electrical devices is a reduced thickness probe tip contact. Such a skate can advantageously increase contact pressure, but it can also undesirably reduce probe lifetime due to rapid mechanical wear of the skate. Here multilayer skate probes are provided where the overall shape of the probe tip is a smooth curved surface, as opposed to the conventional fin-like skate configuration. The skate layer is the most mechanically wear-resistant layer in the structure, so abrasive processing of the probe tip leads to a probe skate defined by the skate layer. The resulting probes provide the advantage of increased contact pressure without the disadvantage of reduced lifetime.

    MEMS Probe Card Assembly having Decoupled Electrical and Mechanical Probe connections
    12.
    发明申请
    MEMS Probe Card Assembly having Decoupled Electrical and Mechanical Probe connections 审中-公开

    公开(公告)号：US20190128924A1

    公开(公告)日：2019-05-02

    申请号：US16175341

    申请日：2018-10-30

    Applicant: FormFactor, Inc.

    Inventor： Mukesh Selvaraj ,  January Kister

    IPC: G01R1/073 ,  G01R3/00 ,  G01R1/067

    Abstract: Probes are connected to the space transformer via multiple carrier plates. Electrical contacts from the probes to the space transformer are by way of spring tail features on the probes that connect to the space transformer and not to the carrier plates. In other words, the carrier plates are purely mechanical in function. This configuration can significantly reduce probe array fabrication time relative to sequential placement of individual probes on the space transformer. Multiple probe carrier plates can be populated with probes in parallel, and the final sequential assembly of carrier plates onto the space transformer has a greatly reduced operation count. Deviations of the space transformer from flatness can be compensated for.

    VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY
    14.
    发明申请
    VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY 审中-公开
    用于多点全网格接触阵列的垂直探测器

    公开(公告)号：US20140043054A1

    公开(公告)日：2014-02-13

    申请号：US13963567

    申请日：2013-08-09

    Applicant: FormFactor, Inc.

    Inventor： January Kister

    IPC: G01R1/067

    CPC classification number: G01R1/06711 ,  G01R1/0675 ,  G01R3/00 ,  G06Q30/0623

    Abstract: A testing method (and the probes used) comprising providing one or more probes each comprising: a body portion which is substantially straight; an extended portion extending from the body portion and comprising at least two separate probe portions; and a tip portion at the opposite end of the extended portion; and contacting an object to be tested with the one or more probes.

    Abstract translation: 一种测试方法（以及使用的探针），包括提供一个或多个探针，每个探针包括：主体部分，其基本上是直的; 延伸部分，其从主体部分延伸并且包括至少两个单独的探针部分; 以及在所述延伸部分的相对端处的末端部分; 以及使待测对象与所述一个或多个探针接触。

    Vertical probe array having sliding contacts in elastic guide plate
    15.
    发明公开
    Vertical probe array having sliding contacts in elastic guide plate 审中-公开

    公开(公告)号：US20230251287A1

    公开(公告)日：2023-08-10

    申请号：US18107231

    申请日：2023-02-08

    Applicant: FormFactor, Inc.

    Inventor： January Kister ,  Kevin John Hughes

    IPC: G01R1/073

    CPC classification number: G01R1/07307

    Abstract: A probe array having decoupled electrical and mechanical design constraints on the probes is provided. Each probe is a two-part structure with the two parts able to stay in electrical contact with each other as the parts slide up and down with respect to each other. The probes are disposed in through holes of an elastic matrix, each probe having its corresponding hole. The probes engage with the elastic matrix such that a restoring force in response to vertical probe compression is provided by the elastic matrix. With this approach, electrical and mechanical design are much more decoupled than in conventional spring probe design. The elastic matrix provides the mechanical compliance and restoring force, while the parts of the probe determine its current carrying capacity and electrical bandwidth.

    Vertical probe array arranged to provide space transformation
    18.
    发明授权
    Vertical probe array arranged to provide space transformation 有权

    公开(公告)号：US09274143B2

    公开(公告)日：2016-03-01

    申请号：US13693971

    申请日：2012-12-04

    Applicant: FormFactor, Inc.

    Inventor： January Kister

    IPC: G01R1/073 ,  G01R1/067

    CPC classification number: G01R1/07307 ,  G01R1/06733

    Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

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